THE RADIOGRAPHIC MANIFESTATIONS OF GOUTY ARTHRITIS.RESNIK D.1977; C.R.C. CRIT. REV. DIAGNOST. IMAGG; U.S.A.; DA. 1977; VOL. 9; NO 3; PP. 265-335; BIBL. 6 P. 1/2Article

SMALL DISK: LARGE CAPACITYRESNIK D.1979; USING MICROPROCESSORS, EXTENDING OUR REACH. COMPCON FALL 79. INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS. COMPUTER SOCIETY. INTERNATIONAL CONFERENCE. 19/1979/WASHINGTON DC; USA; NEW YORK: IEEE; DA. 1979; PP. 371Conference Paper

DRIVE MECHANISM DESIGN REDUCES ERRORS IN MINI-FLOPPIESRESNIK D.1980; COMPUTER DESIGN; USA; DA. 1980; VOL. 19; NO 3; PP. 160-168; (4 P.); BIBL. 4 REF.Article

Debunking the slippery slope argument against human germ-line gene therapyRESNIK, D.The Journal of medicine and philosophy. 1994, Vol 19, Num 1, pp 23-40, issn 0360-5310Article

Epistemic value: truth or explanation?RESNIK, D.Metaphilosophy. 1994, Vol 25, Num 4, pp 348-361, issn 0026-1068Article

Laws and development = Les lois et le développementRESNIK, D.Synthese (Dordrecht). 1997, Vol 112, Num 1, pp 37-51, issn 0039-7857Article

Repairing the recticulated model of scientific rationalityRESNIK, D.Erkenntnis. 1994, Vol 40, Num 3, pp 343-355, issn 0165-0106Article

How-possibly explanations in biologyRESNIK, D. B.Acta biotheoretica. 1991, Vol 39, Num 2, pp 141-149, issn 0001-5342Article

Hacking's experimental realismRESNIK, D. B.Canadian journal of philosophy. 1994, Vol 24, Num 3, pp 395-411, issn 0045-5091Article

Genetic engineering and social justice : A Rawlsian approach = L'ingénierie génétique et la justice sociale: une approche rawlsienneRESNIK, D. B.Social theory and practice. 1997, Vol 23, Num 3, pp 427-448, issn 0037-802XArticle

Do scientific aims justify methodological rules?RESNIK, D. B.Erkenntnis. 1993, Vol 38, Num 2, pp 223-232, issn 0165-0106Article

CLINICAL, RADIOGRAPHIC AND PATHOLOGIC ABNORMALITIES IN CALCIUM PYROPHOSPHATE DIHYDRATE DEPOSITION DISEASE (CPPD): PSEUDOGOUT.RESNIK D; NIWAYAMA G; GOERGEN TG et al.1977; RADIOLOGY; U.S.A.; DA. 1977; VOL. 122; NO 1; PP. 1-15; BIBL. 35 REF.Article

Study of low-temperature direct bonding of (111) and (100) silicon wafers under various ambient and surface conditionsRESNIK, D; VRTACNIK, D; ALJANCIC, U et al.Sensors and actuators. A, Physical. 2000, Vol 80, Num 1, pp 68-76, issn 0924-4247Article

Morphological study of {311} crystal planes anisotropically etched in (100) silicon : role of etchants and etching parametersRESNIK, D; VRTACNIK, D; AMON, S et al.Journal of micromechanics and microengineering (Print). 2000, Vol 10, Num 3, pp 430-439, issn 0960-1317Article

Different aspect ratio pyramidal tips obtained by wet etching of (100) and (111) siliconRESNIK, D; VRTACNIK, D; ALJANCIC, U et al.Microelectronics journal. 2003, Vol 34, Num 5-8, pp 591-593, issn 0959-8324, 3 p.Conference Paper

Study of FOXFET biasing structureVRTACNIK, D; RESNIK, D; ALJANCIC, U et al.IEEE Mediterranean electrotechnical conference. 2002, pp 300-304, isbn 0-7803-7527-0, 5 p.Conference Paper

Temperature effects modeling in silicon piezoresistive pressure sensorALJANCIC, U; RESNIK, D; VRTACNIK, D et al.IEEE Mediterranean electrotechnical conference. 2002, pp 36-40, isbn 0-7803-7527-0, 5 p.Conference Paper

Influence of mechanical stress on adhesion properties of DC magnetron sputtered Ti/NiV/Ag layers on n⁺Si substrateRESNIK, D; VRTACNIK, D; ALJANCIC, U et al.Microelectronic engineering. 2008, Vol 85, Num 7, pp 1603-1607, issn 0167-9317, 5 p.Article

Calibration and error correction algorithms for smart pressure sensorsMOZEK, M; VRTACNIK, D; RESNIK, D et al.IEEE Mediterranean electrotechnical conference. 2002, pp 240-243, isbn 0-7803-7527-0, 4 p.Conference Paper