An improved failure-free time estimation methodDRAPELLA, A.Quality and reliability engineering international. 1999, Vol 15, Num 3, pp 235-238, issn 0748-8017Article

Optimal new product design using quality function deployment with empirical value functionsDAWSON, D; ASKIN, R. G.Quality and reliability engineering international. 1999, Vol 15, Num 1, pp 17-32, issn 0748-8017Article

Efficient basic event ordering schemes for fault tree analysisBARTLETT, L. M; ANDREWS, J. D.Quality and reliability engineering international. 1999, Vol 15, Num 2, pp 95-101, issn 0748-8017Conference Paper

Reliability analysis of aeroplane brakesAL-GARNI, A. Z; SAHIN, A. Z; AL-GHAMDI, A. S et al.Quality and reliability engineering international. 1999, Vol 15, Num 2, pp 143-150, issn 0748-8017Conference Paper

A smooth nonparametric approach to process capabilityPOLANSKY, A. M.Quality and reliability engineering international. 1998, Vol 14, Num 1, pp 43-48, issn 0748-8017Article

Reliability analysis of MTRC's proposed power SCADA system : Power System Reliability PapersHAMPTON, I. M; BRUCE, A. G; CHANG, C. S et al.Quality and reliability engineering international. 1998, Vol 14, Num 3, pp 123-127, issn 0748-8017Article

Simulated variance optimization for robust designPARKINSON, D. B.Quality and reliability engineering international. 1998, Vol 14, Num 1, pp 15-21, issn 0748-8017Article

An investigation of 'cannot duplicate' failuresWILLIAMS, R; BANNER, J; KNOWLES, I et al.Quality and reliability engineering international. 1998, Vol 14, Num 5, pp 331-337, issn 0748-8017Article

Sensitivity analysis of availability estimates to input data characterization using design of experimentsDURKEE, D. P; POHL, E. A; MYKYTKA, E. F et al.Quality and reliability engineering international. 1998, Vol 14, Num 5, pp 311-317, issn 0748-8017Article

Using linear regression analysis and the gibbs sampler to estimate the probability of a part being within specificationSTEFANO, B.Quality and reliability engineering international. 1998, Vol 14, Num 4, pp 237-246, issn 0748-8017Article

Physics-of-failure guidelines for accelerated qualification of electronic systemsUPADHYAYULA, K; DASGUPTA, A.Quality and reliability engineering international. 1998, Vol 14, Num 6, pp 433-447, issn 0748-8017Article

Progress towards the development of a model for predicting human reliabilitySTRUTT, J. E; LOA, W.-W; ALLSOPP, K et al.Quality and reliability engineering international. 1998, Vol 14, Num 1, pp 3-14, issn 0748-8017Conference Paper

1/f noise of electrolytic capacitors as a reliability indicator : Quality and reliability of passive componentsKONCZAKOWSKA, A.Quality and reliability engineering international. 1998, Vol 14, Num 2, pp 83-85, issn 0748-8017Conference Paper

Multivariate and univariate process control : Geometry and shift directionsRUNGER, G. C; MONTGOMERY, D. C.Quality and reliability engineering international. 1997, Vol 13, Num 3, pp 153-158, issn 0748-8017Article

Optimizing multi-response problems in the Taguchi method by fuzzy multiple attribute decision makingTONG, L.-I; SU, C.-T.Quality and reliability engineering international. 1997, Vol 13, Num 1, pp 25-34, issn 0748-8017Article

Short-run statistical process control : Multicriteria part family formationLIN, S.-Y; LAI, Y.-J; CHANG, S. I et al.Quality and reliability engineering international. 1997, Vol 13, Num 1, pp 9-24, issn 0748-8017Article

A study of the exponential smoothing technique in software reliability growth predictionXIE, M; HONG, G. Y; WOHLIN, C et al.Quality and reliability engineering international. 1997, Vol 13, Num 6, pp 347-353, issn 0748-8017Article

Confidence intervals for variance components from gauge capability studiesBORROR, C. M; MONTGOMERY, D. C; RUNGER, G. C et al.Quality and reliability engineering international. 1997, Vol 13, Num 6, pp 361-369, issn 0748-8017Article

Some strategies for experimentation under operational constraintsGOH, T. N.Quality and reliability engineering international. 1997, Vol 13, Num 5, pp 279-283, issn 0748-8017Conference Paper

Fuzzy sets approach to quality improvementGLUSHKOVSKY, E. A; FLORESCU, R. A.Quality and reliability engineering international. 1996, Vol 12, Num 1, pp 27-37, issn 0748-8017Article

Process monitoring in integrated circuit fabrication using both yield and spatial statisticsCOLLICA, R. S; RAMIREZ, J. G; TAAM, W et al.Quality and reliability engineering international. 1996, Vol 12, Num 3, pp 195-202, issn 0748-8017Article

Statistical process monitoring with principal componentsMASTRANGELO, C. M; RUNGER, G. C; MONTGOMERY, D. C et al.Quality and reliability engineering international. 1996, Vol 12, Num 3, pp 203-210, issn 0748-8017Article

Quality improvement for RC06 chip resistorJENG, Y.-C; GUO, S.-M.Quality and reliability engineering international. 1996, Vol 12, Num 6, pp 439-445, issn 0748-8017Article

Application of generalized linear models to the design improvement of an engineering artefactSU, H; NELDER, J. A; WOLBERT, P et al.Quality and reliability engineering international. 1996, Vol 12, Num 2, pp 101-112, issn 0748-8017Article

Parameter design with dynamic characteristics : A regression perspectiveWASSERMAN, G. S.Quality and reliability engineering international. 1996, Vol 12, Num 2, pp 113-117, issn 0748-8017Article