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DESIGNING AND PROCESSING THICK FILM RESISTORSSERGENT JE; LANE GM.1979; ELECTRON. PACKAG. PRODUCT.; USA; DA. 1979; VOL. 19; NO 10; PP. 64-71; (7 P.)Article

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ELECTRICAL TRANSPORT IN THICK FILM RESISTORSHILL RM.1979; EUROPEAN HYBRID MICROELECTRONICS CONFERENCE. 2/1978/GHENT; NLD; PIJNACKER: DUTCH EFFICIENCY BUREAU; DA. 1979; PP. 95-104; BIBL. 9 REF.Conference Paper

COUCHES DE COMMUTATION EPAISSESKOBTSEV YU D; ALEKSANDROVA LF.1974; POLUPROVODN. TEKH. MIKROELEKTRON., U.S.S.R.; S.S.S.R.; DA. 1974; NO 17; PP. 96-97Article

HIGH RELIABILITY POLYMER THICK FILMMARTIN FW.1982; SOLID STATE TECHNOLOGY; ISSN 0038-111X; USA; DA. 1982; VOL. 25; NO 10; PP. 173-193; 5 P.; BIBL. 19 REF.Article

EXCESS NOISE AND REFIRING PROCESSES IN THICK-FILM RESISTORSPRUDENZIATI M; MORTEN B; MASOERO A et al.1981; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1981; VOL. 14; NO 7; PP. 1355-1362; BIBL. 9 REF.Article

ACCELERATED LIFE TESTING OF THICK FILM RESISTORSKRAUSE BD; WALTERS NA.1972; IN: NATO CONF. RELIAB. TEST. RELIAB. EVAL. THE HAGUE, NETH., 1972. PROC.; NORTHRIDGE, CALIF.; CALIFORNIA STATE UNIV.; DA. 1972; PP. (19 P.); BIBL. 1 REF.Conference Proceedings

THE CHEMISTRY AND STABILITY OF RUTHENIUM-BASED RESISTORSPIERCE JW; KUTY DW; LARRY JR et al.1982; SOLID STATE TECHNOLOGY; ISSN 0038-111X; USA; DA. 1982; VOL. 25; NO 10; PP. 85-93; BIBL. 7 REF.Article

STRAIN SENSITIVITY OF THICK-FILM RESISTORSSHAH JS.1980; I.E.E.E. TRANS. COMPON. HYBR. MANUFG TECHNOL.; USA; DA. 1980; VOL. 3; NO 4; PP. 554-564; BIBL. 13 REF.Article

COMPUTERIZED ANALYSIS OF BURST NOISE IN THICK FILM RESISTORSCOTTLE JG; CHEN CTM.1983; IEEE TRANSACTIONS ON COMPONENTS, HYBRIDS, AND MANUFACTURING TECHNOLOLGY; ISSN 0148-6411; USA; DA. 1983; VOL. 6; NO 2; PP. 163-167; BIBL. 11 REF.Article

CURRENT NOISE OF RESIN TYPE AND CERMET TYPE THICK FILM RESISTORSSHEN LI FU; SHIRAMATSU T; TIEN SHOU WU et al.1980; ELECTROCOMPON. SCI. TECHNOL.; ISSN 0305-3091; GBR; DA. 1980; VOL. 7; NO 1-3; PP. 63-67; BIBL. 11 REF.Article

A THICK FILM BASE METAL RESISTOR AND COMPATIBLE HYBRID SYSTEM.BUZAN FE; GRIER JD; BERTSCH BE et al.1978; ELECTROCOMPON. SCI. TECHNOL.; G.B.; DA. 1978; VOL. 5; NO 1; PP. 15-25; BIBL. 17 REF.Article

LOW FIRING POLYMER THICK FILM ENABLES THE SCREEN PRINTING OF RESISTORS AND CONDUCTORS ON PC BOARDS.MARTIN FM.1975; INSULAT. CIRCUITS; U.S.A.; DA. 1975; VOL. 21; NO 8; PP. 29-32Article

LA NON-LINEARITE DE TENSION ET LE BRUIT DE COURANT DES COUCHES EPAISSES RESISTANCES POLO/PD-AUKUSY A; PASZCZYNSKI S; WRONA A et al.1975; ROZPR. ELEKTROTECH.; POLSKA; DA. 1975; VOL. 21; NO 2; PP. 305-324; ABS. ANGL. FR. ALLEM. RUSSEArticle

MICROELECTRONICS TECHNOLOGY1972; IN: 1972 INTER. MICROELECTRON. SYMP.; WASHINGTON, D.C.; 1972; PARK RIDGE; INTER. SOC. HYBRID MICROELECTRON.; DA. 1972; PP. (39 P.); BIBL. DISSEM.Conference Paper

ELECTRICAL CONDUCTION IN THICK FILM PASTE RESISTORSSMITH DPH; ANDERSON JC.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 71; NO 1; PP. 79-89; BIBL. 16 REF.Article

OPTIMIZATION OF THICK FILM RESISTORS FOR LOW DRIFTBJOERKLUND G; LINDE L.1980; ELECTROCOMPON. SCI. TECHNOL.; ISSN 0305-3091; GBR; DA. 1980; VOL. 7; NO 1-3; PP. 87-91; BIBL. 7 REF.Article

CURRENT NOISE OF RESIN TYPE AND CERMET TYPE THICK FILM RESISTORSSHEN LI FU; SHIRAMATSU T; TIEN SHOU WU et al.1979; EUROPEAN HYBRID MICROELECTRONICS CONFERENCE. 2/1978/GHENT; NLD; PIJNACKER: DUTCH EFFICIENCY BUREAU; DA. 1979; PP. 133-140; BIBL. 11 REF.Conference Paper

ESSAI THERMIQUE DE RESISTANCES A COUCHES EPAISSESTAKAHASHI K; MIKAMI K; YOKOTA K et al.1978; REP. TOKYO METROPOL. INDUSTR. TECH. INST.; JAP.; DA. 1978; NO 7; PP. 129Article

CONDUCTION PROCESSES IN HIGH VALUE THICK FILM RESISTORS.ROBERTSON J.1977; ELECTROCOMPON. SCI. TECHNOL.; G.B.; DA. 1977; VOL. 4; NO 2; PP. 105-109; BIBL. 7 REF.Article

THE EFFECTS OF TRIMMING ON THE CURRENT NOISE OF THICK FILM RESISTORS.CHEN TM; RHEE JG.1977; SOLID STATE TECHNOL.; U.S.A.; DA. 1977; VOL. 20; NO 6; PP. 49-53; BIBL. 9 REF.Article

LASER TRIMMING OF THICK FILM CIRCUITS.STEER P.1974; ELECTRON. COMPON.; G.B.; DA. 1974; VOL. 16; NO 15; PP. 14-15Article

CURRENT TRENDS IN THICK-FILM RESISTOR TECHNOLOGYVAN LOAN PR.1971; J. CANAD. CERAM. SOC.; CANADA; DA. 1971; VOL. 40; PP. 49-54; BIBL. 24 REF.Serial Issue

EFFECT OF GLASS-FRIT SIZE DISTRIBUTION ON THE MICROSTRUCTURE OF RUO₂-BASED THICK-FILM RESISTORSBIGGERS JV; MCKELVY JR; SCHULZE WA et al.1982; J. AM. CERAM. SOC.; ISSN 0002-7820; USA; DA. 1982; VOL. 65; NO 1; PP. C13-C14; BIBL. 5 REF.Article