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Results 1 to 25 of 398

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SCANNING ACOUSTIC MICROSCOPE OPERATING IN THE REFLECTION MODENONGAILLARD B; ROUVAEN JM; BRIDOUX E et al.1980; ACOUST. IMAG.; USA; DA. 1980; VOL. 8; PP. 629-639; BIBL. 4 REF.Conference Paper

ACOUSTIC MICROSCOPYNONGAILLARD B.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 423-431; BIBL. 8 REF.Conference Paper

ENHANCING MICROGRAPHS OBTAINED WITH A SCANNING ACOUSTIC MICROSCOPE USING FALSE-COLOR ENCODINGHAMMER R; HOLLIS RL.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 40; NO 8; PP. 678-680; BIBL. 9 REF.Article

VISUALIZATION OF THICK SPECIMENS USINGA REFLECTION ACOUSTIC MICROSCOPENONGAILLARD B; ROUVAEN JM; BRIDOUX E et al.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 3 PART. 1; PP. 1245-1249; BIBL. 7 REF.Article

AN ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPYATALAR A.1978; J. APPL. PHYS.; USA; DA. 1978; VOL. 49; NO 10; PP. 5130-5139; BIBL. 18 REF.Article

LINEARLY FOCUSED ACOUSTIC BEAMS FOR ACOUSTIC MICROSCOPYKUSHIBIKI J; OHKUBO A; CHUBACHI N et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 15; PP. 520-522; BIBL. 8 REF.Article

EXPANDING-APERTURE ANNULAR ARRAYDIETZ DR; PARKS SI; LINZER M et al.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 1; PP. 56-75; BIBL. 23 REF.Article

MICROWAVE OVEN MODE TUNING BY SLAB DIELECTRIC LOADSMIHRAN TG.1978; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; USA; DA. 1978; VOL. 26; NO 6; PP. 381-387; BIBL. 8 REF.Article

ANISOTROPY DETECTION IN SAPPHIRE BY ACOUSTIC MICROSCOPE USING LINE-FOCUS BEAMKUSHIBIKI J; OHKUBO A; CHUBACHI N et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 15; PP. 534-536; BIBL. 9 REF.Article

BROADBAND RANDOM PHASE DIFFUSER FOR ULTRASONIC IMAGINGALPHONSE GA; VILKOMERSON D.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 4; PP. 325-332; BIBL. 11 REF.Article

REFLEXION X-RAY TOPOGRAPHY OF OXIDATION-INDUCED STACKING FAULTS IN SILICON.OPPOLZER H.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 42; NO 2; PP. K91-K93; BIBL. 11 REF.Article

TRANSFERRED-ELECTRON PHOTOEMISSION TO 1,65 MU M FROM INGAAS.ESCHER JS; GREGORY PE; HYDER SB et al.1978; J. APPL. PHYS.; U.S.A.; DA. 1978; VOL. 49; NO 4; PP. 2591-2592; BIBL. 9 REF.Article

ANALYSIS OF SAW ATTENUATION MEASUREMENT USING ACOUSTIC MICROSCOPYYAMANAKA K.1982; ELECTRONICS LETTERS; ISSN 0013-5194; GBR; DA. 1982; VOL. 18; NO 14; PP. 587-589; BIBL. 6 REF.Article

NEW METHODS OF X-RAY DIFFRACTION SPECTROMETRY. I: IMAGE FORMATION IN CURVED CRYSTALSBREMER J; SORUM H.1980; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1980; VOL. 13; NO 4; PP. 354-358; BIBL. 11 REF.Article

DEPOUILLEMENT PAR ORDINATEUR DES CLICHES DE DIFFRACTION OBTENUS PAR LA METHODE DE LAUERICQUET JP; BONNET R.1979; J. APPL. CRYSTALLOGR.; DNK; DA. 1979; VOL. 12; NO 1; PP. 39-41; ABS. ENG; BIBL. 5 REF.Article

A PHYSICAL MODEL FOR ACOUSTIC SIGNATURESABDULLAH ATALAR.1979; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1979; VOL. 50; NO 12; PP. 8237-8239; BIBL. 7 REF.Article

ULTRASONIC B-SCAN IMAGING: THEORY OF IMAGE FORMATION AND A TECHNIQUE FOR RESTORATIONMOSTAFA FATEMI; KAK AC.1980; ULTRASON. IMAG.; USA; DA. 1980; VOL. 2; NO 1; PP. 1-47; BIBL. 40 REF.Article

AN ACOUSTIC GRAY SCALE FOR SCANNING ACOUSTIC MICROSCOPY AND DIAGNOSTIC ULTRASOUNDWEGLEIN RD.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 1; PP. 89-100; BIBL. 10 REF.Article

AN INTERDIGITAL TRANSDUCER FOR ACOUSTIC IMAGING.TODA K; MURATA Y.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 3; PP. 144-145; BIBL. 4 REF.Article

CONSTRUCTION OF LIQUID CRYSTAL LIGHT VALVE IN REFLECTION MODE.YOSHIKAWA S; HORIE M; TAKAHASHI H et al.1976; FUJITSU SCI. TECH. J.; JAP.; DA. 1976; VOL. 12; NO 3; PP. 57-72; BIBL. 7 REF.Article

REFLECTION ELECTRON MICROSCOPE OBSERVATIONS OF DISLOCATIONS AND SURFACE STRUCTURE PHASE TRANSITION ON CLEAN (111) SILICON SURFACESOSAKABE N; YAGI K; HONJO G et al.1980; JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1980; VOL. 19; NO 6; PP. L309-L312; BIBL. 10 REF.Article

ETUDE DE LA REPARTITION DE L'ENERGIE DES ELECTRONS DANS LES BANDES ET LES LIGNES DE KIKUCHI OBTENUES PAR REFLEXION AVEC DES ELECTRONS INCIDENTS DE 40 KEV SUR DES CRISTAUX DE SILICIUM.BOVIER C; BURGGRAF C; COUSANDIER R et al.1978; C.R. ACAD. SCI., A; FRA; DA. 1978; VOL. 286; NO 21; PP. 283-284; ABS. ENG; BIBL. 2 REF.Article

DOMAINS AND BOUNDARIES OF PSEUDO-STATIONNARY OBLIQUE SHOCK-WAVE REFLECTIONS IN AIRLEE JH; GLASS II.1982; UTIAS REP.; ISSN 0082-5255; CAN; DA. 1982; NO 262; 56 P.; BIBL. 44 REF.Serial Issue

SOME NEW TECHNIQUES IN REFLECTION HIGH ENERGY ELECTRON DIFFRACTION (RHEED). APPLICATION TO SURFACE STRUCTURE STUDIES.INO S.1977; JAP. J. APPL. PHYS.; JAP.; DA. 1977; VOL. 16; NO 6; PP. 891-908; BIBL. 18 REF.Article

OBSERVATION DE DEFAUTS CRISTALLINS EN MICROSCOPIE ELECTRONIQUE A BALAYAGE.PITAVAL M; MORIN P; BAUDRY J et al.1976; J. PHYS., LETTRES; FR.; DA. 1976; VOL. 37; NO 11; PP. L309-L312; ABS. ANGL.; BIBL. 8 REF.Article

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