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ENGINEERING RELIABILITY MANAGEMENTDHILLON BS.1983; MICROELECTRONICS AND RELIABILITY; ISSN 0026-2714; GBR; DA. 1983; VOL. 23; NO 2; PP. 215-234; BIBL. 103 REF.Article

A PHOTOGRAMMETRIC TEST IMAGEZIEMANN H.1982; ADVANCES IN THE QUALITY OF IMAGE DATA. INTERNATIONAL SOCIETY FOR PHOTOGRAMMETRY AND REMOTE SENSING. COMMISSION 1 PRIMARY DATA ACQUISITION. INTERNATIONAL SYMPOSIUM/1982-04-14/CANBERRA; AUS; PERTH: KEVRON AERIAL SURVEYS; DA. 1982; PP. 230-233; BIBL. 1 REF.Conference Paper

ETUDE DE L'EFFET DU SALISSEMENT DU VERRE PROTECTEUR D'UN DISPOSITIF TELESCOPIQUE SUR SON POUVOIR DE RESOLUTIONDUBENSKOV VP; VASIL'EV V YA; POPOVA DYUMINA LN et al.1981; OPT.-MEH. PROM.; ISSN 0030-4042; SUN; DA. 1981; NO 10; PP. 36-39; BIBL. 3 REF.Article

GITTERSPEKTROGRAPHEN. = SPECTROGRAPHES A RESEAUSOLF J.1976; MITT. ASTR. GESELLSCH.; DTSCH.; DA. 1976; NO 40; PP. 13-22; BIBL. 12 REF.Article

SUR LA CONDITION DE RESOLUTION LIMITE DES SYSTEMES OPTIQUES LORS D'UN ECLAIREMENT PARTIELLEMENT COHERENTSTOLYAROV AD.1982; OPT. SPEKTROSK.; ISSN 0030-4034; SUN; DA. 1982; VOL. 53; NO 2; PP. 378-380; BIBL. 3 REF.Article

RESOLUTION, OVERLAY, AND FIELD SIZE FOR LITHOGRAPHY SYSTEMSBROERS AN.1981; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1981; VOL. 28; NO 11; PP. 1268-1278; BIBL. 68 REF.Article

OPTIMISATION DU POUVOIR DE RESOLUTION DES DISPOSITIFS OPTIQUESRAMM AG; RODIONOV SA.1977; OPT. I SPEKTROSK.; S.S.S.R.; DA. 1977; VOL. 42; NO 3; PP. 540-545; BIBL. 8 REF.Article

RESOLUTION EN PROFONDEUR D'UNE STEREOPHOTOGRAPHIE A TRAMEMUZEUS LA.1983; GEODEZIJA I KARTOGRAFIJA; ISSN 0016-7126; SUN; DA. 1983; NO 2; PP. 53-56; BIBL. 5 REF.Article

FLUORESCENCE INTENSITY RESOLUTION IN FLOW SYSTEMSMCCUTCHEON MJ; MILLER RG.1979; J. HISTOCHEM. CYTOCHEM.; USA; DA. 1979; VOL. 27; NO 1; PP. 246-249; BIBL. 15 REF.Article

ZUR ELEKTRONENSPIEGELMIKROSKOPIE IN SCHATTENABBILDUNG MIT MONOCHROMATISIERTEN ELEKTRONEN. = MICROSCOPIE ELECTRONIQUE A MIROIR AVEC ELECTRONS MONOCHROMATIQUESKUHLMANN F; HEIN U; BURKA C et al.1978; EXPER. TECH. PHYS.; DTSCH.; DA. 1978; VOL. 26; NO 3; PP. 285-295; ABS. ANGL.; BIBL. 43 REF.Article

ON THE HOLOGRAPHY BY OBJECT SCANNING.AGARWAL DC.1977; INDIAN J. THEOR. PHYS.; INDIA; DA. 1977; VOL. 25; NO 2; PP. 61-64; BIBL. 3 REF.Article

RESOLUTION TEMPORELLE DU PHOTOMULTIPLICATEUR FEHU-36KLOPIKOV EB; SVIRIDA SV; SEMENIKHIN AN et al.1982; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1982; NO 2; PP. 144-145; BIBL. 3 REF.Article

CROSSWIRES IN A GUIDING EYEPIECEDARIUS J; THOMAS PK.1981; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1981; VOL. 14; NO 6; PP. 761-765; BIBL. 67 REF.Article

