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MEMOIRES MORTES OU VIVES: COMMENT LES TESTER.BOUCHET C.1980; ELECTRON. APPL. INDUSTR.; FRA; DA. 1980; NO 280; PP. 21-26Article

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Méthode pour la conception de circuits logiques en utilisant des mémoires mortesFUWA, Y; NAKAMURA, Y.Journal of the Faculty of Engineering. Shinshu University. 1986, Num 60, pp 1-14, issn 0037-3818Article

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Noise-reduction method for ROM/ACC filtersSURAKAMPONTORN, W.Electronics Letters. 1984, Vol 20, Num 21, pp 882-884, issn 0013-5194Article

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PATCHING A PROGRAM INTO A ROM MAY SEEM IMPOSSIBLE. INFACT, IT IS QUITE POSSIBLE AND CAN BE ACCOMPLISHED WITH A MINIMUM OF EXTRA CIRCUITRY.TRAVIS T.1976; ELECTRON. DESIGN; U.S.A.; DA. 1976; VOL. 24; NO 18; PP. 98-101; BIBL. 2 REF.Article

EXTENDED CYCLABILITY IN ELECTRICALLY-ALTERABLE READ-ONLY-MEMORIESDIMARIA DJ; DONG DW; FALCONY C et al.1982; ELECTRON DEVICE LETTERS; ISSN 0193-8576; USA; DA. 1982; VOL. 3; NO 7; PP. 191-195; BIBL. 15 REF.Article

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Premastered optical disk by superresolution using rear aperture detectionKASAMI, Y; YASUDA, K; ONO, M et al.Japanese journal of applied physics. 1996, Vol 35, Num 1B, pp 423-428, issn 0021-4922, 1Conference Paper