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Depth profiling and secondary ion mass spectrometry relative sensitivity factors and systematics for polymers/organicsWILSON, R. G; LUX, G. E; KIRSCHBAUM, C. L et al.Journal of applied physics. 1993, Vol 73, Num 5, pp 2524-2529, issn 0021-8979Article

Availability of layered certified reference materials for industrial application of glow discharge spectrometric depth profilingWINCHESTER, M; BECK, U.Surface and interface analysis. 1999, Vol 27, Num 10, pp 930-935, issn 0142-2421Article

Glow discharge spectroscopy for depth profile analysis : from micrometer to sub-nanometer layersPISONERO, Jorge.Analytical and bioanalytical chemistry. 2006, Vol 384, Num 1, pp 47-49, 3 p.Article

Accumulation rate measurements at Taylor Dome, East Antarctica : Techniques and strategies for mass balance measurements in polar environmentsMORSE, D. L; WADDINGTON, E. D; MARSHALL, H.-P et al.Geografiska annaler. Series A. Physical geography. 1999, Vol 81, Num 4, pp 683-694, issn 0435-3676Article

The ECLIPSE drill : a field-portable intermediate-depth ice-coring drillBLAKE, E. W; WAKE, C. P; GERASIMOFF, M. D et al.Journal of Glaciology. 1998, Vol 44, Num 146, pp 175-178, issn 0022-1430Article

Infrared depth profiling studies of recrystallization in laser-amorphized poly(ethylene terephthalate)RICHARDS, P. D; WEITZ, E; OUDERKIRK, A. J et al.Journal of physical chemistry (1952). 1993, Vol 97, Num 46, pp 12061-12066, issn 0022-3654Article

Current variability under landfast sea ice in Lützow-Holm Bay, AntarcticaOHSHIMA, K. I; KAWAMURA, T; TAKIZAWA, T et al.Journal of geophysical research. 2000, Vol 105, Num C7, pp 17121-17132, issn 0148-0227Article

Multi-frequency S2FTIR PA spectral depth profiling by use of sinusoidal phase modulation and harmonic demodulation up to 2250 Hz (10th harmonic)HAOCHUAN WANG; PHIFER, E. B; PALMER, R. A et al.Fresenius' journal of analytical chemistry. 1998, Vol 362, Num 1, pp 34-40, issn 0937-0633Article

Seasonal variability of particulate organic radiocarbon in the northeast Pacific OceanDRUFFEL, E. R. M; BAUER, J. E; WILLIAMS, P. M et al.Journal of geophysical research. 1996, Vol 101, Num C9, pp 20543-20552, issn 0148-0227Article

Examination of layered structures by total-reflection X-ray fluorescence analysisKNOTH, J; BORMANN, R; GUTSCHKE, R et al.Spectrochimica acta. Part B : Atomic spectroscopy. 1993, Vol 48, Num 2, pp 285-292, issn 0584-8547Conference Paper

Kohlenstoff- und Härteverlauf in der EinsatzhärtungsschichtWEISSOHN, K.-H.HTM. Härterei-technische Mitteilungen. 1991, Vol 46, Num 5, pp 272-276, issn 0341-101XArticle

Possible displacement of the climate signal in ancient ice by premelting and anomalous diffusionREMPEL, A. W; WADDINGTON, E. D; WETTLAUFER, J. S et al.Nature (London). 2001, Vol 411, Num 6837, pp 568-571, issn 0028-0836Article

Direct observation of the rapid turnover of the Japan Sea bottom water by means of AMS radiocarbon measurementKUMAMOTO, Y.-I; YONEDA, M; SHIBATA, Y et al.Geophysical research letters. 1998, Vol 25, Num 5, pp 651-654, issn 0094-8276Article

A confirmation of the double-exponential approximation of the depth distribution function for AES/XPS using reciprocal two-stream methodsDWYER, V. M.Surface science. 1993, Vol 291, Num 1-2, pp 261-270, issn 0039-6028Article

Stabilization of snow temperature in Dronning Maud Land, Antarctica, January 1989SEPPÄLÄ, M.Geografiska annaler. Series A. Physical geography. 1992, Vol 74, Num 2-3, pp 227-230, issn 0435-3676Article

Ultra-high-resolution chemical analysis by field-ion microscopy, atom probe and position-sensitive atom-probe techniquesGROVENOR, C. R. M; SMITH, G. D. W; SHOLLOCK, B. A et al.Ultramicroscopy. 1992, Vol 47, Num 1-3, pp 199-211, issn 0304-3991Conference Paper

The scattering of the fundamental torsional mode from axi-symmetric defects with varying depth profile in pipesCARANDENTE, R; MA, J; CAWLEY, P et al.The Journal of the Acoustical Society of America. 2010, Vol 127, Num 6, pp 3440-3448, issn 0001-4966, 9 p.Article

ECM profile on the S25 core and its relationships with chemical compositionsWATANABE, K; SATOW, K; KAMIYAMA, K et al.Bulletin of glaciological research. 2000, Vol 17, pp 17-22, issn 1345-3807Article

Quantitative study of background signals from crater edges and surroundings in depth profiling of small areas with secondary ion mass spectrometryMEURIS, M; DE BISSCHOP, P; VANDERVORST, W et al.Surface and interface analysis. 1993, Vol 20, Num 3, pp 206-214, issn 0142-2421Article

Interface Investigations of a Commercial Lithium Ion Battery Graphite Anode Material by Sputter Depth Profile X-ray Photoelectron SpectroscopyNIEHOFF, Philip; PASSERINI, Stefano; WINTER, Martin et al.Langmuir. 2013, Vol 29, Num 19, pp 5806-5816, issn 0743-7463, 11 p.Article

Oceanic velocity microstructure measurements in the 20th century : Progress in physical oceanographyLUECK, Rolf G; WOLK, Fabian; YAMAZAKI, Hidekatsu et al.Journal of oceanography. 2002, Vol 58, Num 1, pp 153-174, issn 0916-8370Article

Waters of the Makarov and Canada basinsSWIFT, J. H; JONES, E. P; AAGAARD, K et al.Deep-sea research. Part 2. Topical studies in oceanography. 1997, Vol 44, Num 8, pp 1503-1529, issn 0967-0645Article

First report of ice core analyses and borehole temperatures on the highest icefield on western Spitsbergen in 1992KAMEDA, T; TAKAHASHI, S; GOTO-AZUMA, K et al.Bulletin of glacier research. 1993, Num 11, pp 51-61, issn 0913-4190Article

Nondestructive determination of the degree of saponification using concentration depth profiling of functional groups by FT-IR/ATR spectroscopyHARADA, M; KITAMORI, T; TERAMAE, N et al.Applied spectroscopy. 1992, Vol 46, Num 3, pp 529-532, issn 0003-7028Article

The Shape of Nitrogen Concentration-Depth Profiles in γ'-Fe4N1-z Layers Growing on α-Fe Substrates; the Thermodynamics of γ'-Fe4N1-zWOEHRLE, T; LEINEWEBER, A; MITTEMEIJER, E. J et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2012, Vol 43, Num 2, pp 610-618, issn 1073-5623, 9 p.Article

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