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A Time-Resolved, Low-Noise Single-Photon Image Sensor Fabricated in Deep-Submicron CMOS TechnologyGERSBACH, Marek; MARUYAMA, Yuki; TRIMANANDA, Rahmadi et al.IEEE journal of solid-state circuits. 2012, Vol 47, Num 6, pp 1394-1407, issn 0018-9200, 14 p.Article

A single electron bipolar avalanche transistor implemented in 90 nm CMOSWEBSTER, Eric A. G; RICHARDSON, Justin A; GRANT, Lindsay A et al.Solid-state electronics. 2012, Vol 76, pp 116-118, issn 0038-1101, 3 p.Article

A Single-Photon Avalanche Diode in 90-nm CMOS Imaging Technology With 44% Photon Detection Efficiency at 690 nmWEBSTER, Eric A. G; RICHARDSON, Justin A; GRANT, Lindsay A et al.IEEE electron device letters. 2012, Vol 33, Num 5, pp 694-696, issn 0741-3106, 3 p.Article

Scaleable Single-Photon Avalanche Diode Structures in Nanometer CMOS TechnologyRICHARDSON, Justin A; WEBSTER, Eric A. G; GRANT, Lindsay A et al.I.E.E.E. transactions on electron devices. 2011, Vol 58, Num 7, pp 2028-2035, issn 0018-9383, 8 p.Article

Scaling Trends of Single-Photon Avalanche Diode Arrays in Nanometer CMOS TechnologyRICHARDSON, Justin A; WEBSTER, Eric A. G; GRANT, Lindsay A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8033, issn 0277-786X, isbn 978-0-8194-8607-3, 80330B.1-80330B.8Conference Paper

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