Debye and non-Debye relaxationHILL, R. M; DISSADO, L. A.Journal of physics. C. Solid state physics. 1985, Vol 18, Num 19, pp 3829-3836, issn 0022-3719Article

Theory of dielectric relaxation due to defect pairs in ionic crystalsOKAMURA, Y; ALLNATT, A. R.Journal of physics. C. Solid state physics. 1985, Vol 18, Num 25, pp 4831-4844, issn 0022-3719Article

Thermoluminescence of the epoxy resin Epidian-5SUBOCZ, J.Acta polymerica. 1986, Vol 37, Num 5, pp 266-268, issn 0323-7648Article

Further comment on the dielectric-loss factor in relation to electrical conductionDOI, A.Journal of materials science letters. 1985, Vol 4, Num 11, pp 1397-1400, issn 0261-8028Article

Measurement of dielectric loss in thin parallel-sided samples using an untuned cavityBACKHOUSE, P; APSLEY, N; SMART, A et al.IEE proceedings. Part A. Physical science, Measurements and instrumentation, Management and education, Reviews. 1985, Vol 132, Num 5, pp 280-284, issn 0143-702XArticle

Relaxation moléculaire du polychloroprène dans l'intervalle des températures de fusionMASHURYAN, A. M; GASTARYAN, K. A; OVANESOV, G. T et al.Vysokomolekulârnye soedineniâ. Seriâ A. 1985, Vol 27, Num 8, pp 1660-1662, issn 0507-5475Article

Precise measurement of dielectric properties at frequencies from 1 kHz to 100 MHzKAKIMOTO, A; ETOH, A; HIRANO, K et al.Review of scientific instruments. 1987, Vol 58, Num 2, pp 269-275, issn 0034-6748Article

A high-voltage high-precision self-balancing capacitance and dissipation factor-measuring bridgeOSVATH, P; WIDMER, S.IEEE transactions on instrumentation and measurement. 1986, Vol 35, Num 1, pp 19-23, issn 0018-9456Article

Proton percolation on hydrated lysozyme powdersCARERI, G; GIANSANTI, A; RUPLEY, J. A et al.Proceedings of the National Academy of Sciences of the United States of America. 1986, Vol 83, Num 18, pp 6810-6814, issn 0027-8424Article

Capacitance bridge for low-temperature, high-resolution dielectric measurementsFOOTE, M. C; ANDERSON, A. C.Review of scientific instruments. 1987, Vol 58, Num 1, pp 130-132, issn 0034-6748Article

Complex permittivity measurement of optoelectronic substratesBOURREAU, D; GUILLON, P; CHATARD-MOULIN, M et al.Electronics Letters. 1986, Vol 22, Num 7, pp 399-400, issn 0013-5194Article

Effects of equal biaxial stretching on the electric properties of polyimide filmsMAO XU; WEI ZHU; XIAN ZHANG et al.Polymer (Guildford). 1986, Vol 27, Num 3, pp 360-362, issn 0032-3861Article

Dielectric properties of cured epoxy resins containing the perfulorobentenyloxy groupSASAKI, S.Journal of polymer science. Polymer letters edition. 1986, Vol 24, Num 6, pp 249-252, issn 0360-6384Article

New method for complex permittivity measurement of dielectric materialsDURAND, J. M; GUILLON, P. Y.Electronics Letters. 1986, Vol 22, Num 2, pp 63-65, issn 0013-5194Article

Variation en fonction de l'amplitude des pertes diélectriques dans les cristaux réels de triglycinesulfateGRIDNEV, S. A; DARINSKIJ, B. M; POPOV, V. M et al.Fizika tverdogo tela. 1986, Vol 28, Num 7, pp 2009-2014, issn 0367-3294Article

Dielectric studies of poly(methyl methacrylate)/polystyrene double layer systemPILLAI, P. K. C; PARAMDEEP KHURANA; TRIPATHI, A et al.Journal of materials science letters. 1986, Vol 5, Num 6, pp 629-632, issn 0261-8028Article

Dielectric anomaly of triglycine sulfate in the ferroelectric phase: single crystals and powdersKURAMOTO, K; MOTEGI, H; NAKAMURA, E et al.Journal of the Physical Society of Japan. 1986, Vol 55, Num 1, pp 377-383, issn 0031-9015Article

Etude du processus de durcissement des oligomères furanniques chargés par la méthode des pertes diélectriquesMADALIEV, EH. U; GALIAKBEROVA, S. N; VAJDULLAEV, S. A et al.Plastičeskie massy. 1986, Num 11, pp 51-52, issn 0554-2901Article

Pertes diélectriques propres dans les cristaux. Basses températuresGUREVICH, V. L; TAGANTSEV, A. K.ZETF. Pis′ma v redakciû. 1986, Vol 91, Num 1, pp 245-261, issn 0044-4510Article

Phénomènes de relaxation dans les polyesters caoutchoucs thermoplastiquesLUSHCHEJKIN, G. A; MEDVEDEVA, F. M; VOJTESHONOK, L. I et al.Plastičeskie massy. 1985, Num 10, pp 16-18, issn 0554-2901Article

Dielectric properties of a commercial photoresist: dependence on ultraviolet light exposure timeREID, J. D; LAWRENCE, W. H.Journal of radiation curing. 1986, Vol 13, Num 2, pp 4-10, issn 0361-6428Article

Dielectric properties of styrene―butadiene rubber/silica mixturesSAMSON MARIA LOUIS, N; BANTHIA, A. K.Die Angewandte makromolekulare Chemie. 1986, Vol 139, pp 71-78, issn 0003-3146Article

Al-M⁺ centers (M=Li,Na,K) in a quartz crystal: potential surfacesBRETON, J; GIRARDET, C.Physical review. B, Condensed matter. 1986, Vol 33, Num 12, pp 8748-8754, issn 0163-1829, 2Article

The study of zeolite ZSM-5 by a dielectric spectroscopy methodDUSOIU, N; VIERIU, P.Spectroscopy letters. 1986, Vol 19, Num 4, pp 343-351, issn 0038-7010Article

Scaling dielectric data on Rb_1-x(NH₄)_xH₂PO₄ structural glasses and their deuterated isomorphsCOURTENS, E.Physical review. B, Condensed matter. 1986, Vol 33, Num 4, pp 2975-2978, issn 0163-1829Article