RHEED STUDY OF THE POLAR (111) SURFACES OF INSB AND GASB.RUSSELL GJ.1976; SURF. SCI.; NETHERL.; DA. 1976; VOL. 55; NO 1; PP. 380-384; BIBL. 9 REF.Article

CHARACTERIZATION OF SI SURFACE BY ELLIPSOMETRYOHIRA F; ITAKURA M.1979; JAP. J. APPL. PHYS.; JPN; DA. 1979; VOL. 18; NO 7; PP. 1243-1248; BIBL. 15 REF.Article

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EFFECTS OF ION BEAM POLISHING ON ALKALI HALIDE LASER WINDOW MATERIALS.BRUCE JA; COMER JJ; COLLINS CV et al.1974; MATER. RES. BULL.; U.S.A.; DA. 1974; VOL. 9; NO 11; PP. 1531-1542; BIBL. 3 REF.Article

LA PRODUCTION D'EAU ULTRA-PURE STERILE DANS LES INDUSTRIES MICRO-ELECTRONIQUESMCBAIN DJG.1981; EAU IND.; ISSN 0337-9329; FRA; DA. 1981; NO 58; PP. 45-51Article

RETROFIT OF A CONDENSATE POLISHING DEMINERALIZER TO A SALTWATER-COOLED PLANTJENKINS SD; WALLACE JT JR.1979; PROC. AMER. POWER CONF.; USA; DA. 1979; VOL. 41; PP. 928-932; BIBL. 13 REF.Conference Paper

DEPENDENCE OF RESIDUAL DAMAGE ON TEMPERATURE DURING AR⁺ SPUTTER CLEANING OF SILICON.BEAN JC; BECKER GE; PETROFF PM et al.1977; J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 3; PP. 907-913; BIBL. 25 REF.Article

SIMS EVALUATION OF CONTAMINATION ON ION-CLEANED (100) INP SUBSTRATES.DOWSETT MG; KING RM; PARKER EHC et al.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 8; PP. 529-531; BIBL. 13 REF.Article

AN ION-POLISHING TECHNIQUE TO REVEAL VOIDS AT PARTICLES = TECHNIQUE DE POLISSAGE IONIQUE POUR REVELER LES CAVITES AU VOISINAGE DES PRECIPITESLEHTINEN B; MELANDER A.1980; METALLOGRAPHY; ISSN 0026-0800; USA; DA. 1980; VOL. 13; NO 3; PP. 283-287; BIBL. 1 REF.Article

MESSUNG VON ROCKINGKURVEN EINES POLIERTEN CAF₂-KRISTALLS. = MESURE DES COURBES D'OSCILLATIONS D'UN CRISTAL CAF₂ POLIDIETRICH B; FORSTER E.1977; KRISTALL U. TECH.; DTSCH.; DA. 1977; VOL. 12; NO 6; PP. 609-615; ABS. ANGL.; BIBL. 12 REF.Article

DIE BEOBACHTUNG VON WEISSSCHEN BEZIRKEN AUF EINEM TITANOMAGNETITKORN MIT EINEM DURCHMESSER VON 10 MIKRON IN EINEM BASALT.(OBSERVATION DES DOMAINES DE WEISS SUR UN GRAIN DE TITANO MAGNETITE DE BASALTE D'UN DIAMETRE DE 10 MICRONSSOFFEL H.1968; Z. GEOPHYS.; DEU; 1968(5), VOL. 34, NUM. 0002, P. 175 A 181Miscellaneous

EFFECT OF ATMOSPHERIC OXYGEN ON EVAPORATED CHROMIUM FILMSKLAUS N.1981; J. VAC. SCI. TECHNOL.; ISSN 0022-5355; USA; DA. 1981; VOL. 19; NO 2; PP. 201-204; BIBL. 3 REF.Article

