Thermal and UV annealing of irradiated pMOS dosimetric transistorsRISTIC, Goran S.Journal of physics. D, Applied physics (Print). 2009, Vol 42, Num 13, issn 0022-3727, 132101.1-132101.12Article

Influence of ionizing radiation and hot carrier injection on metal-oxide-semiconductor transistors : Neutral Beam ProcessesRISTIC, Goran S.Journal of physics. D, Applied physics (Print). 2008, Vol 41, Num 2, issn 0022-3727, 023001.1-023001.19Article

Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay methodPEJOVIC, Momcilo M; RISTIC, Goran S.Journal of physics. D, Applied physics (Print). 2000, Vol 33, Num 21, pp 2786-2790, issn 0022-3727Article

Physico-chemical processes in metal-oxide-semiconductor transistors with thick gate oxide during high electric field stressRISTIC, Goran S; PEJOVIC, Momcilo M; JAKSIC, Aleksandar B et al.Journal of non-crystalline solids. 2007, Vol 353, Num 2, pp 170-179, issn 0022-3093, 10 p.Article

Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealingRISTIC, Goran S; PEJOVIC, Momcilo M; JAKSIC, Aleksandar B et al.Applied surface science. 2006, Vol 252, Num 8, pp 3023-3032, issn 0169-4332, 10 p.Article

Fowler-Nordheim high electric field stress of power VDMOSFETsRISTIC, Goran S; PEJOVIE, Momcilo M; JAKSIC, Aleksandar B et al.Solid-state electronics. 2005, Vol 49, Num 7, pp 1140-1152, issn 0038-1101, 13 p.Article

Comparison between post-irradiation annealing and post-high electric field stress annealing of n-channel power VDMOSFETsRISTIC, Goran S; PEJOVIC, Momcilo M; JAKSIC, Aleksandar B et al.Applied surface science. 2003, Vol 220, Num 1-4, pp 181-185, issn 0169-4332, 5 p.Article

Electrical breakdown in low pressure gasesPEJOVIC, Momcilo M; RISTIC, Goran S; KARAMARKOVIC, Jugoslav P et al.Journal of physics. D, Applied physics (Print). 2002, Vol 35, Num 10, pp R91-R103, issn 0022-3727Article

Influence of tube wall material type and tube temperature on the recombination processes of nitrogen ions and atoms in afterglowPEJOVIC, Momcilo M; RISTIC, Goran S; MILOSAVLJEVIC, Cedomir S et al.Journal of physics. D, Applied physics (Print). 2002, Vol 35, Num 20, pp 2536-2542, issn 0022-3727, 7 p.Article