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Intensity of x-ray microbeam formed by a hollow glass pipeFURUTA, K; NAKAYAMA, Y; SHOJI, M et al.Review of scientific instruments. 1991, Vol 62, Num 3, pp 828-829, issn 0034-6748, 2 p.Article

A theoretical model for the correction of intensity aberrations in Bragg-Brentano X-ray diffractometers - detailed description of the algorithmMATULIS, C. E; TAYLOR, J. C.Journal of applied crystallography. 1993, Vol 26, pp 351-356, issn 0021-8898, 3Article

X-ray microscopy studiesSCHMAHL, G; RUDOLPH, D; NIEMANN, B et al.Optik (Stuttgart). 1993, Vol 93, Num 3, pp 95-102, issn 0030-4026Article

Resolution investigations of X-ray three-crystal diffractometersBRÜGEMANN, L; BLOCH, R; PRESS, W et al.Acta crystallographica. Section A, Foundations of crystallography. 1992, Vol 48, pp 688-692, issn 0108-7673, 5Article

Protection against goniostat collisions for the Huber 511 goniostat used in conjunction with the San Diego multiwire area detector systemLEIDICH, R; HAMILTON, P; BERNAL, V et al.Journal of applied crystallography. 1993, Vol 26, issn 0021-8898, p. 466, 3Article

A novel Guinier diffractometer with automated adjustment and settingsIHRINGER, J; RÖTTGER, K.Journal of physics. D, Applied physics (Print). 1993, Vol 26, Num 4A, pp A32-A34, issn 0022-3727Article

A laue diffractometer with δ geometryLANGE, J; BURZLAFF, H.Journal of applied crystallography. 1992, Vol 25, pp 440-443, issn 0021-8898, 3Article

High-energy resolution in X-ray scattering with the spectrometer INELAX. I: The principles and the test instrumentBURKEL, E; DORNER, B; ILLINI, T et al.Journal of applied crystallography. 1991, Vol 24, pp 1042-1050, issn 0021-8898, 6Article

Reduction of parasitic scattering in small-angle X-ray scattering by a three-pinhole collimating systemWIGNALL, G. D; LIN, J. S; SPOONER, S et al.Journal of applied crystallography. 1990, Vol 23, pp 241-245, issn 0021-8898, 4Article

Angle calculations for a vertical-axis X-ray diffractometerHSUEH-HSING HUNG.Journal of applied crystallography. 1992, Vol 25, pp 761-765, issn 0021-8898, 6Article

Microcomputer-based acquisition system for the Philips PW1050 powder diffractometerGRIGG, M. W; KEATING, A; BROCKWELL, A et al.Journal of applied crystallography. 1992, Vol 25, pp 652-653, issn 0021-8898, 5Article

Small-angle x-ray scattering/diffraction system for studies of biological and other materials at the Stanford synchroton radiation laboratoryWAKATSUKI, S; HODGSON, K. O; ELIEZER, D et al.Review of scientific instruments. 1992, Vol 63, Num 2, pp 1736-1740, issn 0034-6748Article

Design and analysis of aspherical multilayer imaging x-ray microscopeSHEALY, D. L; WU JIANG; HOOVER, R. B et al.Optical engineering (Bellingham. Print). 1991, Vol 30, Num 8, pp 1094-1099, issn 0091-3286Article

Evaluation of analytical instrumentation. VI, Wavelength dispersive X-ray spectrometersAnalytical proceedings. 1990, Vol 27, Num 12, pp 324-333, issn 0144-557XArticle

Moderate energy flash x rays with large dose-area product produced by AuroraKERRIS, K. G; AGEE, F. J; WHITTAKER, D. A et al.Journal of applied physics. 1989, Vol 65, Num 1, pp 5-8, issn 0021-8979Article

Imagerie et microscopie X = X-rays imaging and microscopyDHEZ, P.Revue pratique de contrôle industriel (1984). 1992, Vol 31, Num 176BIS, pp 64-71, issn 0766-5210Article

A new powder diffraction method for linear detectorsBENO, M. A; KNAPP, G. S.Review of scientific instruments. 1993, Vol 64, Num 8, pp 2201-2206, issn 0034-6748Article

Definition of the spatial resolution of X-ray microanalysis in thin foilsWILLIAMS, D. B; MICHAEL, J. R; GOLDSTEIN, J. I et al.Ultramicroscopy. 1992, Vol 47, Num 1-3, pp 121-132, issn 0304-3991Conference Paper

An automatic four-circle diffractometer designed for precise lattice-parameter determinationKUCHARCZYK, D; PIETRASZKO, A; ŁUKASEWICZ, K et al.Journal of applied crystallography. 1993, Vol 26, issn 0021-8898, p. 467, 3Article

Accuracy in powder diffraction II. International conferencePRINCE, E; STALICK, J. K.NIST special publication. 1992, Num 846, issn 1048-776X, 237 p.Conference Proceedings

Characterization of multilayer x-ray analyzers: models and measurementsHENKE, B. L; UEJIO, J. Y; YAMADA, H. T et al.Optical engineering (Bellingham. Print). 1986, Vol 25, Num 8, pp 937-947, issn 0091-3286Article

High-resolution imaging by Fourier transform X-ray holographyMCNULTY, I; KIRZ, J; JACOBSEN, C et al.Science (Washington, D.C.). 1992, Vol 256, Num 5059, pp 1009-1012, issn 0036-8075Article

A soft x-ray analyzer crystal-octadecyl hydrogen maleate (OHM)GUAN TIETANG; TUNG TSANG.Chinese physics. 1991, Vol 11, Num 4, pp 934-937, issn 0273-429XArticle

A Bonse-Hart ultrasmall angle x-ray scattering instrument employing synchrotron and conventional x-ray sourcesCHU, B; LI, Y; GAO, T et al.Review of scientific instruments. 1992, Vol 63, Num 9, pp 4128-4133, issn 0034-6748Article

Li-like Si soft-x-ray laser: level structure, wavelengths, and rates of the radiative transitionsZHU QIREN; PAN SHOUFU; YANG YUFEN et al.Chinese physics. 1991, Vol 11, Num 4, pp 894-896, issn 0273-429XArticle

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