kw.\*:("Réflexion interne totale")
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Frustrated-total-internal-reflection fiber-optic pressure sensorGRATTAN, K. T. V; PALMER, A. W; SAINI, D. P. S et al.Journal of lightwave technology. 1985, Vol 3, Num 5, pp 1130-1134, issn 0733-8724Article
Slow-light total-internal-reflection switch with bending angle of 30 degFUCHIDA, Ayumi; MATSUTANI, Akihiro; KOYAMA, Fumio et al.Optics letters. 2011, Vol 36, Num 14, pp 2644-2646, issn 0146-9592, 3 p.Article
Temporal delay of a pulse undergoing frustrated total internal reflectionAJOY GHATAK; SWAGATA BANERJEE.Applied optics. 1989, Vol 28, Num 11, pp 1960-1961, issn 0003-6935Article
Principal angles and principal azimuths of frustrated total internal reflection and optical tunneling by an embedded low-index thin filmAZZAM, R. M. A; SUDRADJAT, F. F.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2011, Vol 28, Num 6, pp 1256-1261, issn 1084-7529, 6 p.Article
Fused-silica monolithic total-internal-reflection resonatorSCHILLER, S; YU, I. I; FEJER, M. M et al.Optics letters. 1992, Vol 17, Num 5, pp 378-380, issn 0146-9592Article
Brewster angle prisms: a reviewCERVANTES, M.Optics and laser technology. 1988, Vol 20, Num 6, pp 297-300, issn 0030-3992Article
Coarse Integral Imaging without Pseudo ImageKUROKAWA, Tomoya; KAKEYA, Hideaki.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7863, issn 0277-786X, isbn 978-0-8194-8400-0, 78631M.1-78631M.9Conference Paper
Distortion of ultrashort pulses on total internal reflectionCHEUNG, K. P; AUSTON, D. H.Optics letters. 1985, Vol 10, Num 5, pp 218-219, issn 0146-9592Article
Dispersion analysis of perpendicular modes in anisotropic crystals and layersMAYERHÖFER, Thomas G; WEBER, Sonja; POPP, Jürgen et al.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2011, Vol 28, Num 12, pp 2428-2435, issn 1084-7529, 8 p.Article
Total-internal-reflection fluorescence microscopy with W-shaped axicon mirrorsMING LEI; ZUMBUSCH, Andreas.Optics letters. 2010, Vol 35, Num 23, pp 4057-4059, issn 0146-9592, 3 p.Article
EXPERIENCES CRITIQUES POSSIBLES POUR LES THEORIES DE LA REFLEXION TOTALE INTERNE PAR DES MILIEUX AMPLIFICATEURSVINOKUROV GN; ZHULIN VI.1981; OPT. SPEKTROSK.; ISSN 0030-4034; SUN; DA. 1981; VOL. 51; NO 4; PP. 734-738; BIBL. 17 REF.Article
THE GOOS-HAENCHEN SHIFT ON A LAYER.STRNAD J; KODRE A.1974; INTERNATION. J. THEOR. PHYS.; G.B.; DA. 1974; VOL. 9; NO 6; PP. 393-403; BIBL. 25 REF.Article
INTERNAL REFLECTION FROM AN AMPLIFYING LAYER.CALLARY PR; CARNIGLIA CK.1976; J. OPT. SOC. AMER.; U.S.A.; DA. 1976; VOL. 66; NO 8; PP. 775-779; BIBL. 6 REF.Article
UTILIZATION OF TOTAL INTERNAL REFLEXION EFFECT FOR MONITORING GAS PARAMETERSKALINOVSKIJ VL; RUKMAN GI.1976; IZMERITEL. TEKH.; S.S.S.R.; DA. 1976; NO 5; PP. 73-74; BIBL. 5 REF.Article
FILTRES A REFLEXION INTERNE TOTALE.CLELO P; DELISLE C.1975; APPL. OPT.; U.S.A.; DA. 1975; VOL. 14; NO 3; PP. 562-563; BIBL. 5 REF.Article
Cryogenic solid Schmidt camera as a base for future wide-field IR systemsYUDIN, Alexey N.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8185, issn 0277-786X, isbn 978-0-8194-8813-8, 81850J.1-81850J.8Conference Paper
Photonic Quasi-Crystal Light Emitting Diodes, - comparisons of device performance with pattern pitchTILLIN, Martin; CHARLTON, Martin D. B; MACINTYRE, Douglas et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7713, issn 0277-786X, isbn 0-8194-8186-6 978-0-8194-8186-3, 1Vol, 77130B.1-77130B.11Conference Paper
Near infrared lasing in dye-doped polymeric microringsDJIANGO, Martin; JORDAN, Grace; RÜTHER, Manuel et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 59580Q.1-59580Q.6, issn 0277-786X, isbn 0-8194-5965-8, 1VolConference Paper
Registration of low molecular weight environmental toxins with total internal reflection ellipsometryNABOK, A. V; TSARGORODSKAYA, A; HOLLOWAY, A et al.IEEE Sensors conference. 2004, isbn 0-7803-8692-2, 3Vol, vol 3, 1195-1198Conference Paper
120-nm lithography using off-axis TIR holography and 364 nm exposure wavelengthBARGE, M; BRUYNOOGHE, S; CLUBE, F et al.Microelectronic engineering. 2001, Vol 57-58, pp 59-63, issn 0167-9317Conference Paper
Goos-Hänchen beam shift at total internal reflection with application to spatially dispersive mediaPURI, A; BIRMAN, J. L.Journal of the Optical Society of America. A, Optics and image science. 1986, Vol 3, Num 4, pp 543-549, issn 0740-3232Article
Goos-Hänchen effect around and off the critical angleLAI, H. M; CHENG, F. C; TANG, W. K et al.Journal of the Optical Society of America. A, Optics and image science. 1986, Vol 3, Num 4, pp 550-557, issn 0740-3232Article
Energy motion on total internal reflection of an electromagnetic wave packetFEDOSEYEV, V. G.Journal of the Optical Society of America. A, Optics and image science. 1986, Vol 3, Num 6, pp 826-829, issn 0740-3232Article
Total internal reflection lensCHANG, M. B.Applied optics. 1985, Vol 24, Num 9, pp 1256-1259, issn 0003-6935Article
Direct experimental observation of giant Goos-Hänchen shifts from bandgap-enhanced total internal reflectionYUHANG WAN; ZHENG ZHENG; WEIJING KONG et al.Optics letters. 2011, Vol 36, Num 18, pp 3539-3541, issn 0146-9592, 3 p.Article