SUR LA MOBILITE ATOMIQUE ACCELEREE LIEE A L'IRRADIATION AU COURS D'UNE ABRASION IONIQUESERAN JL; LIMOGE Y.1981; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1981; VOL. 107; NO 1; PP. 176-206; BIBL. 42 REF.Article

REVEALING THE MICROSTRUCTURE OF NB₃GE SUPERCONDUCTING FILMS BY TRANSMISSION ELECTRON MICROSCOPY.SANTHANAM AT; YUZAWICH PM.1977; J. MATER. SCI.; G.B.; DA. 1977; VOL. 12; NO 6; PP. 1161-1164; BIBL. 8 REF.Article

ETUDE PAR DECAPAGE IONIQUE ET SPECTROMETRIE AUGER DE COUCHES MINCES D'OR SUR SUPPORT DE SILICIUM.GANDON J; JOUD JC; DESRE P et al.1978; J. MICR. SPECTROSC. ELECTRON.; FRA; DA. 1978; VOL. 3; NO 2; PP. 131-141; ABS. ENG; BIBL. 17 REF.Article

ETUDE PAR SPECTROSCOPIE ESCA DE LA MIGRATION DE METAUX LOURDS DANS L'ARSENIURE DE GALLIUM.BOYER D; LIMOUSIN Y; BALDY A et al.1978; J. MICR. SPECTROSC. ELECTRON.; FRA; DA. 1978; VOL. 3; NO 2; PP. 143-150; ABS. ENG; BIBL. 10 REF.Article

LEED AND AES OF STOICHIOMETRIC AND ARSENIC-RICH GAAS (110) SURFACES PREPARED BY MOLECULAR BEAM EPITAXYKUBLER B; RANKE W; JACOBI K et al.1980; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1980; VOL. 92; NO 2-3; PP. 519-527; BIBL. 14 REF.Article

A METHOD OF CLEANING GA⁰,5)AL⁰,5)SB SURFACE.MIYAO M; SUKEGAWA T; HAGINO M et al.1977; J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 3; PP. 1383-1384; BIBL. 6 REF.Article

PWR SECONDARY WATER CHEMISTRY STUDY PROGRESS REPORT. IIIPEARL WL; SAWOCHKA SG.1979; PROC. AMER. POWER CONF.; USA; DA. 1979; VOL. 41; PP. 871-876; BIBL. 7 REF.Conference Paper

Meilleure observation de l'endommagement après polissage par bombardement ionique = Better damage observation by ionic polishingBARLAT, F; JALINIER, J. M; SCHMITT, J. H et al.Matériaux et techniques. 1985, Vol 73, Num 8-9, pp E63-E65, issn 0032-6895Article

Novel plasma processing: for enhanced surface engineeringCONNAUGHTON, D.Materials world. 1996, Vol 4, Num 7, pp 389-390, issn 0967-8638Article

Smoothing of multilayer x-ray mirrors by ion polishingSPILLER, E.Applied physics letters. 1989, Vol 54, Num 23, pp 2293-2295, issn 0003-6951, 3 p.Article

UPS/XPS STUDY OF REACTIVE AND NON-REACTIVE SRTIO₃(100) SURFACES: ADSORPTION OF H₂OWEBB C; LICHTENSTEIGER M.1981; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1981; VOL. 107; NO 1; PP. L345-L349; BIBL. 11 REF.Article

ORIENTATION DEPENDENCE OF OXYGEN ADSORPTION ON A CYLINDRICAL GAAS SAMPLE. I: AUGER MEASUREMENTSRANKE W; XING YR; SHEN GD et al.1982; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1982; VOL. 120; NO 1; PP. 67-89; BIBL. 46 REF.Article

Effect of substrate heating and ion beam polishing on the interface quality in Mo/Si multilayers: X-ray comparative studyANOPCHENKO, A; JERGEL, M; HEINZMANN, U et al.Physica. B, Condensed matter. 2001, Vol 305, Num 1, pp 14-20, issn 0921-4526Article