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THE FABRICATION OF VERY NARROW SELF-ALIGNED GUARD RINGS AROUND SCHOTTKY-BARRIER DIODESLEVIN RM; KOENEKE CJ.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 3; PP. 247-249; BIBL. 8 REF.Article

MEASUREMENT OF 2-PART DEVICES BY A REFLECTOMETER SYSTEMCULLEN AL.1982; IEE PROCEEDINGS. PART H: MICROWAVES, OPTICS AND ANTENNAS; ISSN 0143-7097; GBR; DA. 1982; VOL. 129; NO 6; PP. 333-337; BIBL. 7 REF.Article

THEORETICAL CONTRIBUTION TO THE DESIGN OF MILLIMETER-WAVE TEO'SFRISCOURT MR; ROLLAND PA; CAPPY A et al.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 3; PP. 223-229; BIBL. 29 REF.Article

A HIGH LUMINANCE HIGH-RESOLUTION CATHODE-RAY TUBE FOR SPECIAL PURPOSESVAN TOL MW; VAN ESDONK J.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 3; PP. 193-197; BIBL. 10 REF.Article

A SEMIAUTOMATED SIX PORT FOR MEASURING MILLIMETER-WAVE POWER AND COMPLEX REFLECTION OCEFFICIENT.WEIDMAN MP.1977; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; U.S.A.; DA. 1977; VOL. 25; NO 12; PP. 1083-1085; BIBL. 2 REF.; (ACCENT ON APPL. INT. MICROWAVE SYMP.; SAN DIEGO, CALIF.; 1977)Conference Paper

AN AUTOMATIC NETWORK ANALYZER USING A SLOTTED LINE REFLECTOMETERMARTIN E; MARGINEDA J; ZAMARRO JM et al.1982; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1982; VOL. 30; NO 5; PP. 667-670; BIBL. 9 REF.Article

PERFORMANCE CHARACTERISTICS OF AN AUTOMATED BROAD-BAND BOLOMETER UNIT CALIBRATION SYSTEM.KOMAREK EL.1977; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; U.S.A.; DA. 1977; VOL. 25; NO 12; PP. 1122-1127; BIBL. 5 REF.; (ACCENT ON APPL. INT. MICROWAVE SYMP.; SAN DIEGO, CALIF.; 1977)Conference Paper

THE MEASUREMENT OF COMPLEX REFLECTION COEFFICIENT BY MEANS OF A FIVE-PORT REFLECTOMETERSHIHE LI; BOSISIO RG.1983; IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES; ISSN 0018-9480; USA; DA. 1983; VOL. 31; NO 4; PP. 321-326; BIBL. 11 REF.Article

REFLECTOMETERS FOR MILLIMETER-WAVE MEASUREMENTSCRANDELL M; CRANDELL PA.1980; MICROWAVE J.; USA; DA. 1980; VOL. 23; NO 6; PP. 59-63Article

A QUASI-OPTICAL NULLING METHOD FOR MATERIAL BIREFRINGENCE MEASUREMENTS AT NEAR-MILLIMETER WAVELENGTHSSIMONIS GJ.1983; IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES; ISSN 0018-9480; USA; DA. 1983; VOL. 31; NO 4; PP. 356-358; BIBL. 11 REF.Article

ANALYSIS AND CALIBRATION THEORY OF THE GENERAS 6-PORT REFLECTOMETOR EMPLOYING FOUR AMPLITUDE DETECTORSWOODS D.1979; PROC. INSTIT. ELECTR. ENGRS; GBR; DA. 1979; VOL. 126; NO 2; PP. 221-228; BIBL. 13 REF.Article

CALIBRATING THE SIX-PORT REFLECTOMETER BY MEANS OF SLIDING TERMINATIONSENGEN GF.1978; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; USA; DA. 1978; VOL. 26; NO 12; PP. 951-957; BIBL. 6 REF.Article

A SIX-PORT REFLECTOMETER AND ITS COMPLETE CHARACTERIZATION BY CONVENIENT CALIBRATION PROCEDURESSOMLO PI; HUNTER JD.1982; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1982; VOL. 30; NO 2; PP. 186-192; BIBL. 12 REF.Article

