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Results 1 to 25 of 861

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AN IMPROVED CIRCUIT FOR IMPLEMENTING THE SIX-PORT TECHNIQUE OF MICROWAVE MEASUREMENTS.ENGEN GF.1977; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; U.S.A.; DA. 1977; VOL. 25; NO 12; PP. 1080-1083; BIBL. 3 REF.; (ACCENT ON APPL. INT. MICROWAVE SYMP.; SAN DIEGO, CALIF.; 1977)Conference Paper

A SEMIAUTOMATED SIX PORT FOR MEASURING MILLIMETER-WAVE POWER AND COMPLEX REFLECTION OCEFFICIENT.WEIDMAN MP.1977; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; U.S.A.; DA. 1977; VOL. 25; NO 12; PP. 1083-1085; BIBL. 2 REF.; (ACCENT ON APPL. INT. MICROWAVE SYMP.; SAN DIEGO, CALIF.; 1977)Conference Paper

PERFORMANCE CHARACTERISTICS OF AN AUTOMATED BROAD-BAND BOLOMETER UNIT CALIBRATION SYSTEM.KOMAREK EL.1977; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; U.S.A.; DA. 1977; VOL. 25; NO 12; PP. 1122-1127; BIBL. 5 REF.; (ACCENT ON APPL. INT. MICROWAVE SYMP.; SAN DIEGO, CALIF.; 1977)Conference Paper

PRECISION DES MESURES DE DESADAPTATION EN UTILISANT LES TECHNIQUES DE REFLECTOMETRIE EN HYPERFREQUENCEADAMSKI W.1974; ROZPR. ELEKTROTECH.; POLSKA; DA. 1974; VOL. 20; NO 3; PP. 471-488; ABS. ANGL. ALLEM. RUSSE; BIBL. 15 REF.Article

A SIX-PORT AUTOMATIC NETWORK ANALYZER.CRONSON HM; SUSMAN L.1977; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; U.S.A.; DA. 1977; VOL. 25; NO 12; PP. 1086-1091; BIBL. 7 REF.; (ACCENT ON APPL. INT. MICROWAVE SYMP.; SAN DIEGO, CALIF.; 1977)Conference Paper

MEASUREMENT OF 2-PART DEVICES BY A REFLECTOMETER SYSTEMCULLEN AL.1982; IEE PROCEEDINGS. PART H: MICROWAVES, OPTICS AND ANTENNAS; ISSN 0143-7097; GBR; DA. 1982; VOL. 129; NO 6; PP. 333-337; BIBL. 7 REF.Article

A HIGH-SENSITIVITY NARROW-BAND TIME-DOMAIN REFLECTOMETER.MACKAY NAM; PENSTONE SR.1974; I.E.E.E. TRANS. INSTRUMENT. MEASUR.; U.S.A.; DA. 1974; VOL. 23; NO 2; PP. 155-158Article

AN AUTOMATIC NETWORK ANALYZER USING A SLOTTED LINE REFLECTOMETERMARTIN E; MARGINEDA J; ZAMARRO JM et al.1982; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1982; VOL. 30; NO 5; PP. 667-670; BIBL. 9 REF.Article

THE SIX-PORT REFLECTOMETER: AN ALTERNATIVE NETWORK ANALYZER.ENGEN GF.1977; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; U.S.A.; DA. 1977; VOL. 25; NO 12; PP. 1075-1080; BIBL. 9 REF.; (ACCENT ON APPL. INT. MICROWAVE SYMP.; SAN DIEGO, CALIF.; 1977)Conference Paper

PRECISE MEASUREMENTS OF REFLECTION COEFFICIENTS BY MEANS OF TUNED MICROWAVE REFLECTOMETERSRAICU D.1973; REV. ROUMAINE PHYS.; ROUMAN.; DA. 1973; VOL. 18; NO 2; PP. 177-186; ABS. FR.; BIBL. 3 REF.Serial Issue

THE MEASUREMENT OF COMPLEX REFLECTION COEFFICIENT BY MEANS OF A FIVE-PORT REFLECTOMETERSHIHE LI; BOSISIO RG.1983; IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES; ISSN 0018-9480; USA; DA. 1983; VOL. 31; NO 4; PP. 321-326; BIBL. 11 REF.Article

DEVELOPMENT AND OPERATION OF A HEMI-ELLIPSOIDAL MIRROR INFRARED REFLECTOMETER.WOOD BE; PIPES JG; SMITH AM et al.1975; IN: AM. INST. AERONAUT. ASTRONAUT. 10TH THERMOPHYS, CONF.; DENVER, COLO.; 1975; NEW YORK; A.I.A.A.; DA. 1975; VOL. 655; PP. 1-10; BIBL. 15 REF.Conference Paper

