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Stress in Evaporated and Sputtered Thin Films - A ComparisonKOCH, R.Surface & coatings technology. 2010, Vol 204, Num 12-13, pp 1973-1982, issn 0257-8972, 10 p.Conference Paper

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High throughput growth and characterization of thin film materialsMAO, Samuel S.Journal of crystal growth. 2013, Vol 379, pp 123-130, issn 0022-0248, 8 p.Article

Morphology and texture evolution of FeCrAITi-Y₂O₃ foil fabricated by EBPVDXIU LIN; XIAODONG HE; YUE SUN et al.Surface & coatings technology. 2010, Vol 205, Num 1, pp 76-84, issn 0257-8972, 9 p.Article