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Results 1 to 25 of 5831

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RF-plasma vapor deposition of siloxane on paper. Part 2: Chemical evolution of paper surfaceTURGUT SAHIN, Halil.Applied surface science. 2013, Vol 265, pp 564-569, issn 0169-4332, 6 p.Article

Study of polymer-magnetic electrode interfaces using XPSMORLEY, N. A; AL QAHTANI, H. R. H; HODGES, M. H et al.Applied surface science. 2013, Vol 265, pp 570-577, issn 0169-4332, 8 p.Article

X-ray photoelectron spectroscopic studies on phase identification and quantification of nickel aluminidesOHTSU, Naofumi; OKU, Masaoki; SHISHIDO, Toetsu et al.Applied surface science. 2007, Vol 253, Num 21, pp 8713-8717, issn 0169-4332, 5 p.Article

Ultrafast interfacial electron transfer from the excited state of anchored molecules into a semiconductorGUNDLACH, L; ERNSTORFER, R; WILLIG, F et al.Progress in surface science. 2007, Vol 82, Num 4-6, pp 355-377, issn 0079-6816, 23 p.Article

Argon nanobubbles in Al(111): A photoemission studyBISWAS, C; SHUKIA, A. K; BANIK, S et al.Physical review letters. 2004, Vol 92, Num 11, pp 115506.1-115506.4, issn 0031-9007Article

Excited states mapped by secondary photoemissionBOVET, M; STROCOY, V. N; CLERC, F et al.Physical review letters. 2004, Vol 93, Num 10, pp 107601.1-107601.4, issn 0031-9007Article

Nitrogen bonding structure in ultrathin silicon oxynitride films on Si(100) prepared by plasma nitridationYU KWON KIM; HYUN SEOK LEE; YEOM, H. W et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 16, pp 165320.1-165320.6, issn 1098-0121Article

New frontiers in X-ray photoelectron spectroscopyMCINTYRE, N. S; DAVIDSON, R. D; KIM, G et al.Vacuum. 2002, Vol 69, Num 1-3, pp 63-71, issn 0042-207X, 9 p.Conference Paper

Binding state information from XPS depth profiling: capabilities and limitsOSWALD, S; REICHE, R.Applied surface science. 2001, Vol 179, Num 1-4, pp 307-315, issn 0169-4332Conference Paper

Ti 2p and Ti 3p X-ray photoelectron spectra for TiO2, SrTiO3 and BaTiO3OKU, M; WAGATSUMA, K; KOHIKI, S et al.PCCP. Physical chemistry chemical physics (Print). 1999, Vol 1, Num 23, pp 5327-5331, issn 1463-9076Article

An evaluation of the differential inelastic mean free path from REELS spectrum using Monte Carlo simulation : application to TiCYOSHIKAWA, H; FUKUSHIMA, S.Surface science. 1999, Vol 431, Num 1-3, pp 8-15, issn 0039-6028Article

Auger photoelectron coincidence spectroscopy of the 2p1/2 line in coincidence with the L3-M45M45 peak of copperCREAGH, C. A; THURGATE, S. M; CRAIG, R. P et al.Surface science. 1999, Vol 432, Num 3, pp 297-304, issn 0039-6028Article

Magnetic linear dichroism in gadolinium 4f satellitesZEYBEK, O; TUCKER, N. P; BARRETT, S. D et al.Journal of magnetism and magnetic materials. 1999, Vol 198-99, pp 650-652, issn 0304-8853Conference Paper

Resolution enhancement of X-ray photoelectron spectra by maximum entropy deconvolutionMCINTYRE, N. S; PRATT, A. R; PIAO, H et al.Applied surface science. 1999, Vol 144-45, pp 156-160, issn 0169-4332Conference Paper

XPS of sulphide mineral surfaces : Metal-deficient, polysulphides, defects and elemental sulphurSMART, R. S. C; SKINNER, W. M; GERSON, A. R et al.Surface and interface analysis. 1999, Vol 28, Num 1, pp 101-105, issn 0142-2421Conference Paper

Distribution function for photoelectrons in a pulsed X-ray flux in the presence of a magnetic fieldZHEMEREV, A. V.Atomic energy (New York, N.Y.). 1999, Vol 87, Num 5, pp 834-839, issn 1063-4258Article

N-type doping in CdO ceramics : a study by EELS and photoemission spectroscopyDOU, Y; EGDELL, R. G; WALKER, T et al.Surface science. 1998, Vol 398, Num 1-2, pp 241-258, issn 0039-6028Article

Angle-scanned photoemission : Fermi surface mapping and structural determinationAEBI, P; FASEL, R; BERGER, H et al.Surface science. 1998, Vol 402-04, pp 614-622, issn 0039-6028Conference Paper

A combined AES, resonant photoemission and EELS study of in-situ grown titanium nitrideWALKER, C. G. H; ANDERSON, C. A; MCKINLEY, A et al.Surface science. 1997, Vol 383, Num 2-3, pp 248-260, issn 0039-6028Article

Theory of angle-resolved X-ray photoemission by multiple-scattering cluster method. V. Spherical wave effects on ARXPS Debye-Waller factorsYANAGAWA, T; FUJIKAWA, T.Journal of the Physical Society of Japan. 1996, Vol 65, Num 6, pp 1832-1843, issn 0031-9015Article

Charge-up and charge compensation on monochromatized X-ray photoelectron spectroscopic measurements of alumina and glassTOMIZUKA, H; AYAME, A.Applied surface science. 1996, Vol 100-01, pp 243-247, issn 0169-4332Conference Paper

Extraction of depth distributions of electron-excited Auger electrons in Fe, Ni and Si using inelastic peak shape analysisFUJITA, D; SCHLEBERGER, M; TOUGAARD, S et al.Surface science. 1996, Vol 357-58, pp 180-185, issn 0039-6028Conference Paper

Elemental binding energies for X-ray photoelectron spectroscopyPOWELL, C. J.Applied surface science. 1995, Vol 89, Num 2, pp 141-149, issn 0169-4332Article

A theory of quantitative angle-resolved X-ray photoelectron spectroscopyTILININ, I. S; JABLONSKI, A; LESIAK-ORLOWSKA, B et al.Vacuum. 1995, Vol 46, Num 5-6, pp 613-616, issn 0042-207XConference Paper

High spatial resolution extended energy loss fine structure investigations of silicon dioxide compoundsZOU WEI YUAN; CSILLAG, S; TAFRESHI, M. A et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 149-157, issn 0304-3991Conference Paper

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