Two-stage electron energy analyzer for angle-resolved photoemission spectroscopyROYER, W. A; SMITH, N. V.Review of scientific instruments. 1984, Vol 55, Num 6, pp 909-911, issn 0034-6748Article

Etude théorique du fonctionnement d'un spectromètre de rayonnement par photoionisationBUTIKOV, E. I; TUMARKIN, YA. N.Optika i spektroskopiâ. 1984, Vol 56, Num 3, pp 512-517, issn 0030-4034Article

Angle-resolving photoelectron energy analyzer: mode calculations, ray-tracing analysis and performance evaluationSTEVENS, H. A; DONOHO, A. W; TURNER, A. M et al.Journal of electron spectroscopy and related phenomena. 1983, Vol 32, Num 4, pp 327-341, issn 0368-2048Article

A simultaneous angle-resolved photoelectron spectrometerBOSCH, A; FEIL, H; SAWATZKY, G. A et al.Journal of physics. E. Scientific instruments. 1984, Vol 17, Num 12, pp 1187-1192, issn 0022-3735Article

Magnetoelectric, Raman, and XPS Properties of Pb_0.7Sr_0.3[(Fe_2/3Ce_1/3)_0.012Ti_0.988]O₃ and Pb_0.7Sr_0.3[(Fe_2/3La_1/3)_0.012Ti_0.988]O₃ NanopartidesVERMA, Kuldeep Chand; KUMAR, Manoj; KOTNALA, R. K et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2014, Vol 45, Num 3, pp 1409-1414, issn 1073-5623, 6 p.Article

Augmentation de la sensibilité de seuil d'un spectromètre de rayonnement de photoionisation par collisionsMISHCHENKO, E. D; REBO, I. L.Optika i spektroskopiâ. 1987, Vol 62, Num 2, pp 437-440, issn 0030-4034Article

Fast optical position-sensitive detector for McPherson ESCA-36BERTRAND, P. A; KALINOWSKI, W. J; TRIBBLE, L. E et al.Review of scientific instruments. 1983, Vol 54, Num 3, pp 387-389, issn 0034-6748Article

A novel soft X-ray source (hν = 151.6 eV) for core level and valence band photoemission spectroscopy with high surface sensitivityDUO, L; DE MICHELIS, B; FASANA, A et al.Journal of electron spectroscopy and related phenomena. 1993, Vol 62, Num 4, pp 309-316, issn 0368-2048Article

ESCA features of ligninsVARMA, A. J.Polymer testing. 1986, Vol 6, Num 1, pp 79-80, issn 0142-9418Article

Inexpensive and high-precision digital power supply and counting interface for UPS, XPS, and Auger spectrometersLICHTENBERGER, D. L; KELLOGG, G. E; KRISTOFZSKI, J. G et al.Review of scientific instruments. 1986, Vol 57, Num 9, issn 0034-6748, 2366Article

Film thicknesses determined by X-ray photoelectron spectrometryEBEL, M. F; ZUBA, G; EBEL, H et al.Spectrochimica acta. Part B : Atomic spectroscopy. 1984, Vol 39, Num 5, pp 637-647, issn 0584-8547Article

An X-ray photoelectron spectroscopic investigation of the oxidation of manganese = Etude par spectrométrie de photoélectron RX de l'oxydation du manganèseFOORD, J. S; JACKMAN, R. B; ALLEN, G. C et al.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1984, Vol 49, Num 5, pp 657-663, issn 0141-8610Article

Electron spectroscopy for chemical analysis studies on oxyligated holmium compoundsMILLIGAN, W. O; MULLICA, D. F; PERKINS, H. O et al.Journal of physical chemistry (1952). 1983, Vol 87, Num 26, pp 5411-5417, issn 0022-3654Article

Electronic structure of palladium = Structure électronique du palladiumBORDOLOI, A. K; AULUCK, S.Physical review. B, Condensed matter. 1983, Vol 27, Num 8, pp 5116-5118, issn 0163-1829Article

Detection of water soluble flux residues on printed wiring boards by ESCAROBERTS, R. F.Surface and interface analysis. 1985, Vol 7, Num 2, pp 88-92, issn 0142-2421Article

Signal-to-noise measurements in X-ray photoelectron spectroscopyKOENIG, M. F; GRANT, J. T.Surface and interface analysis. 1985, Vol 7, Num 5, pp 217-222, issn 0142-2421Article

High-sensitivity photoelectron spectrometer for studying reactive transient speciesMORRIS, A; JONATHAN, N; DYKE, J. M et al.Review of scientific instruments. 1984, Vol 55, Num 2, pp 172-181, issn 0034-6748Article

Elemental fluorination of poly(vinylidene fluoride)SCHERER, G. G; PFLUGER, P; BRAUN, H et al.Die Makromolekulare Chemie. Rapid communications. 1984, Vol 5, Num 9, pp 611-613, issn 0173-2803Article

Sulphide catalysts on silica as a support. III: X-ray photoelectron spectroscopy studySHEPELIN, A. P; ZHDAN, P. A; BURMISTROV, V. A et al.Applied catalysis. 1984, Vol 11, Num 1, pp 29-34, issn 0166-9834Article

Comment on graphite intercalated with H₂SO₄EBERT, L. B; APPELMAN, E. H.Physical review. B, Condensed matter. 1983, Vol 28, Num 3, pp 1637-1638, issn 0163-1829Article

X-ray photoelectron spectroscopy surface quantification of sulfided CoMoP catalysts : Relation between activity and promoted sites Part I: Influence of the Co/Mo ratioGANDUBERT, A. D; LEGENS, C; GUILLAUME, D et al.Oil & gas science and technology. 2007, Vol 62, Num 1, pp 79-89, issn 1294-4475, 11 p.Article

Surface oxidation of Ni-20Cr alloys with small additions of Ce and SiAMANO, T; ITOH, A.Applied surface science. 1992, Vol 60-61, pp 677-680, issn 0169-4332Conference Paper

A verification of the relativistic correction for electrostatic electron spectrometersSEAH, M. P; ANTHONY, M. T.Journal of electron spectroscopy and related phenomena. 1985, Vol 35, Num 1-2, pp 145-153, issn 0368-2048Article

Ultrafast sample transfer electron spectroscopy for chemical analysis (ESCA) for catalytic researchHERGLOTZ, H. K; LYNCH, D. R.Journal of colloid and interface science. 1985, Vol 105, Num 2, pp 447-455, issn 0021-9797Article

Method to determine the analysis area of x-ray photoelectron spectrometers-illustrated by a Perkin-Elmer PHI 550 ESCA/SAMSEAH, M. P; MATHIEU, H. J.Review of scientific instruments. 1985, Vol 56, Num 5, pp 703-711, issn 0034-6748Article