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Results 1 to 25 of 1651

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Quantitative 3D-Gefügeanalyse : Stereologie oder Tomographie = Quantitative 3D Microstructural Analysis : Stereology or TomographyVELICHKO, Alexandra; MÜCKLICH, Frank.Praktische Metallographie. 2008, Vol 45, Num 9, pp 423-439, issn 0032-678X, 17 p.Article

Quantitative analysis for kinetics of reactive diffusion in the Fe-Cr systemKAJIHARA, M; YAMASHINA, T.Journal of materials science. 2007, Vol 42, Num 7, pp 2432-2442, issn 0022-2461, 11 p.Article

Qualitative and quantitative analysis of complex temperature-programmed desorption data by multivariate curve resolutionRODRIGUEZ-REYES, Juan Carlos F; TEPLYAKOV, Andrew V; BROWN, Steven D et al.Surface science. 2010, Vol 604, Num 21-22, pp 2043-2054, issn 0039-6028, 12 p.Article

Objektbasierte quantitative Analyse von komplexen Mikrostrukturen in Stählen = Object-based Quantitative Analysis of Complex Microstructures in SteelsFISCHER, Martin; GERDEMANN, Florian; BLECK, Wolfgang et al.Praktische Metallographie. 2009, Vol 46, Num 5, pp 225-235, issn 0032-678X, 11 p.Article

The International Millennium Conference on quantitative surface analysis : QSA-11: 3-7 July 2000WATTS, John F.Surface and interface analysis. 2001, Vol 31, Num 4, pp 247-248, issn 0142-2421Article

Surface excitation probabilities in surface electron spectroscopiesSALMA, K; DING, Z. J; LI, H. M et al.Surface science. 2006, Vol 600, Num 7, pp 1526-1539, issn 0039-6028, 14 p.Article

A comprehensive model for the gettering of lifetime-killing impurities in siliconDEL CANIZO, C; LUQUE, A.Journal of the Electrochemical Society. 2000, Vol 147, Num 7, pp 2685-2692, issn 0013-4651Article

Quantitative AES. VIII : Analysis of Auger electron intensities from elemental data in a digital Auger databaseSEAH, M. P; GILMORE, I. S.Surface and interface analysis. 1998, Vol 26, Num 12, pp 908-929, issn 0142-2421Article

Multi-scale quantitative analysis of carbon texture, nanotexture and structure: I. Electron diffraction-based anisotropy measurementsRAYNAL, P. I; MONTHIOUX, M; DUGNE, O et al.Carbon (New York, NY). 2014, Vol 66, pp 493-503, issn 0008-6223, 11 p.Article

Quantitative analysis of complex amino acids and RGD peptides by X-ray photoelectron spectroscopy (XPS)STEVENS, Joanna S; DE LUCA, Alba C; PELENDRITIS, Michalis et al.Surface and interface analysis. 2013, Vol 45, Num 8, pp 1238-1246, issn 0142-2421, 9 p.Article

A disposable sticky electrode for the detection of commercial silver NPs in seawaterCHENG, W; STUART, E. J. E; TSCHULIK, K et al.Nanotechnology (Bristol. Print). 2013, Vol 24, Num 50, issn 0957-4484, 505501.1-505501.6Article

Traitement informatique des spectres = Data processingREPOUX, M.Le Vide (1995). 1996, Vol 52, Num 279, issn 1266-0167, 9, 44-52 [10 p.]Conference Paper

Quantitative mineralogical analysis using the Rietveld full-pattern fitting methodBISH, D. L; POST, J. E.The American mineralogist. 1993, Vol 78, Num 9-10, pp 932-940, issn 0003-004XArticle

Quantitative analysis of thermally induced desorption during halogen-etching of a silicon (111) surfaceSHUDO, K; KIRIMURA, T; TANAKA, Y et al.Surface science. 2006, Vol 600, Num 16, pp 3147-3153, issn 0039-6028, 7 p.Article

Secondary ion mass spectrometryZALM, P. C.Vacuum. 1994, Vol 45, Num 6-7, pp 753-772, issn 0042-207XArticle

New Quality Evaluation Approaches for Lithium Ion Batteries Using the Interference Layer Metallography in Combination with Quantitative Structural Analysis = Neue Ansätze für die Qualitätsbewertung von Lithium-lonen-Akkumulatoren durch den Einsatz von Interferenzschicht-Materialographie in Kombination mit quantitativer GefügeanalyseWEISENBERGER, C; GUTH, G; BERNTHALER, T et al.Praktische Metallographie. 2014, Vol 51, Num 1, pp 5-31, issn 0032-678X, 27 p.Article

Quantitative LIBS analysis of samples from a Le Sueur bronzeBUGIO, Lucia; CRISTOFORETTI, G; LEGNAIOLI, S et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 616206.1-616206.7, issn 0277-786X, isbn 0-8194-6214-4, 1VolConference Paper

Quantitative analysis of supported membrane composition using the NanoSIMSKRAFT, Mary L; FISHEL, Simon Foster; MARXER, Carine Galli et al.Applied surface science. 2006, Vol 252, Num 19, pp 6950-6956, issn 0169-4332, 7 p.Conference Paper

Local quantitative SIMS analysis of small amount of oxygen in titaniumTAKESHITA, H. T; TOMII, Y; SUZUKI, R. O et al.Nippon Kinzoku Gakkaishi (1952). 1995, Vol 59, Num 9, pp 973-977, issn 0021-4876Article

Measuring Forces between Two Single Actin Filaments during Bundle FormationSTREICHFUSS, Martin; ERBS, Friedrich; UHRIG, Kai et al.Nano letters (Print). 2011, Vol 11, Num 9, pp 3676-3680, issn 1530-6984, 5 p.Article

Confocal diffraction phase microscopy of live cellsLUE, Niyom; CHOI, Wonshik; BADIZADEGAN, Kamran et al.Optics letters. 2008, Vol 33, Num 18, pp 2074-2076, issn 0146-9592, 3 p.Article

XXI - Images MEB: du traitement numérique à l'analyse quantitativeCHAIX, Jean-Marc; MISSIAEN, Jean-Michel.École d'été sur la microscopie électronique à balayage et microanalyses. 2008, pp 701-732, isbn 978-2-7598-0082-7, 1Vol, 32 p.Conference Paper

Quantitative analysis of styrene-pentafluorostyrene random copolymers by ToF-SIMS and XPSWENG, Lu-Tao; NG, Kai-Mo; ZHUO LIN CHEUNG et al.Surface and interface analysis. 2006, Vol 38, Num 1, pp 32-43, issn 0142-2421, 12 p.Article

Quantitative analysis of surface contaminants on silicon wafers by means of TOF-SIMSROSTAM-KHANI, P; PHILIPSEN, J; JANSEN, E et al.Applied surface science. 2006, Vol 252, Num 19, pp 7255-7257, issn 0169-4332, 3 p.Conference Paper

Quantification of cell adhesion force with AFM: distribution of vitronectin receptors on a living MC3T3-E1 cellKIM, H; ARAKAWA, Hideo; OSADA, Toshiya et al.Ultramicroscopy. 2003, Vol 97, Num 1-4, pp 359-363, issn 0304-3991, 5 p.Conference Paper

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