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au.\*:("POSTNIKOV, S")

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Critical dimension control in optical lithographyPOSTNIKOV, S; HECTOR, S; GARZA, C et al.Microelectronic engineering. 2003, Vol 69, Num 2-4, pp 452-458, issn 0167-9317, 7 p.Conference Paper

Angular distributions of sputtered particles from NiTi alloyNESHEV, I; HAMISHKEEV, V; CHERNYSH, V. S et al.Vacuum. 1993, Vol 44, Num 11-12, pp 1131-1133, issn 0042-207XConference Paper

Phase composition of microspheres for production of heat-insulating corundum ceramicsVLASOV, A. S; POSTNIKOV, S. A.Glass and ceramics. 2000, Vol 57, Num 3-4, pp 130-131, issn 0361-7610Article

Auto-excitation d'une onde superficielle stationnaire dans une décharge UHF stationnaire dans un guide d'onde et son influence sur les propriétés de la déchargeDVININ, S. A; POSTNIKOV, S. A; SOLNTSEV, G. S et al.Fizika plazmy (Moskva, 1975). 1983, Vol 9, Num 6, pp 1297-1302, issn 0134-5052Article

Top surface imaging through silylationPOSTNIKOV, S. V; SOMERVELL, M. H; HENDERSON, C. L et al.SPIE proceedings series. 1998, pp 997-1008, isbn 0-8194-2778-0, 2VolConference Paper

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