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The Bhopal disaster: Understanding the impact of unreliable machinery : PROCESS/PLANT OPTIMIZATIONBLOCH, K; JUNG, B.Hydrocarbon processing (International ed.). 2012, Vol 91, Num 6, pp 73-76, issn 0018-8190, 4 p.Article

Dependable computing: from concepts to design diversityAVIZIENIS, A; LAPRIE, J.-C.Proceedings of the IEEE. 1986, Vol 74, Num 5, pp 629-638, issn 0018-9219Article

Method of laser-induced breakdown detection and application examplesBUNDSCHUH, Tobias; WAGNER, Tobias; WEBER, Matthias et al.Chemical engineering & technology. 2004, Vol 27, Num 4, pp 377-382, issn 0930-7516, 6 p.Article

Parallel Machine Scheduling under the Disruption of Machine BreakdownLIXIN TANG; YANYAN ZHANG.Industrial & engineering chemistry research. 2009, Vol 48, Num 14, pp 6660-6667, issn 0888-5885, 8 p.Article

A parametric solution for simple stress-strength model of failure with an applicationDARGAHI-NOUBARY, G. R.Journal of computational and applied mathematics. 1988, Vol 23, Num 2, pp 185-197, issn 0377-0427Article

Effect of uncertain in failure rates on memory system reliabilityAMER, H. H; IYER, R. K.IEEE transactions on reliability. 1986, Vol 35, Num 4, pp 377-379, issn 0018-9529Article

Thermodynamic efficiency of synthesis, storage and breakdown of the high-energy metabolites by photosynthetic microalgaeSORGÜVEN, Esra; ÖZILGEN, Mustafa.Energy (Oxford). 2013, Vol 58, pp 679-687, issn 0360-5442, 9 p.Article

An overview of European Grid ProjectsBUBAK, Marian; NOWAKOWSKI, Piotr; PAJAK, Robert et al.Lecture notes in computer science. 2004, pp 299-308, issn 0302-9743, isbn 3-540-21048-2, 10 p.Conference Paper

Are column malfunctions becoming extinct : Or will they persist in the 21st century?KISTER, H. Z.Chemical engineering research & design. 1997, Vol 75, Num 6, pp 563-589, issn 0263-8762Article

Checkpoint faults are not sufficient target faults for test generationABRAMOVICI, M; MENON, P. R; MILLER, D. T et al.IEEE transactions on computers. 1986, Vol 35, Num 8, pp 769-771, issn 0018-9340Article

Research in nearly failure-free, high-reliability organizations: having the bubbleROBERTS, K. H; ROUSSEAU, D. M.IEEE transactions on engineering management. 1989, Vol 36, Num 2, pp 132-139, issn 0018-9391, 8 p.Article

Pannes de compresseurs dans les circuits frigorifiques commerciaux = Compressor breakdown in commercial refrigerating circuitsRevue de Danfoss (Fransk udgave). 1988, Vol 41, Num 3, pp 10-11, issn 0373-4862Article

Shedding light on electrical simplicityLANGLEY, Diane.Drilling contractor. 2011, Vol 67, Num 5, pp 40-43, issn 0046-0702, 4 p.Article

Model based diagnostic module for a FCC pilot plantCELSE, B; CAUVIN, S; HEIM, B et al.Oil & gas science and technology. 2005, Vol 60, Num 4, pp 661-679, issn 1294-4475, 19 p.Article

The influence of halide anions on the anodic behavior of nickel in borate solutionsEL AAL, E. E; EL HALEEM, S. M.Chemical engineering & technology. 2005, Vol 28, Num 10, pp 1158-1165, issn 0930-7516, 8 p.Article

Störfallauswirkung und Anlagenüberwachung = Breakdown effects and plant monitoringKLAIS, O; NOHA, K.Chemieingenieurtechnik. 1992, Vol 64, Num 3, pp 290-291, issn 0009-286XArticle

Graphical analysis of system repair dataNELSON, W.Journal of quality technology. 1988, Vol 20, Num 1, issn 0022-4065, 24-35L 11 repArticle

Diagnosis in hybrid fault situations under AIM and a unified t-characterization theoremSOMANI, A. K; AGARWAL, V. K.Computers & mathematics with applications (1987). 1987, Vol 13, Num 5-6, pp 567-576, issn 0898-1221Article

Fault diagnosis in Benes switching networksNARRAWAY, J. J; VENKATESAN, R.IEE proceedings. Part E. Computers and digital techniques. 1987, Vol 134, Num 2, pp 78-86, issn 0143-7062Article

A content addressable memory with a fault-tolerance mechanismMILES BLAIR, G.IEEE journal of solid-state circuits. 1987, Vol 22, Num 4, pp 614-616, issn 0018-9200Article

Pivotal decomposition to find availability and failure-frequency of systems with common-cause failuresYUAN, J.IEEE transactions on reliability. 1987, Vol 36, Num 1, pp 48-53, issn 0018-9529Article

Zur schnellen Fehlersimulation in kombinatorischen Schaltungen = Sur l'accélération de la simulation des fautes dans les circuits combinatoires = On the acceleration of fault simulation in combinational circuitsANTREICH, K. J; SCHULZ, M. H.AEU. Archiv für Elektronik und Übertragungstechnik. 1986, Vol 40, Num 6, pp 355-362, issn 0001-1096Article

A note on shot-noise and reliability modelingLEMOINE, A. J; WENOCUR, M. L.Operations research. 1986, Vol 34, Num 2, pp 320-323, issn 0030-364XArticle

Reliability modeling and analysis of communication networks with dependent failuresLAM, Y. F; LI, V. O. K.IEEE transactions on communications. 1986, Vol 34, Num 1, pp 82-84, issn 0090-6778Article

Wave of the future ? Premium power quality parksKENNEDY, Barry W.Electrical world. 2000, Vol 214, Num 5, pp 47-49, issn 0013-4457Article

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