Structural study on cast films of C₆₀ derivatives with long alkyl chainsCHIKAMATSU, M; HANADA, T; YOSHIDA, Y et al.Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals. 1998, Vol 316, pp 157-160, issn 1058-725XConference Paper

X-ray diffraction studies of porous siliconBELLET, D; DOLINO, G.Thin solid films. 1996, Vol 276, Num 1-2, pp 1-6, issn 0040-6090Conference Paper

Simultaneous determination of thermal conductivities of thin film and substrate by extending 3ω-method to wide-frequency rangeZHAO LIANG WANG; DA WEI TANG; XING HUA ZHENG et al.Applied surface science. 2007, Vol 253, Num 22, pp 9024-9029, issn 0169-4332, 6 p.Article

Proceedings from IUMRS-ICAM '99 Symposium X, Surface Engineering, June 13-18 1999, Beijing, ChinaZHOU, K; WEN, L; MAYR, P et al.Surface & coatings technology. 2000, Vol 130, Num 1, issn 0257-8972, 140 p.Conference Proceedings

Intrinsic stress in porous silicon layers formed by anodization in HF solutionUNAGAMI, T.Journal of the Electrochemical Society. 1997, Vol 144, Num 5, pp 1835-1838, issn 0013-4651Article

Effective elastic constants of superlattice films measured by line-focus acoustic microscopyKIM, J. O; ACHENBACH, J. D; SHINN, M et al.Journal of engineering materials and technology. 1995, Vol 117, Num 4, pp 395-401, issn 0094-4289Article

Physical properties of nitrogenated amorphous carbon films produced by ion-beam-assisted depositionROSSI, F; ANDRE, B; VAN VEEN, A et al.Thin solid films. 1994, Vol 253, Num 1-2, pp 85-89, issn 0040-6090Conference Paper

Impact testing of duplex and non-duplex (Ti, Al)N and Cr-N PVD coatingsBATISTA, J. C. A; GODOY, C; MATTHEWS, A et al.Surface & coatings technology. 2003, Vol 163-64, pp 353-361, issn 0257-8972, 9 p.Conference Paper

Diffusion and reactions in thin filmsGREER, A. L.Applied surface science. 1995, Vol 86, Num 1-4, pp 329-337, issn 0169-4332Conference Paper

Optical and thermal characterization of AlN thin films deposited by pulsed laser depositionJACQUOT, A; LENOIR, B; DAUSCHER, A et al.Applied surface science. 2002, Vol 186, Num 1-4, pp 507-512, issn 0169-4332Conference Paper

Proceedings of the 28th International Conference on Metallurgical Coatings and Thin Films, San Diego, California, April 30 - May 4, 2001MITTERER, C; PIQUE, A; MARCHEV, K et al.Surface & coatings technology. 2001, Vol 146-47, issn 0257-8972, 601 p.Conference Proceedings

Structural investigation and wear resistance of submicron TiN coatings obtained by a hybrid plasma immersion ion implantation processGÜNZEL, R; SHEVSHENKO, N; MATZ, W et al.Surface & coatings technology. 2001, Vol 142-44, pp 978-983, issn 0257-8972Conference Paper

Chemical, mechanical, and tribological properties of pulsed-laser-deposited titanium carbide and vanadium carbideKRZANOWSKI, J. E; LEUCHTNER, R. E.Journal of the American Ceramic Society. 1997, Vol 80, Num 5, pp 1277-1280, issn 0002-7820Article

Resistant oxide coatings for heavy metal fluoride glassesHARTMANN, M; FRISCHAT, G. H; HÖGERL, K et al.Journal of non-crystalline solids. 1995, Vol 184, pp 209-212, issn 0022-3093Conference Paper

Effects of deposition conditions on physical properties and stresses of Pt and (Al, Si)O_x thin filmsLEE, J.-S; PARK, J.-W; PARK, J.-S et al.Journal of materials science letters. 1997, Vol 16, Num 11, pp 941-945, issn 0261-8028Article

Enhanced mechanical hardness in compositionally mudulated Fe(001)/Pt(001) and Fe(001)/Cr(001) epitaxial thin filmsDANIELS, B. J; NIX, W. D; CLEMENS, B. M et al.Thin solid films. 1994, Vol 253, Num 1-2, pp 218-222, issn 0040-6090Conference Paper

Regularities of intercalation of two-dimensional graphite films on metals by atoms and C60 moleculesGALL, N. R; RUT'KOV, E. V; TONTEGODE, A. Ya et al.Synthetic metals. 1998, Vol 97, Num 3, pp 171-173, issn 0379-6779Article

Thermal oxidation properties of titanium nitride and titanium-aluminum nitride materials : A perspective for high temperature air-stable solar selective absorber applicationsYIN, Y; HANG, L; ZHANG, S et al.Thin solid films. 2007, Vol 515, Num 5, pp 2829-2832, issn 0040-6090, 4 p.Article

Planarization processes and applications. III. As-deposited and annealed film propertiesCROSWELL, R. T; REISMAN, A; SIMPSON, D. L et al.Journal of the Electrochemical Society. 2000, Vol 147, Num 4, pp 1513-1524, issn 0013-4651Article

Beryllium diffusion in InGaAs compounds grown by chemical beam epitaxyKOUMETZ, S; MARCON, J; KETATA, K et al.Journal of physics. D, Applied physics (Print). 1997, Vol 30, Num 5, pp 757-762, issn 0022-3727Article

On the hot phonon spot dynamics in thin filmsAGAEV, F. F; GUSEINOV, N. M; RUSTAMOV, K. A et al.Physica status solidi. B. Basic research. 1993, Vol 178, Num 1, pp 115-125, issn 0370-1972Article

The failure mechanisms of TBC structure by moire interferometryMINJIN TANG; HUIMIN XIE; JIANGUO ZHU et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2013, Vol 565, pp 142-147, issn 0921-5093, 6 p.Article

Formation and characterization of cobalt oxide layers on polyimide films via surface modification and ion-exchange techniqueSHUXIANG MU; ZHANPENG WU; YUE WANG et al.Thin solid films. 2010, Vol 518, Num 15, pp 4175-4182, issn 0040-6090, 8 p.Article

Tensile strained Ge layers on strain-relaxed Ge_1-xSn_x/virtual Ge substratesTAKEUCHI, Shotaro; SAKAI, Akira; NAKATSUKA, Osamu et al.Thin solid films. 2008, Vol 517, Num 1, pp 159-162, issn 0040-6090, 4 p.Conference Paper

Nano-indentation method for the measurement of the Poisson's ratio of MEMS thin filmsKIM, Jong-Hoon; YEON, Soon-Chang; JEON, Yun-Kwang et al.Sensors and actuators. A, Physical. 2003, Vol 108, Num 1-3, pp 20-27, issn 0924-4247, 8 p.Conference Paper