DRIFT-TUBE ARRAYS FOR HIGH SPATIAL RESOLUTIONBECKER U; STEUER M; BURGER J et al.1981; NUCL. INSTRUM. METHODS; ISSN 0029-554X; NLD; DA. 1981; VOL. 180; NO 1; PP. 61-63; BIBL. 3 REF.Article

THE LIMITATIONS OF CURRENTLY USED METHODS FOR EVALUATING THE RESOLUTION OF DIFFRACTION GRATINGSVERRILL JF.1981; OPT. ACTA; ISSN 0030-3909; GBR; DA. 1981; VOL. 28; NO 2; PP. 177-185; ABS. FRE/GER; BIBL. 9 REF.Article

INSTALLATION POUR LA MESURE DE LA LIMITE DE RESOLUTION DES SYSTEMES TELESCOPIQUESOSIPOVA LP; GAJKOVICH VV.1981; OPT.-MEH. PROM.; ISSN 0030-4042; SUN; DA. 1981; NO 6; PP. 11-14; BIBL. 3 REF.Article

RELEVANCE OF RADIOGRAPHIC RESOLUTION CAPACITYREICHMANN S; ASTRAND K; STRID KG et al.1979; ACTA RADIOL., DIAGNOSIS; SWE; DA. 1979; VOL. 20; NO 4; PP. 673-680; ABS. GER/FRE; BIBL. 16 REF.Article

POUVOIR DE RESOLUTION DES ECRANS ECLAIRCIS A CRISTAUX LIQUIDESLEBEDEV VI; TOMILIN MG.1979; OPT.-MEKH. PROMYSHL.; SUN; DA. 1979; NO 3; PP. 61-62; BIBL. 7 REF.Article

UTILISATION DE LA METHODE DE REGULARISATION POUR L'ACCROISSEMENT DU POUVOIR DE RESOLUTION D'UN RADIOTELESCOPEBASISTOV YU A; GONCHARSKIJ AV; LEKHT EE et al.1979; ASTR. ZH.; SUN; DA. 1979; VOL. 56; NO 2; PP. 443-449; ABS. ENG; BIBL. 7 REF.Article

THE USE OF LOW RESOLUTION RECORDING MEDIA IN HOLOGRAPHIC INTERFEROMETRYKEPRT J.1977; ACTA UNIV. PALACK. OLOMUC., FAC. RERUM NAT.; CSK; DA. 1977; NO 53; PP. 153-159; ABS. CZE/RUS; BIBL. 5 REF.Article

EFFECTS OF SPECKLE ON RESOLUTION.KOZMA A; CHRISTENSEN CR.1976; J. OPT. SOC. AMER.; U.S.A.; DA. 1976; VOL. 66; NO 11; PP. 1257-1260; BIBL. 7 REF.Article

ENDUITS SENSIBLES AUX RX POUR LA LITHOGRAPHIE AU-DESSOUS DU MICRONALEKSANDROV YU M; VALIEV KA; VELIKOV LV et al.1983; MIKROELEKTRONIKA; ISSN 0544-1269; SUN; DA. 1983; VOL. 12; NO 1; PP. 3-10; BIBL. 12 REF.Article

LIEN ENTRE LES CARACTERISTIQUES FREQUENCE-CONTRASTE ET LE POUVOIR DE RESOLUTION VISUEL D'UN DISPOSITIF TELESCOPIQUEFEDOROVA NS; FEDOROVA GA.1980; OPT.-MEKH. PROMYSHL.; SUN; DA. 1980; NO 1; PP. 1-4Article

SUPERRESOLUTION OF SPACE-LIMITED SOURCE FIELDS BY NONUNIFORM PLANE WAVES.SCHMIDT WEINMAR HG; STEINLE B; BALTES HP et al.1979; OPTIK; DEU; DA. 1979; VOL. 52; NO 3; PP. 205-214; ABS. GER; BIBL. 19 REF.Article

OBJECTIFS DISPERSIFS SANS AIR.BAGDASAROVA OV; KHARCHENKO NI.1978; IZVEST. VYSSH. UCHEBN. ZAVED., PRIBOROSTR.; SUN; DA. 1978; VOL. 21; NO 9; PP. 112-115; BIBL. 5 REF.Article

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