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Results 1 to 25 of 1566

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Trends and applications for MeV electrostatic ion beam acceleratorsNORTON, G. A; STODOLA, S. E.Applied surface science. 2014, Vol 310, pp 89-93, issn 0169-4332, 5 p.Conference Paper

Surface structures of equimolar mixtures of imidazolium-based ionic liquids using high-resolution Rutherford backscattering spectroscopyNAKAJIMA, Kaoru; OSHIMA, Shinichi; SUZUKI, Motofumi et al.Surface science. 2012, Vol 606, Num 21-22, pp 1693-1699, issn 0039-6028, 7 p.Article

XPS and RBS characterizations of electrosynthesized polypyrrole films doped with a heteropolyanion, SiMo12O404DEBIEMME-CHOUVY, Catherine; BERNARD, Marie-Claude; CACHET, Hubert et al.Surface and interface analysis. 2006, Vol 38, Num 4, pp 531-534, issn 0142-2421, 4 p.Conference Paper

Morphological and elemental characterisation with the high-energy ion-nanoprobe LIPSIONBUTZ, T; MEINECKE, Ch; MORAWSKI, M et al.Applied surface science. 2005, Vol 252, Num 1, pp 43-48, issn 0169-4332, 6 p.Conference Paper

Characterization of electrically inactive arsenic atoms in heavily arsenic-doped SiKIKUCHI, Y; GOTO, Y.Surface and interface analysis. 2005, Vol 37, Num 2, pp 201-203, issn 0142-2421, 3 p.Conference Paper

Combination of high-resolution RBS and angle-resolved XPS : accurate depth profiling of chemical statesKIMURA, Kenji; NAKAJIMA, Kaoru; VANDERVORST, Wilfried et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 423-426, issn 0142-2421, 4 p.Conference Paper

Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decorationLOHNER, T; AGOCS, E; BARSONY, I et al.Thin solid films. 2014, Vol 571, pp 715-719, issn 0040-6090, 5 p., 3Conference Paper

Tribological properties changes of H13 steel induced by MEVVA Ta ion implantationYANG JIANHUA; ZHANG TONGHE.Applied surface science. 2004, Vol 229, Num 1-4, pp 249-253, issn 0169-4332, 5 p.Article

Modeling and analysis of hybrid energy storage systems for wireless sensor networksHENGZHAO YANG; YING ZHANG.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7647, issn 0277-786X, isbn 978-0-8194-8062-0 0-8194-8062-2, 76472U.1-76472U.10, 2Conference Paper

Study of electronic sputtering of CaF2 thin filmsPANDEY, Ratnesh K; KUMAR, Manvendra; KHAN, Saif A et al.Applied surface science. 2014, Vol 289, pp 77-80, issn 0169-4332, 4 p.Article

Channeled PIXE and magnetic measurements in Co implanted and thermally annealed ZnO single crystalsWERNER, Z; RATAJCZAK, R; GOSK, J et al.Applied surface science. 2014, Vol 310, pp 242-247, issn 0169-4332, 6 p.Conference Paper

Multi-instrument characterization of the surfaces and materials in microfabricated, carbon nanotube-templated thin layer chromatography plates. An analogy to 'The Blind Men and the Elephant'JENSEN, David S; KANYAL, Supriya S; LINFORD, Matthew R et al.Surface and interface analysis. 2013, Vol 45, Num 8, pp 1273-1282, issn 0142-2421, 10 p.Article

RBS and AFM study of Ag and Au diffusion into PET foils influenced by plasma treatmentMACKOVA, Anna; SVORCIK, Vaclav; STRYHAL, Zdenek et al.Surface and interface analysis. 2006, Vol 38, Num 4, pp 335-338, issn 0142-2421, 4 p.Conference Paper

Ion-beam analysis for cultural heritage on the AGLAE facility : impact of PIXE/RBS combinationSALOMON, J; DRAN, J.-C; GUILLOU, T et al.Applied physics. A, Materials science & processing (Print). 2008, Vol 92, Num 1, pp 43-50, issn 0947-8396, 8 p.Article

Structure and coverage of epitaxial Pb-layers on Si(111)(7×7)WEMMENHOVE, M; HIBMA, T.Surface science. 1993, Vol 287-288, pp 925-929, issn 0039-6028, bConference Paper

Silicide phases formation in Co/c-Si and Co/a-Si systems during thermal annealingNOVAKOVIC, M; POPOVIC, M; ZHANG, K et al.Applied surface science. 2014, Vol 295, pp 158-163, issn 0169-4332, 6 p.Article

Thermoelectric properties of Zn4Sb3/CeFe(4-x)CoxSb12 nano-layered superlattices modified by MeV Si ion beamBUDAK, S; GUNER, S; MINAMISAWA, R. A et al.Applied surface science. 2014, Vol 310, pp 226-229, issn 0169-4332, 4 p.Conference Paper

Graphitic structure formation in ion implanted polyetheretherketoneTAVENNER, E; WOOD, B; CURRY, M et al.Applied surface science. 2013, Vol 283, pp 154-159, issn 0169-4332, 6 p.Article

Incorporation and migration of phosphorus species within anodic films on an Al-W alloyGARCIA-VERGARA, S. J; MOLCHAN, I. S; ZHOU, F et al.Surface and interface analysis. 2011, Vol 43, Num 5, pp 893-902, issn 0142-2421, 10 p.Article

Advanced SIMS quantification in the first few nm of B, P and As ultrashallow implantsMERKULOV, A; PERES, P; CHOI, S et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 522-524, issn 0142-2421, 3 p.Conference Paper

Synthesis and characterization of iron nitrides. An XRD, Mössbauer, RBS and XPS characterizationPRIETO, P; MARCO, J. F; SANZ, J. M et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 781-785, issn 0142-2421, 5 p.Conference Paper

SIMS and high-resolution RBS analysis of ultrathin SiOxNy filmsKIMUR, K; NAKAJIMA, K; KOBAYASHI, H et al.Applied surface science. 2003, Vol 203-04, pp 418-422, issn 0169-4332, 5 p.Conference Paper

Micro-ion beam analysis of physico-chemical reactions at the interface between sol-gel derived glass particles in the SiO2-CaO system and biological fluidsLAO, J; NEDELEC, J. M; MORETTO, Ph et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 162-166, issn 0142-2421, 5 p.Conference Paper

Transition of hydrated oxide layer for aluminum electrolytic capacitorsCHI, Choong-Soo; JEONG, Yongsoo; AHN, Hong-Joo et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2007, Vol 449-451, pp 314-317, issn 0921-5093, 4 p.Conference Paper

Study of the Pd-Rh interdiffusion by ToF-SIMS, RBS and PIXE : Semi-quantitative depth profiles with MCs+ clustersBRISON, J; HUBERT, R; LUCAS, S et al.Applied surface science. 2006, Vol 252, Num 19, pp 7038-7040, issn 0169-4332, 3 p.Conference Paper

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