REMOTE MEASUREMENT OF RAINFALL RATE BY RADAR: A CONCEPTMOTT DL.1982; J. APPL. METEOROL.; ISSN 0021-8952; USA; DA. 1982; VOL. 21; NO 8; PP. 1194-1195; BIBL. 5 REF.Article

RETRODIFFUSION D'IONS DE GAZ RARES DE FAIBLE ENERGIE PAR LA SURFACE D'UN SOLIDE: MECANISMES FONDAMENTAUX ET APPLICATION A LA DETERMINATION DES STRUCTURES CRISTALLINES DE SURFACETHEETEN JB; BRONGERSMA HH.1976; REV. PHYS. APPL.; FR.; DA. 1976; VOL. 11; NO 1; PP. 57-63; ABS. ANGL.; BIBL. 19 REF.; (METHODES ACTUELLES ANAL. SOLIDES. COLLOQ. EXPO. COMMUN.; DIJON; 1975)Conference Paper

A GAMMA BACKSCATTER METHOD OF MEASURING SOIL DENSITYDADDI L.1973; INTERNATION. J. APPL. RAD. ISOTOPES; G.B.; DA. 1973; VOL. 24; NO 5; PP. 295; BIBL. 8 REF.Serial Issue

ANALYSIS OF ARSENIC RANGE DISTRIBUTIONS IN SILICON.SIGMON TW; CHU WK; MUELLER H et al.1974; APPL. PHYS.; GERM.; DA. 1974; VOL. 5; NO 4; PP. 347-350; BIBL. 20 REF.Article

Power ratio estimation in incoherent backscatter lidar: heterodyne receiver with square law detectionRYE, B. J.Journal of climate and applied meteorology. 1983, Vol 22, Num 11, pp 1899-1913, issn 0733-3021Article

Enhanced backscattering in opticsBARABANENKOV, YU. N; KRAVTSOV, YU. A; OZRIN, V. D et al.Progress in optics. 1991, Vol 29, pp 65-197, issn 0079-6638Article

Rutherford backscattering spectrometry as an experimental method to study the oxidation mechanism of NiAl₃ alloy = Spectrométrie de rétrodiffusion de Rutherford comme méthode expérimentale pour l'étude du mécanisme d'oxydation de NiAl₃YOUNG, E. W. A; DE WIT, J. H. W.Surface and interface analysis. 1983, Vol 5, Num 5, pp 177-180, issn 0142-2421Article

OPTIMIZING COPPER SPHERES FOR PRECISION CALIBRATION OF HYDROACOUSTIC EQUIPMENTFOOTE KG.1982; J. ACOUST. SOC. AM.; ISSN 0001-4966; USA; DA. 1982; VOL. 71; NO 3; PP. 742-747; BIBL. 39 REF.Article

DETERMINING OPTIMUM CONDITIONS FOR MEASURING BY GAMMA-RAY BACKSCATTERINGSEDA J; MUSILEK L.1972; ISOTOPENPRAXIS; DTSCH.; DA. 1972; VOL. 8; NO 11-12; PP. 440-444; ABS. ALLEM. RUSSE; BIBL. 5 REF.Serial Issue

DISTRIBUTIONS OF VOLUME SCATTERING OBSERVED WITH AN 87.5-KHZ SONARGREENBLATT P.1982; J. ACOUST. SOC. AM.; ISSN 0001-4966; USA; DA. 1982; VOL. 71; NO 4; PP. 879-885; BIBL. 22 REF.Article

LOW TEMPERATURE ANNEALING BEHAVIOR OF SE-IMPLANTED GAAS STUDIED BY HIGH RESOLUTION RUTHERFORD BACKSCATTERING CHANNELINGBHATTACXHARYA RS; PRONKO PP; LING SC et al.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 3; PART. 1; PP. 1804-1806; BIBL. 4 REF.Article

SUBSTITUTIONAL SOLID SOLUBILITY LIMITS DURING SOLID PHASE EPITAXY OF ION IMPLANTED (100) SILICONWILLIAMS JS; ELLIMAN RG.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 40; NO 3; PP. 266-268; BIBL. 16 REF.Article

