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Etude de la rotation aux grands angles des rayons X mousVINOGRADOV, A. V; ELINSON, V. M; KOZHEVNIKOV, I. V et al.Optika i spektroskopiâ. 1989, Vol 67, Num 1, pp 206-209, issn 0030-4034Article

X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayersLUO, G. M; MAI, Z. H; HASE, T. P. A et al.Journal of magnetism and magnetic materials. 2001, Vol 226-30, pp 1728-1729, issn 0304-8853, 2Conference Paper

Surface-induced X-ray reflection visualization of membrane orientation and fusion into multibilayersCEVC, G; FENZL, W; SIGL, L et al.Science (Washington, D.C.). 1990, Vol 249, Num 4973, pp 1161-1163, issn 0036-8075, 3 p.Article

Phase determination of forbidden X-ray reflections in V3Si by virtual Bragg scattering = Détermination de phase des réflexions RX interdites dans V3Si par diffusion de Bragg virtuelleSCHMIDT, M. C; COLELLA, R.Physical review letters. 1985, Vol 55, Num 7, pp 715-717, issn 0031-9007Article

EINFLUSS DER OBERFLAECHENBEARBEITUNG AUF DIE ROENTGENSTRAHL-TOTALREFLEXIONSPROFILE. = INFLUENCE DU TRAITEMENT DE SURFACE SUR LE PROFIL DE REFLEXION RX TOTALBRUMMER O; HOCHE HR.1975; KRISTALL U. TECH.; DTSCH.; DA. 1975; VOL. 10; NO 10; PP. 1063-1066; ABS. ANGL.; BIBL. 8 REF.Article

Particularités diffractionnelles du rayonnement X de particules ultra-relativistes dans des cristaux idéauxSHIPOV, N. V.Izvestiâ vysših učebnyh zavedenij. Radiofizika. 1985, Vol 28, Num 8, pp 1043-1052, issn 0021-3462Article

X-ray guided modes produced by Bragg reflections of multilayers : an analytical treatmentPRUDNIKOV, I. R.Journal of applied crystallography. 2005, Vol 38, pp 595-602, issn 0021-8898, 8 p., 4Article

Liquid-like interfacial correlation in LB filmsSANYAL, M. K; BASU, J. K; DATTA, A et al.Physica. B, Condensed matter. 1998, Vol 248, pp 217-222, issn 0921-4526Conference Paper

The influence of surface roughness in X-ray resonant magnetic reflectivity experimentsVERNA, A; DAVIDSON, B. A; MIRONE, A et al.The European physical journal. Special topics. 2012, Vol 208, pp 165-175, issn 1951-6355, 11 p.Article

Width of the hexadecane-water interface : A discrepancy resolvedZARBAKHSH, Ali; BOWERS, James; WEBSTER, John R. P et al.Langmuir. 2005, Vol 21, Num 25, pp 11596-11598, issn 0743-7463, 3 p.Article

Tailoring the time response of a Bragg reflection to short X-ray pulsesGRAEFF, W.Journal of synchrotron radiation. 2004, Vol 11, pp 261-265, issn 0909-0495, 5 p., 3Article

Synchrotron radiation studies of thin films and implanted layers with the materials research endstation of ROBLSCHELL, N; MATZ, W; EICHHORN, F et al.Journal of alloys and compounds. 2001, Vol 328, Num 1-2, pp 105-111, issn 0925-8388Conference Paper

Thickening of a smectic membrane in an evanescent X-ray beamDE JEU, W. H; FERA, A; OSTROVSKII, B. I et al.The European physical journal. E, Soft matter (Print). 2004, Vol 15, Num 1, pp 61-64, issn 1292-8941, 4 p.Article

Characterization of magnetic multilayers by grazing incidence X-ray reflectivityTANNER, B. K; HUDSON, J. M.IEEE transactions on magnetics. 1992, Vol 28, Num 5, pp 2736-2741, issn 0018-9464, 2Conference Paper

X-ray grazing incidence diffraction from alkylsiloxane monolayers on silicon wafersTIDSWELL, I. M; RABEDEAU, T. A; PERSHAN, P. S et al.The Journal of chemical physics. 1991, Vol 95, Num 4, pp 2854-2861, issn 0021-9606Article

DOUBLE SCATTERING OF X-RAYS IN REFLECTION GEOMETRY.SUORTTI P.1975; PHYS. FENNICA; FINL.; DA. 1975; VOL. 10; NO 4; PP. 161-165; BIBL. 11 REF.Article

ANWENDUNG DER UMWEGANREGUNG FUER DIE BESTIMMUNG DER GUETE VON KRISTALLOBERFLAECHEN. = UTILISATION DE L'EXCITATION INDIRECTE POUR LA DETERMINATION DE LA BONNE QUALITE DES SURFACES CRISTALLINESMELLE W.1974; KRISTALL U. TECH.; DTSCH.; DA. 1974; VOL. 9; NO 5; PP. 511-515; ABS. ANGL.; BIBL. 6 REF.Article

METHODES NOUVELLES D'OBSERVATION ET D'ANALYSE EN METALLURGIE. ETUDE DES SURFACES PAR REFLEXION DE RAYONS X.CROCE P.1975; DGRST-7371038; FR.; DA. 1975; PP. (5P.); BIBL. 4 REF.; (RAPP. FINAL, ACTION CONCERTEE: METALL.)Report

X-RAY DIFFRACTION FROM GRAPHITE IN THE ENERGY RANGE 2 TO 8 KEV.KESTENBAUM HL.1973; APPL. SPECTROSC.; U.S.A.; DA. 1973; VOL. 27; NO 6; PP. 454-456; BIBL. 16 REF.Article

X-ray natural birefringence in reflection from graphiteMERTINS, H.-Ch; OPPENEER, P. M; VALENCIA, S et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 23, pp 235106.1-235106.8, issn 1098-0121Article

Specular and non-specular X-ray reflection from inorganic and organic multilayersDE BOER, D. K. G; LEENAERS, A. J. G; VAN DER WIELEN, M. W. J et al.Physica. B, Condensed matter. 1998, Vol 248, pp 274-279, issn 0921-4526Conference Paper

X-ray reflectivity study on gold films during sputter depositionCHIARELLO, R. P; YOU, H; ZHANG, Q. J et al.Surface science. 1997, Vol 380, Num 2-3, pp 245-257, issn 0039-6028Article

Final stages of spreading of polymer droplets on smooth solid surfacesDAILLANT, J; BENATTAR, J. J; BOSIO, L et al.Europhysics letters (Print). 1988, Vol 6, Num 5, pp 431-436, issn 0295-5075Article

A Crystallographic Information File for specular reflectivity dataVAN DER LEE, A.Journal of applied crystallography. 2006, Vol 39, pp 468-468, issn 0021-8898, 1 p., 3Article

Characterization of biological thin films at the solid-liquid interface by X-ray reflectivityMILLER, C. E; MAJEWSKI, J; GOG, T et al.Physical review letters. 2005, Vol 94, Num 23, pp 238104.1-238104.4, issn 0031-9007Article

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