PHOTOELECTRIC REFLECTOMETER WITH AUTOMATIC DATA RECORDING.KIEL A; PUKOWSKA B.1974; ACTA PHYS. POLON., A; POLOGNE; DA. 1974; VOL. 45; NO 6; PP. 923-926; BIBL. 8 REF.Article

HEMI-ELLIPSOIDAL MIRROR INFRARED REFLECTOMETER: DEVELOPMENT AND OPERATION.WOOD BE; PIPES JG; SMITH AM et al.1976; APPL. OPT.; U.S.A.; DA. 1976; VOL. 15; NO 4; PP. 940-950; BIBL. 17 REF.Article

REFLECTOMETERS FOR MILLIMETER-WAVE MEASUREMENTSCRANDELL M; CRANDELL PA.1980; MICROWAVE J.; USA; DA. 1980; VOL. 23; NO 6; PP. 59-63Article

FEHLERORTMESSUNG AN KOAXIALKABEL- UND HOHLLEITERANLAGEN. = LOCALISATION DE DEFAUTS SUR LES CABLES COAXIAUX ET GUIDES D'ONDES AUX FREQUENCES SUPERIEURES A 1 GHZBOLINGER W.1978; P.T.T., BULL. TECH.; SUISSE; DA. 1978; VOL. 56; NO 2; PP. 58-64; ABS. ITAL. FR.; BIBL. 10 REF.Article

A NETWORK ANALYZER INCORPORATING TWO SIX-PORT REFLECTOMETERS.HOER CA.1977; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; U.S.A.; DA. 1977; VOL. 25; NO 12; PP. 1070-1074; BIBL. 10 REF.; (ACCENT ON APPL. INT. MICROWAVE SYMP.; SAN DIEGO, CALIF.; 1977)Conference Paper

DOUBLE-BEAM TWO-CHANNEL WAVELENGTH-MODULATED REFLECTOMETER.KARDUX W; KRUSEMEYER HJ.1974; APPL. OPT.; U.S.A.; DA. 1974; VOL. 13; NO 11; PP. 2704-2711; BIBL. 15 REF.Article

A NEAR-NORMAL INCIDENCE SCANNING REFLECTOMETER IN THE VISIBLE RANGE.OKADA Y; FUJITA H.1974; JAP. J. APPL. PHYS.; JAP.; DA. 1974; VOL. 13; NO 2; PP. 341-344; BIBL. 3 REF.Article

A NEW DISPOSABLE BOWIE-DICK-TYPE TEST PACK FOR PREVACUUM HIGH-TEMPERATURE STERILIZERSRHODES P; ZELNER L; LAUFMAN H et al.1982; MED. INSTRUM.; ISSN 0090-6689; USA; DA. 1982; VOL. 16; NO 2; PP. 117-120; BIBL. 5 REF.Article

ANALYSIS AND CALIBRATION THEORY OF THE GENERAS 6-PORT REFLECTOMETOR EMPLOYING FOUR AMPLITUDE DETECTORSWOODS D.1979; PROC. INSTIT. ELECTR. ENGRS; GBR; DA. 1979; VOL. 126; NO 2; PP. 221-228; BIBL. 13 REF.Article

A SIX-PORT REFLECTOMETER AND ITS COMPLETE CHARACTERIZATION BY CONVENIENT CALIBRATION PROCEDURESSOMLO PI; HUNTER JD.1982; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1982; VOL. 30; NO 2; PP. 186-192; BIBL. 12 REF.Article

REFLECTOMETRE IMPULSIONNEL A RESOLUTION DE MOINS D'UNE NANOSECONDEUVEDENSKIJ YU V; GORYACHEV LV; KRYLOV VV et al.1975; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1975; NO 1; PP. 130-133; BIBL. 6 REF.Article

INFRARED REFLECTOMETRY WITH A CAVITY-SHAPED PYROELECTRIC DETECTOR.BLEVIN WR; GEIST J.1974; APPL. OPT.; U.S.A.; DA. 1974; VOL. 13; NO 10; PP. 2212-2217; BIBL. 16 REF.Article

A PROPOS DE L'ETUDE EXPERIMENTALE DE LA DIFFUSION DES ONDES ELECTROMAGNETIQUES PAR DE PETITS CORPSLEVIN MM; FIKS ME.1974; IZMERITEL. TEKH.; S.S.S.R.; DA. 1974; NO 6; PP. 79-80; BIBL. 1 REF.Article

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