Generic gamma correction for accuracy enhancement in fringe-projection profilometryHOANG, Thang; BING PAN; NGUYEN, Dung et al.Optics letters. 2010, Vol 35, Num 12, pp 1992-1994, issn 0146-9592, 3 p.Article

Measurements of real surface area by the conical method and fractal approachWU, Y. L; DACRE, B; BABUS'HAQ, R. F et al.Wear. 1993, Vol 160, Num 2, pp 265-268, issn 0043-1648Article

Optical heterodyne profilometrySOMMARGREN, G. E.SPIE milestone series. 1991, Vol 28, pp 335-343, issn 1050-0529Article

Trace and profile measurements for dynamic objectsSU, Wei-Hung; KUO, Cho-Yo.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8120, issn 0277-786X, isbn 978-0-8194-8730-8, 812011.1-812011.6Conference Paper

Clustering-driven residue filter for profile measurement systemJUNJIANG; JUN CHENG; YING ZHOU et al.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2011, Vol 28, Num 2, pp 214-221, issn 1084-7529, 8 p.Article

Inner Crack Reconstruction and Mechanical Analysis for Rock Specimens Based Phase Measuring ProfilometryYIPING CAO; YUHANG HE.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7522, issn 0277-786X, isbn 978-0-8194-7912-9, 75225A.1-75225A.8, 3Conference Paper

On the emergence and spacing of zinc striations. I: Determination of preferred stration frequencySUTIJA, D. P; MULLER, R. H; TOBIAS, C. W et al.Journal of the Electrochemical Society. 1994, Vol 141, Num 6, pp 1477-1483, issn 0013-4651Article

Fourier-transform profilometry calibration based on an exhaustive geometric model of the systemZAPPA, E; BUSCA, G.Optics and lasers in engineering. 2009, Vol 47, Num 7-8, pp 754-767, issn 0143-8166, 14 p.Article

The statistics of the extrema of surfaces as a means of assessing their mechanical performanceTORRANCE, A. A.Wear. 1992, Vol 156, Num 2, pp 281-299, issn 0043-1648Article

3D shape reconstruction using multiple projections : a method to eliminate shadowing for projected fringe profilometrySU, Wei-Hung; KUO, Cho-Yo.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 669811.1-669811.11, issn 0277-786X, isbn 978-0-8194-6846-8, 1VolConference Paper

Optical profilometer: a practical approximate method of analysisDOBOSZ, M.Applied optics. 1983, Vol 22, Num 24, pp 3983-3987, issn 0003-6935Article

Phase-shifting laser diode Sagnac interferometer for surface profile measurementSUZUKI, Takamasa; SHIRAI, Masato; SASAKI, Osami et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6829, pp 68290A.1-68290A.8, issn 0277-786X, isbn 978-0-8194-7004-1 0-8194-7004-X, 1VolConference Paper

Anthropometry : the human dimensionDEASON, V. A.Optics and lasers in engineering. 1997, Vol 28, Num 2, pp 83-88, issn 0143-8166Article

Local slope analysis in the stylus-based assessment of surface integrityMALBURG, M. C; CHETWYND, D. G; RAJA, J et al.Tribology international. 1997, Vol 30, Num 7, pp 527-532, issn 0301-679XConference Paper

Automated phase-measuring profilometry using defocused projection of a Ronchi gratingXIAN-YU SU; WEN-SEN ZHOU; VON BALLY, G et al.Optics communications. 1992, Vol 94, Num 6, pp 561-573, issn 0030-4018Article

Endoscopic profilometryPODBIELSKA, H.Optical engineering (Bellingham. Print). 1991, Vol 30, Num 12, pp 1981-1985, issn 0091-3286Article

Projected fringe profilometry using the area-encoded algorithm for dynamic and complex objectsSU, Wei-Hung.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7056, pp 70561X.1-70561X.9, issn 0277-786X, isbn 978-0-8194-7276-2 0-8194-7276-X, 1VolConference Paper

A fringe center detection technique based on a sub-pixel resolution, and its applications using sinusoidal gratingsMING CHANG; LIN, P. P; WEN CHIH TAI et al.Optics and lasers in engineering. 1994, Vol 20, Num 3, pp 163-176, issn 0143-8166Article

Effects of finite stylus width in surface contact profilometryO'DONNELL, K. A.Applied optics. 1993, Vol 32, Num 25, pp 4922-4928, issn 0003-6935Article

Interferometric profiler for rough surfacesCABER, P. J.Applied optics. 1993, Vol 32, Num 19, pp 3438-3441, issn 0003-6935Conference Paper

Recent developments in profiling optical surfacesBENNETT, J. M; ELINGS, V; KJOLLER, K et al.Applied optics. 1993, Vol 32, Num 19, pp 3442-3447, issn 0003-6935Conference Paper

Ultrasonic measurements of surface roughnessBLESSING, G. V; SLOTWINSKI, J. A; EITZEN, D. G et al.Applied optics. 1993, Vol 32, Num 19, pp 3433-3437, issn 0003-6935Conference Paper

Modified Fourier transform method for 3D profile measurement without phase unwrappingYAJUN WANG; SHENG YANG; XUYAN GOU et al.Optics letters. 2010, Vol 35, Num 5, pp 790-792, issn 0146-9592, 3 p.Article

Sensor of total hip arthroplasty wear designed on pronciple of scanning profilometryRÖSSLER, Tomas; MANDAT, Dusan; GALLO, Jiri et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7141, pp 71411E.1-71411E.8, issn 0277-786X, isbn 9780819473837Conference Paper

Design of structured light by using three PM fibers for Moiré interferometric profilometryLIBO YUAN.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 659549.1-659549.7, issn 0277-786X, isbn 978-0-8194-6727-0, 2VolConference Paper