Analysis of symmetrical six-port junction when configured as a six-port reflectometerYEO, S. P.IEEE transactions on instrumentation and measurement. 1992, Vol 41, Num 2, pp 193-197, issn 0018-9456Conference Paper

REFLECTOMETRE A RADIO-IMPULSIONS DE LA GAMME DE LA NANOSECONDEANDRIYANOV AV; BULATOV EI; WEDENSKIJ YU V et al.1977; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1977; NO 2; PP. 141-145; BIBL. 6 REF.Article

CALIBRATION OF MULTIPORT REFLECTOMETERS BY MEANS OF FOUR OPEN/SHORT CIRCUITSSHIHE LI; BOSISIO RG.1982; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1982; VOL. 30; NO 7; PP. 1085-1090; BIBL. 6 REF.Article

"THREE REFLECT-LINE": AN IMPROVED TECHNIQUE FOR CALIBRATING THE DUAL SIX-PORT AUTOMATIC NETWORK ANALYZERENGEN GF; HOER CA.1979; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; USA; DA. 1979; VOL. 27; NO 12; PP. 987-993; BIBL. 13 REF.Conference Paper

A SIX-PORT AUTOMATIC NETWORK ANALYZER.CRONSON HM; SUSMAN L.1977; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; U.S.A.; DA. 1977; VOL. 25; NO 12; PP. 1086-1091; BIBL. 7 REF.; (ACCENT ON APPL. INT. MICROWAVE SYMP.; SAN DIEGO, CALIF.; 1977)Conference Paper

BIDIRECTIONAL REFLECTOMETRY. I. A HIGH RESOLUTION LASER BIDIRECTIONAL REFLECTOMETER WITH RESULTS ON SEVERAL OPTICAL COATINGS.HSIA JJ; RICHMOND JC.1976; J. RES. NATION. BUR. STAND., A; U.S.A.; DA. 1976; VOL. 80; NO 2; PP. 189-205; BIBL. 4 REF.Article

Focussed beam reflectometer for solid and liquid surfacesMEZEI, F; GOLUB, R; KLOSE, F et al.Physica. B, Condensed matter. 1995, Vol 213-14, pp 898-900, issn 0921-4526Conference Paper

The neutron reflectometer (C3-1-2) at the JRR-3M reactor at JAERIEBISAWA, T; TASAKI, S; OTAKE, Y et al.Physica. B, Condensed matter. 1995, Vol 213-14, pp 901-903, issn 0921-4526Conference Paper

SIX-PORT REFLECTOMETER CIRCUIT COMPRISING THREE DIRECTIONAL COUPLERSGRIFFIN EJ.1982; ELECTRONICS LETTERS; ISSN 0013-5194; GBR; DA. 1982; VOL. 18; NO 12; PP. 491-493; BIBL. 5 REF.Article

BEWERTUNG DER REINHEIT VON GUSSSTUECKOBERFLAECHEN NACH DEM STRAHLEN = EVALUATION OF THE CASTING SURFACE CLEANNESS AFTER SHOT BLASTINGPORKAT J.1980; GIESSEREITECHNIK; DDR; DA. 1980-12; VOL. 26; NO 12; PP. 377-379; BIBL. 3 REF.Conference Paper

THE EFFECT OF FLANGE LOSS ON THE REFLECTION COEFFICIENT OF REDUCED-HEIGHT WAVEQUIDE REFLECTION STANDARDSSOMLO PI.1979; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; USA; DA. 1979; VOL. 27; NO 9; PP. 795-797; BIBL. 7 REF.Article

OPTICAL TIME DOMAIN REFLECTOMETRY IN AN OPTICAL CABLE MANUFACTURING FACILITYMCNAUGHTON J.1979; FOC'79. INTERNATIONAL FIBER OPTICS AND COMMUNICATIONS EXPOSITION IN THE U.S. 2/1979/CHICAGO; USA; BROOKLINE MA: INFORMATION GATEKEEPERS; DA. 1979; PP. 117-120; BIBL. 3 REF.Conference Paper

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