Pascal and Francis Bibliographic Databases


Search results

Your search

ct.\*:("Polarimeters and ellipsometers")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV


A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 1974

  • Page / 79

Selection :

  • and

Generalized ellipsometry for the characterization of anisotropic materials : Influence of the sample adjustment on the extracted optical indicesBOHER, P; PIEL, J. P; SACEPE, B et al.Thin solid films. 2004, Vol 455-56, pp 581-585, issn 0040-6090, 5 p.Conference Paper

Industrial applications of spectroscopic ellipsometryTOMPKINS, Harland G.Thin solid films. 2004, Vol 455-56, pp 772-778, issn 0040-6090, 7 p.Conference Paper

Spectroscopic ellipsometry on biological materials: investigation of hydration dynamics and structural propertiesSCHULZ, B; CHAN, D; BÄCKSTRÖM, J et al.Thin solid films. 2004, Vol 455-56, pp 731-734, issn 0040-6090, 4 p.Conference Paper

Spectroscopic anisotropy micro-ellipsometry for determination of lateral dimensions of form birefringent structuresBLOE, H; SCHULTZE, J. W; MICHAELIS, A et al.Thin solid films. 2002, Vol 414, Num 2, pp 246-250, issn 0040-6090Article

Stereo videopolarimetry : Measuring and visualizing polarization patterns in three dimensionsMIZERA, Ferenc; BERNATH, Balazs; KRISKA, György et al.The Journal of imaging science and technology. 2001, Vol 45, Num 4, pp 393-399, issn 1062-3701Conference Paper

Investigations into the angle resolution of an imaging micropolarimeterNITZSCHE, G; FUHRMEISTER, T.Optik (Stuttgart). 2000, Vol 111, Num 4, pp 141-148, issn 0030-4026Article

An error evaluation technique for the angle of incidence in a rotating element ellipsometer using a quartz crystalCHAO, Y. F; WANG, M. W; KO, Z. C et al.Journal of physics. D, Applied physics (Print). 1999, Vol 32, Num 17, pp 2246-2249, issn 0022-3727Article

Imaging ellipsometry analyzes small samples : Optoelectronics world : OpticsHOENIG, D.Laser focus world. 1998, Vol 34, Num 10, pp S37-S42, issn 1043-8092, 4 p.Article

An improved full-field compensatorHARIHARAN, P; CIDDOR, P. E.Measurement science & technology (Print). 1997, Vol 8, Num 8, pp 936-937, issn 0957-0233Article

Optical surface analysis by Ellipso-Height ProfilometryLEONHARDT, K; WEGNER, M.Optik (Stuttgart). 1996, Vol 103, Num 4, pp 179-187, issn 0030-4026Article

Polarimetry in capillary dimensionsBORNHOP, D. J; HANKINS, J.Analytical chemistry (Washington, DC). 1996, Vol 68, Num 10, pp 1677-1684, issn 0003-2700Article

Polarization measurements simplify component selectionCROSS, R.Laser focus world. 1993, Vol 29, Num 8, pp 91-95, issn 1043-8092, 105 [4 p.]Article

Ellipsometry of anisotropic mediaLEKNER, J.Journal of the Optical Society of America. A, Optics and image science. 1993, Vol 10, Num 7, pp 1579-1581, issn 0740-3232Article

Errors in polarization measurements due to static retardation in photoelastic modulatorsMODINE, F. A; JELLISON, G. E.Applied physics communications. 1993, Vol 12, Num 1, pp 121-139, issn 0277-9374Article

Measurements of linear diattenuation and linear retardance spectra with a rotating sample spectropolarimeterCHENAULT, D. B; CHIPMAN, R. A.Applied optics. 1993, Vol 32, Num 19, pp 3513-3519, issn 0003-6935Article

Novel method for measurement of retardance of a quarter-wave plateZHENG PING WANG; QING BO LI; QIAO TAN et al.Optics and laser technology. 2004, Vol 36, Num 4, pp 285-290, issn 0030-3992, 6 p.Article

Expanding horizons: new developments in ellipsometry and polarimetryASPNES, D. E.Thin solid films. 2004, Vol 455-56, pp 3-13, issn 0040-6090, 11 p.Conference Paper

Accurate calibration and optimized measurement: use of an achromatic compensator in rotating polarizer spectroscopic ellipsometryBROCH, L; EN NACIRI, A; JOHANN, L et al.Thin solid films. 2004, Vol 455-56, pp 61-65, issn 0040-6090, 5 p.Conference Paper

Development and test of a new grating-polarimeter and its application in ellipsometric measurementsMASETTI, E; KRASILNIKOVA, A.Thin solid films. 2004, Vol 455-56, pp 138-142, issn 0040-6090, 5 p.Conference Paper

General virtual interface algorithm for in situ spectroscopic ellipsometric data analysisJOHS, Blaine.Thin solid films. 2004, Vol 455-56, pp 632-638, issn 0040-6090, 7 p.Conference Paper

Realtime layer-by-layer analysis for multilayer fabrication monitoring by an automatic null ellipsometerTSURU, T; TSUTOU, T; YAMAMOTO, M et al.Thin solid films. 2004, Vol 455-56, pp 705-709, issn 0040-6090, 5 p.Conference Paper

Accurate interband-energy measurements from Ellipsometric spectraJIE LIAN; QINGPU WANG; XINGKUI CHENG et al.Optics and laser technology. 2003, Vol 35, Num 1, pp 49-53, issn 0030-3992, 5 p.Article

Polarization science and remote sensing (San Diego CA, 3-5 August 2003)Shaw, Joseph A; Tyo, J. Scott.SPIE proceedings series. 2003, isbn 0-8194-5031-6, VII, 262 p, isbn 0-8194-5031-6Conference Proceedings

Principe et applications de l'ellipsométrie spectroscopique = Principle and applications of spectroscopic ellipsometryCASTELLON, Bernard.Photoniques (Orsay). 2002, Num 7, pp 40-43, issn 1629-4475Article

Sensitivity analysis of ellipsometry applied to uniaxial optical filmsFLUERARU, C; SCHRADER, S; MOTSCHMANN, H et al.Thin solid films. 2000, Vol 379, Num 1-2, pp 15-22, issn 0040-6090Article

  • Page / 79