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Results 1 to 25 of 1328

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Microfabrication using one-step LPCVD porous polysilicon filmsDOUGHERTY, George M; SANDS, Timothy D; PISANO, Albert P et al.Journal of microelectromechanical systems. 2003, Vol 12, Num 4, pp 418-424, issn 1057-7157, 7 p.Article

Fracture strength of polysilicon at stress concentrationsBAGDAHN, Jörg; SHARPE, William N; JADAAN, Osama et al.Journal of microelectromechanical systems. 2003, Vol 12, Num 3, pp 302-312, issn 1057-7157, 11 p.Article

The mechanical strength of polysilicon films: Part 2. Size effects associated with elliptical and circular perforationsCHASIOTIS, Ioannis; KNAUSS, Wolfgang G.Journal of the mechanics and physics of solids. 2003, Vol 51, Num 8, pp 1551-1572, issn 0022-5096, 22 p.Article

Electrothermal properties and modeling of polysilicon microthermal actuatorsGEISBERGER, Aaron A; SARKAR, Niladri; ELLIS, Matthew et al.Journal of microelectromechanical systems. 2003, Vol 12, Num 4, pp 513-523, issn 1057-7157, 11 p.Article

Fatigue damage evolution in silicon films for micromechanical applicationsSHROTRIYA, P; ALLAMEH, S; BROWN, S et al.Experimental mechanics. 2003, Vol 43, Num 3, pp 289-302, issn 0014-4851, 14 p.Article

Tensile testing at the micrometer scale: Opportunities in experimental mechanicsSHARPE, William N.Experimental mechanics. 2003, Vol 43, Num 3, pp 228-237, issn 0014-4851, 10 p.Article

Variations in Wettability Caused by NanoparticlesSAFARI, M.Petroleum science and technology. 2014, Vol 32, Num 9-12, pp 1505-1511, issn 1091-6466, 7 p.Article

The mechanical-thermal simulation of surface micromachined polysilicon hot platesDUMITRESCU, M; COBIANU, C; DASCALU, D et al.SPIE proceedings series. 1999, pp 367-374, isbn 0-8194-3154-0, 2VolConference Paper

Radiation heat savings in polysilicon production: Validation of results through a CVD laboratory prototypeRAMOS, A; DEL CANIZO, C; VALDEHITA, J et al.Journal of crystal growth. 2013, Vol 374, pp 5-10, issn 0022-0248, 6 p.Article

Effect of Galvanic Corrosion-Induced Roughness on Sidewall Adhesion in Polycrystalline Silicon Microelectromechanical SystemsMACUK, Alyssa L; TIMPE, Shannon J.Journal of microelectromechanical systems. 2013, Vol 22, Num 2, pp 259-261, issn 1057-7157, 3 p.Article

An integrated self-masking technique for providing low-loss metallized RF MEMS devices in a polysilicon only MEMS processWILSON, John M; BASHIRULLAH, Rizwan; NACKASHI, David P et al.SPIE proceedings series. 2005, pp 138-152, isbn 0-8194-5831-7, 1Vol, 15 p.Conference Paper

Reliability study of AlTi / TiW, polysilicon and ohmic contacts for piezoresistive pressure sensors applicationsANDREI, A; MALHAIRE, C; BRIDA, S et al.IEEE Sensors conference. 2004, isbn 0-7803-8692-2, 3Vol, vol 3, 1125-1128Conference Paper

Effect of polysilicon interface on stress in multi-stacked polysilicon filmsCHANG AUCK CHOI; CHANG SEUNG LEE; WON ICK JANG et al.SPIE proceedings series. 1999, pp 1134-1140, isbn 0-8194-3154-0, 2VolConference Paper

On the evolution of surface morphology of polysilicon MEMS structures during fatigueSHROTRIYA, P; ALLAMEH, S. M; SOBOYEJO, W. O et al.Mechanics of materials. 2004, Vol 36, Num 1-2, pp 35-44, issn 0167-6636, 10 p.Conference Paper

Surface topography evolution and fatigue fracture in polysilicon MEMS structuresALLAMEH, Seyed M; SHROTRIYA, Pranav; BUTTERWICK, Alex et al.Journal of microelectromechanical systems. 2003, Vol 12, Num 3, pp 313-324, issn 1057-7157, 12 p.Article

MEMS with integrated CMOS read-out circuit based on sub- micrometric cantilevers array for multiple sensingVILLARROYA, Maria; VERD, Jaume; TEVA, Jordi et al.SPIE proceedings series. 2005, pp 78-85, isbn 0-8194-5831-7, 1Vol, 8 p.Conference Paper

Study of polycrystaline porous silicon field emitterWANG, W; JIN, C; JIANG, J et al.SPIE proceedings series. 1998, pp 149-151, isbn 0-8194-3021-8Conference Paper

Performance impact of monolayer coating of polysilicon micromotorsDENG, K; COLLINS, R. J; MEHRAN MEHREGANY et al.Journal of the Electrochemical Society. 1995, Vol 142, Num 4, pp 1278-1285, issn 0013-4651Article

Poly-silicon thin film transistor technology and pplications in displays and other novel technology areas (Santa Clara CA, 21-22 January 2003)Voutsas, Apostolos T.SPIE proceedings series. 2003, isbn 0-8194-4804-4, VII, 196 p, isbn 0-8194-4804-4Conference Proceedings

Silicon solar cells with polysilicon emitters and back surface fieldsJIANG DU; BERNDT, Lyall P; GARRY TARR, N et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7750, issn 0277-786X, isbn 978-0-8194-8241-9, 77502W.1-77502W.8Conference Paper

Characterization of selective polysilicon deposition for MEMS resonator tuningJOACHIM, Daphne; LIWEI LIN.Journal of microelectromechanical systems. 2003, Vol 12, Num 2, pp 193-200, issn 1057-7157, 8 p.Article

Kinematical Characteristics of Two-Dimensional Vertical Ultrasonic Vibration-assisted Grinding TechnologyPENG, Y; WU, Y; LIANG, Z et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7655, issn 0277-786X, isbn 978-0-8194-8085-9, 765508.1-765508.7, 2Conference Paper

Precise release and insulation technology for vertical hall sensors and trench-defined MEMSSUNIER, R; MONAJEMI, P; AYAZI, F et al.IEEE Sensors conference. 2004, isbn 0-7803-8692-2, 3Vol, vol 3, 1442-1445Conference Paper

On-chip tensile test for epitaxial polysiliconDE MASI, B; VILLA, A; CORIGLIANO, A et al.IEEE International Conference on Micro Electro Mechanical Systems. 2004, pp 129-132, isbn 0-7803-8265-X, 1Vol, 4 p.Conference Paper

Thromboresistant polymers: a new approachWILSON, J. E; JONES, C. E.Biomaterials, artificial cells and artificial organs. 1989, Vol 17, Num 4, pp 437-445, issn 0890-5533, 9 p.Article

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