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THE PROBLEM OF WHITE RADIATION IN THE MEASUREMENT OF INTENSITIES WITH A SOLID-STATE DETECTOR.HOWARD HJ; JONES RDG.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 3; PP. 235; BIBL. 2 REF.Article

PROJECTIVE PROPERTIES OF LAUE TOPOGRAPHSMILTAT J; DUPLEY M.1980; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1980; VOL. 13; NO 6; PP. 555-562; BIBL. 4 REF.Article

THE INFLUENCE OF WHITE RADIATION ON DIFFRACTION DATA IN X-RAY ANALYSIS. A COMPARATIVE STUDY OF MONOCHROMATOR VERSUS FILTER DATA.PETIT G; LENSTRA ATH.1977; BULL. SOC. CHIM. BELGES; BELG.; DA. 1977; VOL. 86; NO 10; PP. 749-755; BIBL. 3 REF.Article

DETERMINATION OF THE ATOMIC SCATTERING FACTORS OF GERMANIUM BY MEANS OF THE PENDELLOESUNG-BEAT MEASUREMENT USING WHITE RADIATIONSTAKAMA T; SATO S.1981; JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1981; VOL. 20; NO 7; PP. 1183-1189; BIBL. 25 REF.Article

SPIN RELAXATION WITHIN THE 62P1/2 AND 62S1/2 STATES OF CESIUM MEASURED BY WHITE-LIGHT OPTICAL PUMPING.FRANZ FA; SOORIAMOORTHI CE.1974; PHYS. REV., A; U.S.A.; DA. 1974; VOL. 10; NO 1; PP. 126-140; BIBL. 54 REF.Article

"WHITE BEAM" SYNCHROTRON X-RAY INTERFEROMETRYHART M; SAUVAGE M; SIDDONS DP et al.1980; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1980; VOL. 36; NO 6; PP. 947-951; BIBL. 11 REF.Article

PROCEEDINGS: CHARACTERIZATION OF CRYSTAL GROWTH DEFECTS BY X-RAY METHODS/NATO ADVANCED STUDY INSTITUTE ON CHARACTERIZATION OF CRYSTAL GROWTH DEFECTS BY X-RAY METHODS, DURHAM, AUGUST 29-SEPTEMBER 10, 1979TANNER BK ED; BOWEN DK ED.1980; CHARACTERIZATION OF CRYSTAL GROWTH DEFECTS BY X-RAY METHODS. NORTH ATLANTIC TREATY ORGANIZATION. ADVANCED STUDY INSTITUTE ON CHARACTERIZATION OF CRYSTAL GROWTH DEFECTS BY X-RAY METHODS/1979-08-29/DURHAM; USA/GBR; NEW YORK; LONDON: PLENUM PRESS; DA. 1980; 615 P.; 26 CM; ISBN 0-306-40628-4; NATO ADVANCED STUDY INSTITUTES SERIES. SERIES B: PHYSICS; 63Conference Proceedings

ATOMIC SCATTERING FACTORS OF COPPER DETERMINED BY PENDELLOESUNG INTENSITY BEAT MEASUREMENTS USING WHITE RADIATION = FACTEURS DE DIFFUSION ATOMIQUE DU CUIVRE DETERMINES PAR MESURES DE BATTEMENTS D'INTENSITE DE PENDELLOESUNG EN UTILISANT UN RAYONNEMENT BLANCTAKAMA T; SATO S.1982; PHILOS. MAG., B; ISSN 0141-8637; GBR; DA. 1982; VOL. 45; NO 6; PP. 615-626; BIBL. 23 REF.Article

Improved surface quality of anisotropically etched silicon {111} planes for mm-scale opticsCOTTER, J. P; ZEIMPEKIS, I; KRAFT, M et al.Journal of micromechanics and microengineering (Print). 2013, Vol 23, Num 11, issn 0960-1317, 117006.1-117006.4Article

On the polarization mixing of X-rays: quantum theory of interference of white X-raysOHKAWA, T; HASHIMOTO, H.Physica status solidi. A. Applied research. 1984, Vol 85, Num 2, pp 335-348, issn 0031-8965Article

On the extension of the theory of Umweganregung with respect to the use of divergent white X-ray radiationBRÜHL, H.-G; RHAN, H.Physica status solidi. A. Applied research. 1985, Vol 87, Num 1, pp 121-126, issn 0031-8965Article

