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Results 1 to 25 of 1275

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Characterization of bulk micromachined tunneling tip integrated with positioning actuatorMITA, M; TOSHIYOSHI, H; KAKUSHIMA, K et al.Proceedings, IEEE micro electro mechanical systems. 2002, pp 352-355, issn 1084-6999, isbn 0-7803-7185-2, 4 p.Conference Paper

Effects of self-modifying multiple tips on STM surface picturesOUSEPH, P. J; GOSSMAN, M.Measurement science & technology (Print). 1998, Vol 9, Num 4, pp 701-704, issn 0957-0233Article

A tip approach system for a scanning tunneling microscope using an inchwormKURODA, T; TANAKA, K; WATANABE, M. O et al.Japanese journal of applied physics. 1993, Vol 32, Num 11A, pp 5176-5177, issn 0021-4922, 1Article

Interaction forces between a tungsten tip and methylated SiO2 surfaces studies with scanning for microscopyOLSSON, L; TENGVALL, P; WIGREN, R et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 73-79, issn 0304-3991Conference Paper

Rhenium tips for stable scanning tunneling microscopyWATANABE, M. O; KINNO, T.Japanese journal of applied physics. 1993, Vol 32, Num 9A, pp L1266-L1268, issn 0021-4922, 2Article

Reproducible fabrication technique of nanometric tip diameter fiber probe for photon scanning tunneling microscopePANGARIBUAN, T; YAMADA, K; JIANG, S et al.Japanese journal of applied physics. 1992, Vol 31, Num 9A, pp L1302-L1304, issn 0021-4922, 2Article

Modularity redefines the atomic force microscopeSERRY, F. Michael.Laser focus world. 2002, Vol 38, Num 6, pp S9-S11, issn 1043-8092, 3 p.Article

Direct observation of the tip shape in scanning probe microscopyMONTELIUS, L; TEGENFELDT, J. O.Applied physics letters. 1993, Vol 62, Num 21, pp 2628-2630, issn 0003-6951Article

z calibration of the atomic force microscope by means by a pyramidal tipJENSEN, F.Review of scientific instruments. 1993, Vol 64, Num 9, pp 2595-2597, issn 0034-6748Article

New method for producing sharp atomic protrusions on blunt tungsten tipsSHARMA, A. K; VISPUTE, R. D; OGALE, S. B et al.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1992, Vol 10, Num 3, pp 1208-1210, issn 0734-211XArticle

Transient thermography of semiconductors using the evanescent microwave microscopeCIOCAN, R; TABIB-AZAR, M.Microscale thermophysical engineering (Print). 1999, Vol 3, Num 4, pp 253-262, issn 1089-3954Article

The use of silver tips in scanning tunnelling microscopyGORBUNOV, A. A; WOLF, B; EDELMANN, J et al.Review of scientific instruments. 1993, Vol 64, Num 8, pp 2393-2394, issn 0034-6748Article

Integrated electrostatically resonant scan tip for an atomic force microscopeKONG, L. C; ORR, B. G; WISE, K. D et al.Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena. 1993, Vol 11, Num 3, pp 634-641, issn 1071-1023Conference Paper

Method for the experimental investigation of tip profiles for scanning tunneling microscopyEFREMOV, V. V; LOUSKINOVICH, P. N; NIKISHIN, V. I et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1459-1463, issn 0304-3991Conference Paper

Silicon cantilevers and tips for scanning force microscopyBRUGGER, J; BUSER, R. A; DE ROOIJ, N. F et al.Sensors and actuators. A, Physical. 1992, Vol 34, Num 3, pp 193-200, issn 0924-4247Conference Paper

Influence of the surface chemistry on the nanotribological behaviour of (AFM tip/graphite) couplesJRADI, Khalil; SCHMITT, Marjorie; BISTAC, Sophie et al.Applied surface science. 2012, Vol 258, Num 10, pp 4687-4697, issn 0169-4332, 11 p.Article

Calibration of atomic-force microscope tipsHUTTER, J. L; BECHHOEFER, J.Review of scientific instruments. 1993, Vol 64, Num 7, pp 1868-1873, issn 0034-6748Article

Use of a ReO3 single crystal as the tip for scanning tunneling microscopyIKEBE, S.-I; SHIMADA, D; AKAHANE, T et al.Japanese journal of applied physics. 1991, Vol 30, Num 3A, pp L405-L406, issn 0021-4922, 2Article

Force measurements on hydrophobized silica surfaces by using AFMHÜTTL, G; HEGER, K; KLEMM, V et al.Fresenius' journal of analytical chemistry. 1999, Vol 363, Num 2, pp 206-208, issn 0937-0633Article

Imaging magnetic charges with magnetic force microscopyHUBERT, A; RAVE, W; TOMLINSON, S. L et al.Physica status solidi. B. Basic research. 1997, Vol 204, Num 2, pp 817-828, issn 0370-1972Article

Fullerene functionalized scanning tunneling microscope tips- preparation, characterization and applicationsKELLY, K. F; SARKAR, D; OLDENBURG, S. J et al.Synthetic metals. 1997, Vol 86, Num 1-3, pp 2407-2410, issn 0379-6779Conference Paper

Fabrication of microtips on planar specimensLARSON, D. J; CHEN-MING TENG; CAMUS, P. P et al.Applied surface science. 1995, Vol 87-88, pp 446-452, issn 0169-4332Conference Paper

An automatic field-emission tip conditioning systemRUAN, S; KAPP, O. H.Review of scientific instruments. 1992, Vol 63, Num 9, pp 4056-4060, issn 0034-6748Article

Tip-structure effects on atomic force microscopy imagesTEKMAN, E; CIRACI, S.Journal of physics. Condensed matter (Print). 1991, Vol 3, Num 16, pp 2613-2619, issn 0953-8984, 7 p.Article

On the limits of the spectroscopic ability of AFM and the interaction between an AFM tip and a sampleSOKOLOV, I. YU.Surface science. 1994, Vol 311, Num 3, pp 287-294, issn 0039-6028Article

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