au.\*:("RUTHERGLEN, Chris")
Results 1 to 1 of 1
Selection :
Total-ionizing-dose effects and reliability of carbon nanotube FET devicesCHER XUAN ZHANG; EN XIA ZHANG; FLEETWOOD, Daniel M et al.Microelectronics and reliability. 2014, Vol 54, Num 11, pp 2355-2359, issn 0026-2714, 5 p.Article