EXTENSION OF A BASIC EXPERIMENT: THE POLARISATION OF THE WHITE-LIGHT-EXCITED SPECTRALLY RESOLVED NAD LINES AND ITS RELATION TO ELECTRON IMPACT EXCITATIONSTUMPF B; BECKER K; SCHULZ G et al.1980; J. PHYS. B; ISSN 0022-3700; GBR; DA. 1980; VOL. 13; NO 21; PP. L627-L630; BIBL. 16 REF.Article

A WHITE X-RAY FOUR-CIRCLE DIFFRACTOMETERSAKAMAKI T; HOSOYA S; FUKAMACHI T et al.1980; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1980; VOL. 13; NO 5; PP. 433-437; BIBL. 15 REF.Article

MEASUREMENT OF X-RAY PENDELLOESUNG INTENSITY BEATS IN DIFFRACTED WHITE RADIATION FROM SILICON WAFERSTAKAMA T; IWASAKI M; SATO S et al.1980; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1980; VOL. 36; NO 6; PP. 1025-1030; BIBL. 21 REF.Article

White light generation through yellow nanophosphor and blue organic light-emitting diodeJE HONG PARK; NAK WON JANG; JONG SU KIM et al.Physica status solidi. B. Basic research. 2009, Vol 246, Num 4, pp 897-899, issn 0370-1972, 3 p.Article

X-ray diffraction spot mapping - : a tool to study structural properties of semiconductor disk laser devicesZEIMER, U; GRENZER, J; KORN, D et al.Physica status solidi. A, Applications and materials science (Print). 2007, Vol 204, Num 8, pp 2753-2759, issn 1862-6300, 7 p.Conference Paper

White light emission from organic-inorganic hererostructure devices by using CdSe quantum dots as emitting layerTANG, Ai-Wei; FENG TENG; GAO, Yin-Hao et al.Journal of luminescence. 2007, Vol 122-23, pp 649-651, issn 0022-2313, 3 p.Conference Paper

White light generation from In-rich InAlGaN/InGaN heterostructuresNAGARAJAN, S; LEE, Y. S; SENTHIL KUMAR, M et al.Journal of physics. D, Applied physics (Print). 2008, Vol 41, Num 1, issn 0022-3727, 012001.1-012001.4Article

Features of dislocation images reconstructed from step-scanned white X-ray section topographsKAJIWARA, Kentaro; KAWADO, Seiji; IIDA, Satoshi et al.Physica status solidi. A, Applications and materials science (Print). 2007, Vol 204, Num 8, pp 2682-2687, issn 1862-6300, 6 p.Conference Paper

White-light-controlled resistive switching effect in [BaTiO3/γ-Fe2O3]/ZnO filmZHAO, W. X; LI, Q. L; SUN, B et al.Solid state communications. 2014, Vol 194, pp 16-19, issn 0038-1098, 4 p.Article

Non-doped-type white organic light-emitting diodes for lighting purposeJIANZHUO ZHU; WENLIAN LI; BEI CHU et al.Journal of luminescence. 2010, Vol 130, Num 5, pp 865-868, issn 0022-2313, 4 p.Article

Temperature and excitation power-resistant white-light emission of the T-phase (Ba, Ca)2SiO4:Eu2+, Mn2+ phosphorPARK, Kwangwon; CHOI, Namsik; KIM, Jongsu et al.Solid state communications. 2010, Vol 150, Num 7-8, pp 329-332, issn 0038-1098, 4 p.Article

Development of visualization method of grain boundaries in stainless steel by using white X-ray micro-beam and image detectorKAJIWARA, Kentaro; SATO, Masugu; HASHIMOTO, Tamotsu et al.Physica status solidi. A, Applications and materials science (Print). 2009, Vol 206, Num 8, pp 1838-1841, issn 1862-6300, 4 p.Conference Paper

X-ray topography of a lysozyme crystalSTOJANOFF, V; SIDDONS, D. P.Acta crystallographica. Section A, Foundations of crystallography. 1996, Vol 52, pp 498-499, issn 0108-7673, 3Article

Structure factors of InP determined by the Pendellösung method using white radiationKOBAYASHI, K; TAKAMA, T; SHUN-ICHI TOHNO et al.Japanese journal of applied physics. 1988, Vol 27, Num 10, pp 1793-1797, issn 0021-4922Article

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