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Results 1 to 25 of 284

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SCANNING ACOUSTIC MICROSCOPE OPERATING IN THE REFLECTION MODENONGAILLARD B; ROUVAEN JM; BRIDOUX E et al.1980; ACOUST. IMAG.; USA; DA. 1980; VOL. 8; PP. 629-639; BIBL. 4 REF.Conference Paper

ACOUSTIC MICROSCOPYNONGAILLARD B.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 423-431; BIBL. 8 REF.Conference Paper

VISUALIZATION OF THICK SPECIMENS USINGA REFLECTION ACOUSTIC MICROSCOPENONGAILLARD B; ROUVAEN JM; BRIDOUX E et al.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 3 PART. 1; PP. 1245-1249; BIBL. 7 REF.Article

AN ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPYATALAR A.1978; J. APPL. PHYS.; USA; DA. 1978; VOL. 49; NO 10; PP. 5130-5139; BIBL. 18 REF.Article

LINEARLY FOCUSED ACOUSTIC BEAMS FOR ACOUSTIC MICROSCOPYKUSHIBIKI J; OHKUBO A; CHUBACHI N et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 15; PP. 520-522; BIBL. 8 REF.Article

EXPANDING-APERTURE ANNULAR ARRAYDIETZ DR; PARKS SI; LINZER M et al.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 1; PP. 56-75; BIBL. 23 REF.Article

MICROWAVE OVEN MODE TUNING BY SLAB DIELECTRIC LOADSMIHRAN TG.1978; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; USA; DA. 1978; VOL. 26; NO 6; PP. 381-387; BIBL. 8 REF.Article

ANISOTROPY DETECTION IN SAPPHIRE BY ACOUSTIC MICROSCOPE USING LINE-FOCUS BEAMKUSHIBIKI J; OHKUBO A; CHUBACHI N et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 15; PP. 534-536; BIBL. 9 REF.Article

BROADBAND RANDOM PHASE DIFFUSER FOR ULTRASONIC IMAGINGALPHONSE GA; VILKOMERSON D.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 4; PP. 325-332; BIBL. 11 REF.Article

REFLEXION X-RAY TOPOGRAPHY OF OXIDATION-INDUCED STACKING FAULTS IN SILICON.OPPOLZER H.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 42; NO 2; PP. K91-K93; BIBL. 11 REF.Article

ULTRASONIC B-SCAN IMAGING: THEORY OF IMAGE FORMATION AND A TECHNIQUE FOR RESTORATIONMOSTAFA FATEMI; KAK AC.1980; ULTRASON. IMAG.; USA; DA. 1980; VOL. 2; NO 1; PP. 1-47; BIBL. 40 REF.Article

AN ACOUSTIC GRAY SCALE FOR SCANNING ACOUSTIC MICROSCOPY AND DIAGNOSTIC ULTRASOUNDWEGLEIN RD.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 1; PP. 89-100; BIBL. 10 REF.Article

AN INTERDIGITAL TRANSDUCER FOR ACOUSTIC IMAGING.TODA K; MURATA Y.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 3; PP. 144-145; BIBL. 4 REF.Article

CONSTRUCTION OF LIQUID CRYSTAL LIGHT VALVE IN REFLECTION MODE.YOSHIKAWA S; HORIE M; TAKAHASHI H et al.1976; FUJITSU SCI. TECH. J.; JAP.; DA. 1976; VOL. 12; NO 3; PP. 57-72; BIBL. 7 REF.Article

REFLECTION ELECTRON MICROSCOPE OBSERVATIONS OF DISLOCATIONS AND SURFACE STRUCTURE PHASE TRANSITION ON CLEAN (111) SILICON SURFACESOSAKABE N; YAGI K; HONJO G et al.1980; JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1980; VOL. 19; NO 6; PP. L309-L312; BIBL. 10 REF.Article

ETUDE DE LA REPARTITION DE L'ENERGIE DES ELECTRONS DANS LES BANDES ET LES LIGNES DE KIKUCHI OBTENUES PAR REFLEXION AVEC DES ELECTRONS INCIDENTS DE 40 KEV SUR DES CRISTAUX DE SILICIUM.BOVIER C; BURGGRAF C; COUSANDIER R et al.1978; C.R. ACAD. SCI., A; FRA; DA. 1978; VOL. 286; NO 21; PP. 283-284; ABS. ENG; BIBL. 2 REF.Article

EXTINCTION THEORY FOR A PLANE-PARALLEL MOSAIC CRYSTAL IN TRANSMISSIONMAZZONE G.1981; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1981; VOL. 37; NO 3; PP. 391-397; BIBL. 6 REF.Article

ASPECTS GEOMETRIQUES DANS LA CONSIDERATION DES FACTEURS D'APPAREIL POUR OBTENIR LES SPECTRES DE RAYONS X AU DIFFRACTOMETRE. II. ANALYSE DE LA RELATION INTEGRALE ENTRE LES SPECTRES EXPERIMENTAUX ET LES SPECTRES VRAIS ET METHODE DE CALCUL DU PROFIL DES FONCTIONS INSTRUMENTALES POUR LES CLICHES EN REFLEXION ET EN TRANSMISSIONNAGORNYJ VG; PLESHAKOV VF.1981; KRISTALLOGRAFIJA; ISSN 0023-4761; SUN; DA. 1981; VOL. 26; NO 2; PP. 271-276; BIBL. 4 REF.Article

Minimalist and convenient mode changing off-axis digital holographyTUCK WAH NG; ZHENGTAO PENG; NEILD, Adrian et al.Optics communications. 2010, Vol 283, Num 2, pp 295-298, issn 0030-4018, 4 p.Article

Explosives identification model in reflection mode for THz security systemRYNIEC, Radoslaw; ZAGRAJEK, Przemysław; TRZCINSKI, Tomasz et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8119, issn 0277-786X, isbn 978-0-8194-8729-2, 811904.1-811904.6Conference Paper

Performance simulation of reflection-mode GaAs photocathodes with back-interface recombinationZOU JIJUN; DENG WENJUAN; FENG LIN et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8194, issn 0277-786X, isbn 978-0-8194-8835-0, 81942L.1-81942L.8, 2Conference Paper

ETUDE DES DIAGRAMMES DE KIKUCHI DANS LE CAS DE LA REFLEXION: ESSAI D'APPLICATION A L'ETUDE DES COUCHES ADSORBEES BIDIMENSIONNELLESSHINDO SHIGERU.1979; ; FRA; DA. 1979; 110 P.: ILL.; 30 CM; BIBL. 5 P.; TH. UNIV.: SC./STRASBOURG/1979Thesis

REFLECTION OF HELIUM IONS FROM POLYCRISTALLINE PLATINUMMASHKOVA ES; MOLCHANOV VA.1979; ZH. EKSPER. TEOR. FIZ.; SUN; DA. 1979; VOL. 77; NO 6; PP. 2269-2275; ABS. ENG; BIBL. 20 REF.Article

Portable Coherent Frequency-Domain THz SpectrometerLOGAN, Ronald T; DEMERS, Joseph R; KASPER, Bryon L et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8032, issn 0277-786X, isbn 978-0-8194-8606-6, 80320P.1-80320P.10Conference Paper

Innovations in LCD technologyTOMBLING, Craig; TILLIN, M.Synthetic metals. 2001, Vol 122, Num 1, pp 209-214, issn 0379-6779Conference Paper

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