Numerical, analytical, and experimental studies of scattering from very rough surfaces and backscattering enhancementISHIMARU, A; CHEN, J. S; PHU, P et al.Waves in random media. 1991, Vol 1, Num 3, pp S91-S107, issn 0959-7174Article

A new formula for backward optical scatteringSHARMA, S. K; SHARMA, S; SOMERFORD, D. J et al.Optica acta. 1984, Vol 31, Num 9, pp 981-982, issn 0030-3909Article

Probing the dynamics of confined systems with the NIST backscattering spectrometerDIMEO, R. M; NEUMANN, D. A.Journal de physique. IV. 2000, Vol 10, Num 7, pp Pr7.337-Pr7.340, issn 1155-4339Conference Paper

Monte Carlo calculations of radar backscatter from a multi-layer random mediumCHUAH, H. T; TAN, H. S.Journal of electromagnetic waves and applications. 1989, Vol 3, Num 4, pp 337-357, issn 0920-5071, 21 p.Article

Defining optimal axial and lateral resolution for estimating scatterer properties from volumes using ultrasound backscatterOELZE, Michael L; O'BRIEN, William D.The Journal of the Acoustical Society of America. 2004, Vol 115, Num 6, pp 3226-3234, issn 0001-4966, 9 p.Article

MEASUREMENTS OF THE BACKSCATTER MATRIX OF DIELECTRIC BODIESALLAN LE; MCCORMICK GC.1980; IEEE. TRANS. ANTENNAS PROPAG.; USA; DA. 1980; VOL. 28; NO 2; PP. 166-169; BIBL. 2 REF.Article

THICKNESS DISTRIBUTION DETERMINATION OF THIN SPUTTERED TOP LAYERS ON BULK METAL COLLECTORS BY ELECTRON BACKSCATTERING.ERLENWEIN P; HOHN FJ; NIEDRIG H et al.1977; OPTIK; DTSCH.; DA. 1977; VOL. 49; NO 3; PP. 357-363; ABS. ALLEM.; BIBL. 18 REF.Article

FORMATION OF SILICON OXIDE OVER GOLD LAYERS ON SILICON SUBSTRATESHIRAKI A; LUGUJJO E; MAYER JW et al.1972; J. APPL. PHYS.; U.S.A.; DA. 1972; VOL. 43; NO 9; PP. 3643-3649; BIBL. 13 REF.Serial Issue

ANALYTISCHE CHARAKTERISIERUNG VON STOFFEN DURCH STREUUNG VON GELADENEN TEILCHEN = CARACTERISATION ANALYTIQUE DES SUBSTANCES PAR DIFFUSION DE PARTICULES CHARGEESKRIVAN V.1972; Z. (FRESENIUS') ANAL. CHEM.; DTSCH.; DA. 1972; VOL. 262; NO 1; PP. 1-28; ABS. ANGL.; BIBL. 3 P. 1/2Serial Issue

ION BEAM ANNEALED AS⁺ IMPLANTED SILICONHEMMENT PLF; MAYDELL ONDRUSZ E; SCOVELL PD et al.1982; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1982; VOL. 18; NO 2; PP. 57-59; BIBL. 9 REF.Article

SYNTHETIC IMAGING FROM COHERENT BACKSCATTERINGYU JS; WILLIAMS JW.1981; IEEE TRANS. ANTENNAS PROPAG.; ISSN 0018-926X; USA; DA. 1981; VOL. 29; NO 2; PP. 380-385; BIBL. 26 REF.Article

A HIGH RESOLUTION SPECTROMETER USED IN MEV HEAVY ION BACKSCATTERING ANALYSISCHEVARIER A; CHEVARIER N; CHIODELLI S et al.1981; NUCL. INSTRUM. METHODS PHYS. RES.; ISSN 502936; NLD; DA. 1981; VOL. 189; NO 2-3; PP. 525-531; BIBL. 17 REF.Article

DIRECT OBSERVATION OF BACKSCATTER ELECTRON DISTRIBUTIONS ON SURFACESHEIDENREICH RD; THOMPSON LF.1973; APPL. PHYS. LETTERS; U.S.A.; DA. 1973; VOL. 22; NO 6; PP. 279-281; BIBL. 4 REF.Serial Issue