Sensitive reflection high-energy electron diffraction measurement of the local misorientation of vicinal GaAs surfacesPUKITE, P. R; VAN HOVE, J. M; COHEN, P. I et al.Applied physics letters. 1984, Vol 44, Num 4, pp 456-458, issn 0003-6951Article

Ion beam enhanced diffusion of B during Si molecular beam epitaxyPUKITE, P. R; IYER, S. S; SCILLA, G. J et al.Applied physics letters. 1989, Vol 54, Num 10, pp 916-918, issn 0003-6951, 3 p.Article

Properties of diamond structure SnGe films grown by molecular beam epitaxyHARWIT, A; PUKITE, P. R; ANGILELLO, J et al.Thin solid films. 1990, Vol 184, pp 395-401, issn 0040-6090, 7 p.Conference Paper

Shot noise in solid state diodesVAN DER ZIEL, A; ANDERSON, J. B; JINGMING XU et al.Solid-state electronics. 1986, Vol 29, Num 10, pp 1069-1071, issn 0038-1101Article