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Direct resolution and identification of the sublattices in compound semiconductors by high-resolution transmission electron microscopyOURMAZD, A; RENTSCHLER, J. R; TAYLOR, D. W et al.Physical review letters. 1986, Vol 57, Num 24, pp 3073-3076, issn 0031-9007Article

Direct resolution and identification of the sublattices in compound semiconductors by high-resolution transmission electron microscopyOURMAZD, A; RENTSCHLER, J. R; TAYLOR, D. W et al.Physical review letters. 1986, Vol 57, Num 24, pp 3073-3076, issn 0031-9007Article

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