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QUANTITATIVE PHASE ANALYSIS OF FINE CRYSTALLINE SUBSTANCESPUCALKA V.1981; CRYST. RES. TECHNOL.; DDR; DA. 1981; VOL. 16; NO 6; PP. 743-746; ABS. GER; BIBL. 3 REF.Article

INDIVIDUAL X-RAY DIFFRACTION LINES OF FINE CRYSTALLINE MATTERS MODELLED MATHEMATICALLYPUCALKA V.1983; CRYSTAL RESEARCH AND TECHNOLOGY (1979); ISSN 0232-1300; DDR; DA. 1983; VOL. 18; NO 1; PP. K31-K32; BIBL. 1 REF.Article

MEASUREMENT OF MICROCRYSTAL SIZE BY MEANS OF DIFFRACTION OF X-RAYSPUCALKA V.1979; KRIST. TECH.; ISSN 0023-4753; DDR; DA. 1979; VOL. 14; NO 8; PP. 999-1004; ABS. GER; BIBL. 1 REF.Article

MEASUREMENT OF MICROCRYSTAL SIZE BY MEANS OF DIFFRACTION OF X-RAYSPUCALKA V.1979; KRIST. TECH.; DDR; DA. 1979-08; VOL. 14; NO 8; PP. 999-1004; BIBL. 1 REF.Article

Another equation for interplanar spacingsPUCALKA, V.Crystal research and technology (1979). 1987, Vol 22, Num 12, issn 0232-1300, K237Article

TEPELNY ROZKLAD CHRYSOTILU A ANTIGORITU = DECOMPOSITION THERMIQUE DE CHRYSOTILE ET D'ANTIGORITEKLIKA Z; WEISS Z; MARTINEC P et al.1979; SB. VED. PRACI VYS. SK. OSTRAVE, RADA HORN.-GEOL.; ISSN 0474-8476; CSK; DA. 1979; VOL. 25; NO 2; PP. 135-173; ABS. RUS/ENG; BIBL. 18 REF.Article

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