X-ray photoelectron spectroscopic study of Tencel treated with a cationic β-cyclodextrin derivativeKISTAMAH, N; CARR, C. M; ROSUNEE, S et al.Surface and interface analysis. 2009, Vol 41, Num 9, pp 710-713, issn 0142-2421, 4 p.Article

Efficiency of visual peak detection in X-ray photoelectron spectraSUZUKI, Mineharu; FUKUSHIMA, Sei; TANUMA, Shigeo et al.Surface and interface analysis. 2008, Vol 40, Num 10, pp 1337-1343, issn 0142-2421, 7 p.Article

An XPS study of Al₂Au and AlAu₄ intermetallic oxidationXU, C; SRITHARAN, T; MHAISALKAR, S. G et al.Applied surface science. 2007, Vol 253, Num 14, pp 6217-6221, issn 0169-4332, 5 p.Article

The effect of covalent surface immobilization on the bactericidal efficacy of a quaternary ammonium compoundBRIZZOLARA, Robert A; STAMPER, David M.Surface and interface analysis. 2007, Vol 39, Num 7, pp 559-566, issn 0142-2421, 8 p.Article

Ultra-thin SiO₂ on Si VIII. Accuracy of method, linearity and attenuation lengths for XPSKYUNG JOONG KIM; SEAH, M. P.Surface and interface analysis. 2007, Vol 39, Num 6, pp 512-518, issn 0142-2421, 7 p.Article

Surface characterisation of ethylene-propylene-diene rubber upon exposure to aqueous acidic solutionMITRA, Susanta; GHANBARI-SIAHKALI, Afshin; KINGSHOTT, Peter et al.Applied surface science. 2006, Vol 252, Num 18, pp 6280-6288, issn 0169-4332, 9 p.Article

The utility of photoemission spectroscopy in the study of intercalation reactionsWU, Qi-Hui.Surface and interface analysis. 2006, Vol 38, Num 8, pp 1179-1185, issn 0142-2421, 7 p.Article

A comparative XPS and UPS study of VO_x layers on mineral TiO₂(001)-anatase supportsSILVERSMIT, Geert; POELMAN, Hilde; DEPLA, Diederik et al.Surface and interface analysis. 2006, Vol 38, Num 9, pp 1257-1265, issn 0142-2421, 9 p.Article

Surface analysis of heat-treated Mong Hsu rubiesACHIWAWANICH, S; BRACK, N; JAMES, B. D et al.Applied surface science. 2006, Vol 252, Num 24, pp 8646-8650, issn 0169-4332, 5 p.Article

Ultrathin SiO₂ on Si. VII. Angular accuracy in XPS and an accurate attenuation lengthSEAH, M. P; SPENCER, S. J.Surface and interface analysis. 2005, Vol 37, Num 9, pp 731-736, issn 0142-2421, 6 p.Article

Origin of molecular orbital splitting of C₆₀ on Al(110)SCHIESSLING, J; STENER, M; BALASUBRAMANIAN, T et al.Journal of physics. Condensed matter (Print). 2004, Vol 16, Num 36, pp L407-L414, issn 0953-8984Article

Investigation of multiplet splitting of Fe 2p XPS spectra and bonding in iron compoundsGROSVENOR, A. P; KOBE, B. A; BIESINGER, M. C et al.Surface and interface analysis. 2004, Vol 36, Num 12, pp 1564-1574, issn 0142-2421, 11 p.Article

A method for the experimental determination of the net atomic charge via X-ray photoemission spectroscopyCEROFOLINI, G. F; MEDA, L; RE, N et al.Applied physics. A, Materials science & processing (Print). 2001, Vol 72, Num 5, pp 603-611, issn 0947-8396Article

Analysis of the x-ray photoelectron energy-loss background in silicidesCASTLE, J. E; SALVI, A. M; GUASCITO, M. R et al.Surface and interface analysis. 2001, Vol 31, Num 9, pp 881-889, issn 0142-2421Article

The effect of photoemission on the streamer development and propagation in short uniform gapsGEORGHIOU, G. E; MORROW, R; METAXAS, A. C et al.Journal of physics. D, Applied physics (Print). 2001, Vol 34, Num 2, pp 200-208, issn 0022-3727Article

Correlation of C_1s chemical state intensities with the O_1s intensity in the XPS analysis of anodically oxidized glass-like carbon samplesYUMITORI, S.Journal of materials science. 2000, Vol 35, Num 1, pp 139-146, issn 0022-2461Article

Linear dichroism and resonant photoemission in GdMISHRA, S. R; CUMMINS, T. R; WADDILL, G. D et al.Journal of magnetism and magnetic materials. 1999, Vol 198-99, pp 647-649, issn 0304-8853Conference Paper

Angular dependence of magnetic dichroism in 4f-photoemissionGOROVIKOV, S; BODE, S; STARKE, K et al.Journal of magnetism and magnetic materials. 1999, Vol 198-99, pp 665-667, issn 0304-8853Conference Paper

Electron-electron coincidences experiments on surfaces, status and perspective of a new spectroscopySTEFANI, G.Journal de physique. IV. 1999, Vol 9, Num 6, pp Pr6.123-Pr6.126, issn 1155-4339Conference Paper

Resonant photoemission from CeNi_x (x = 1, 2 and 5)PURDIE, D; GARNIER, M; BREUER, K et al.Solid state communications. 1998, Vol 106, Num 12, pp 799-803, issn 0038-1098Article

Emission-depth dependence of the signal photoelectron energy spectrumTILININ, I. S; JABLONSKI, A; TOUGAARD, S et al.Surface and interface analysis. 1997, Vol 25, Num 2, pp 119-131, issn 0142-2421Article

Influence of the dopant concentration on the photoemission in NEA GaAs photocathodesVERGARA, G; GOMEZ, L; CAPMANY, J et al.Vacuum. 1997, Vol 48, Num 2, pp 155-160, issn 0042-207XArticle

Décomposition des pics XPS à composantes multiples = XPS peak liftingOLLIVIER, E.Le Vide (1995). 1996, Vol 52, Num 279, issn 1266-0167, 8, 53-64 [13 p.]Conference Paper

On the history of photoemissionBONZEL, H. P; KLEINT, C.Progress in surface science. 1995, Vol 49, Num 2, pp 107-153, issn 0079-6816Article

Electron energy-loss line-width for electrons reflected from a non-monocristalline substanceNAKHODKIN, N; VOSKOBOINIKOV, A; KRYN'KO, YU et al.Journal of electron spectroscopy and related phenomena. 1994, Vol 68, pp 641-646, issn 0368-2048Conference Paper