Generalized ellipsometry for the characterization of anisotropic materials : Influence of the sample adjustment on the extracted optical indicesBOHER, P; PIEL, J. P; SACEPE, B et al.Thin solid films. 2004, Vol 455-56, pp 581-585, issn 0040-6090, 5 p.Conference Paper

Industrial applications of spectroscopic ellipsometryTOMPKINS, Harland G.Thin solid films. 2004, Vol 455-56, pp 772-778, issn 0040-6090, 7 p.Conference Paper

Spectroscopic ellipsometry on biological materials: investigation of hydration dynamics and structural propertiesSCHULZ, B; CHAN, D; BÄCKSTRÖM, J et al.Thin solid films. 2004, Vol 455-56, pp 731-734, issn 0040-6090, 4 p.Conference Paper

Spectroscopic anisotropy micro-ellipsometry for determination of lateral dimensions of form birefringent structuresBLOE, H; SCHULTZE, J. W; MICHAELIS, A et al.Thin solid films. 2002, Vol 414, Num 2, pp 246-250, issn 0040-6090Article

Stereo videopolarimetry : Measuring and visualizing polarization patterns in three dimensionsMIZERA, Ferenc; BERNATH, Balazs; KRISKA, György et al.The Journal of imaging science and technology. 2001, Vol 45, Num 4, pp 393-399, issn 1062-3701Conference Paper

Investigations into the angle resolution of an imaging micropolarimeterNITZSCHE, G; FUHRMEISTER, T.Optik (Stuttgart). 2000, Vol 111, Num 4, pp 141-148, issn 0030-4026Article

An error evaluation technique for the angle of incidence in a rotating element ellipsometer using a quartz crystalCHAO, Y. F; WANG, M. W; KO, Z. C et al.Journal of physics. D, Applied physics (Print). 1999, Vol 32, Num 17, pp 2246-2249, issn 0022-3727Article

Imaging ellipsometry analyzes small samples : Optoelectronics world : OpticsHOENIG, D.Laser focus world. 1998, Vol 34, Num 10, pp S37-S42, issn 1043-8092, 4 p.Article

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Optical surface analysis by Ellipso-Height ProfilometryLEONHARDT, K; WEGNER, M.Optik (Stuttgart). 1996, Vol 103, Num 4, pp 179-187, issn 0030-4026Article

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Polarization measurements simplify component selectionCROSS, R.Laser focus world. 1993, Vol 29, Num 8, pp 91-95, issn 1043-8092, 105 [4 p.]Article

Ellipsometry of anisotropic mediaLEKNER, J.Journal of the Optical Society of America. A, Optics and image science. 1993, Vol 10, Num 7, pp 1579-1581, issn 0740-3232Article

Errors in polarization measurements due to static retardation in photoelastic modulatorsMODINE, F. A; JELLISON, G. E.Applied physics communications. 1993, Vol 12, Num 1, pp 121-139, issn 0277-9374Article

Measurements of linear diattenuation and linear retardance spectra with a rotating sample spectropolarimeterCHENAULT, D. B; CHIPMAN, R. A.Applied optics. 1993, Vol 32, Num 19, pp 3513-3519, issn 0003-6935Article

Multichannel Mueller matrix ellipsometer based on the dual rotating compensator principleCHI CHEN; AN, Ilsin; FERREIRA, G. M et al.Thin solid films. 2004, Vol 455-56, pp 14-23, issn 0040-6090, 10 p.Conference Paper

Precision in ellipsometrically determined sample parameters: simulation and experimentJOHS, Blaine; HERZINGER, Craig M.Thin solid films. 2004, Vol 455-56, pp 66-71, issn 0040-6090, 6 p.Conference Paper

Precision auto-alignment for incident angle of an ellipsometer using specimen stagePARK, Sunglim; GWEON, Daegab; YOUNG DONG KIM et al.Thin solid films. 2004, Vol 455-56, pp 72-77, issn 0040-6090, 6 p.Conference Paper

Error function for interpretations of ellipsometric measurementsPOLOVINKIN, V. G.Thin solid films. 2004, Vol 455-56, pp 101-105, issn 0040-6090, 5 p.Conference Paper

Application of FTIR ellipsometry to detect and classify microorganismsGARCIA-CAUREL, Enric; NGUYEN, Jacqueline; SCHWARTZ, Laurent et al.Thin solid films. 2004, Vol 455-56, pp 722-725, issn 0040-6090, 4 p.Conference Paper

Evaluation of ellipsometric measurements using complex strategiesPOLGAR, O; FRIED, M; LOHNER, T et al.Thin solid films. 2004, Vol 455-56, pp 95-100, issn 0040-6090, 6 p.Conference Paper

Spectroscopic ellipsometry using the grating division-of-amplitude photopolarimeter (G-DOAP)KRISHNAN, S; HAMPTON, Scott; AZZAM, R. M. A et al.Thin solid films. 2004, Vol 455-56, pp 24-32, issn 0040-6090, 9 p.Conference Paper

Second harmonic ellipsometryTIMSON, Andrew J; SPENCER-SMITH, Rowland D; ALEXANDER, Alexander K et al.Measurement science & technology (Print). 2003, Vol 14, Num 4, pp 508-515, issn 0957-0233, 8 p.Article

Applications of the Poincaré sphere in polarization metrologyNAGIB, N. N; KHODIER, S. A.Optics and laser technology. 2000, Vol 32, Num 5, pp 373-377, issn 0030-3992Article

Accuracy of whole-field mapping by Jones Matrix Fourier photopolarimeterBEREZHNA, S; BEREZHNYY, I; TAKASHI, M et al.SPIE proceedings series. 2000, pp 81-89, isbn 0-8194-3795-6Conference Paper