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Single-pass attenuated total reflection Fourier transform infrared spectroscopy for the prediction of protein secondary structureSMITH, Brandye M; OSWALD, Lisa; FRANZEN, Stefan et al.Analytical chemistry (Washington, DC). 2002, Vol 74, Num 14, pp 3386-3391, issn 0003-2700Article

Excitation of oblique surface electromagnetic waves at an anisotropically conducting artificial interface by means of the attenuated-total-reflection methodAVERKOV, Yuriy O; YAKOVENKO, Vladimir M.Journal of the Optical Society of America. B, Optical physics (Print). 2011, Vol 28, Num 1, pp 155-158, issn 0740-3224, 4 p.Article

Strong optical interactions between particles in a waveguideSAENZ, Juan José; GOMEZ-MEDINA, Raquel.Proceedings of SPIE, the International Society for Optical Engineering. 2005, issn 0277-786X, isbn 0-8194-5835-X, 2Vol, vol 1, 296-303Conference Paper

Characterization of x-rays emerging from between reflector and sample carrier in reflector-assisted TXRF analysisTSUJI, Kouichi; DELALIEUX, Filip.X-ray spectrometry. 2004, Vol 33, Num 4, pp 281-284, issn 0049-8246, 4 p.Conference Paper

DETERMINATION DES PARAMETRES DE QUALITE D'UNE SURFACE PAR LA METHODE DE PERTURBATION D'UNE REFLEXION TOTALE INTERNELEVIN AI.1974; IZMERITEL. TEKH.; S.S.S.R.; DA. 1974; NO 4; PP. 40-42; BIBL. 6 REF.Article

Goos-Hänchen effect of an extraordinary refracted beamPEREZ, L. I; SIMON, M. C.Journal of modern optics (Print). 2006, Vol 53, Num 7, pp 1011-1021, issn 0950-0340, 11 p.Article

Simplified attenuated total reflection apparatusVILLAGRAN, J. C; THOMPSON, J. C.Review of scientific instruments. 1989, Vol 60, Num 6, pp 1201-1202, issn 0034-6748Article

Concerning the path of light upon total reflectionWOLTER, Hans.Journal of optics. A, Pure and applied optics (Print). 2009, Vol 11, Num 9, issn 1464-4258, 090401.1-090401.7Article

Surface plasmon polaritons in attenuated total reflection systems with metamaterials: homogeneous problemZELLER, Mariana; CUEVAS, Mauro; DEPINE, Ricardo A et al.Journal of the Optical Society of America. B, Optical physics (Print). 2011, Vol 28, Num 8, pp 2042-2047, issn 0740-3224, 6 p.Article

Effects of reciprocal parameters upon a FMOCTZHENG PING WANG; CHONG KANG; XIAO YU LIU et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 659538.1-659538.6, issn 0277-786X, isbn 978-0-8194-6727-0, 2VolConference Paper

ETUDES SPECTROSCOPIQUES INFRAROUGES AVEC LE DISPOSITIF DE MULTIPLES REFLEXIONS TOTALES ATTENUEES (RTA) POUR L'UR 10/UR 20.WAGNER H.1974; REV. IENA; ALLEM.; DA. 1974; VOL. 14; NO 6; PP. 349-356; BIBL. 13 REF.Article

Loss measurement of plasmonic modes in planar metal-insulator-metal waveguides by an attenuated total reflection methodLIN, Chien-I; GAYLORD, Thomas K.Optics letters. 2010, Vol 35, Num 22, pp 3814-3816, issn 0146-9592, 3 p.Article

Unidirectional coupler for surface plasmon polariton using total external reflection of high index materialCHO, Seong-Woo; PARK, Junghyun; LEE, Byoungho et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7420, issn 0277-786X, isbn 978-0-8194-7710-1 0-8194-7710-9, 1Vol, 74200F.1-74200F.8Conference Paper

Détection amplifiée des délais de Newton-Wigner à la réflexion totale = Amplified detection of Newton-Wigner delays to total reflectionLOAS, G; BONNET, C; CHAUVAT, D et al.Journal de physique. IV. 2006, Vol 135, pp 223-225, issn 1155-4339, 3 p.Conference Paper

ETUDE DE LA LINEARITE POUR LA COURBE D'ETALONNAGE ET L'INTENSITE DANS LA METHODE DE SPECTROMETRIE DE REFLEXION TOTALE ATTENUEEMATSUI T; KURODA K; TANAKA S et al.1974; JAP. ANALYST; JAP.; DA. 1974; VOL. 23; NO 9; PP. 1062-1068; ABS. ANGL.; BIBL. 6 REF.Article

Detection of explosives traces on documents by attenuated total reflection methodBOREYSHO, A. S; BERTSEVA, E. V; KOREPANOV, V. S et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 67331W.1-67331W.10, issn 0277-786X, isbn 978-0-8194-6891-8, 1VolConference Paper

Surface plasmon polaritons of the metamaterial four-layered structuresFENG TAO; ZHANG, Hui-Fang; YANG, Xi-Hua et al.Journal of the Optical Society of America. B, Optical physics (Print). 2009, Vol 26, Num 1, pp 50-59, issn 0740-3224, 10 p.Article

Multi-segment freeform LED uniform lens with low reflective lossLIANGPING XIA; SHAOYUN YIN; XIAOCHUN DONG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7849, issn 0277-786X, isbn 978-0-8194-8379-9, 784910.1-784910.6Conference Paper

Total reflection x-ray fluorescence spectrometer with parallel primary beamKOROTKIKH, E. M.X-ray spectrometry. 2006, Vol 35, Num 2, pp 116-119, issn 0049-8246, 4 p.Article

Exploration des temps de réflexion aux interfaces = Study of reflection times at interfacesBONNET, C; LOAS, G; CHAUVAT, D et al.Journal de physique. IV. 2006, Vol 135, pp 17-24, issn 1155-4339, 8 p.Conference Paper

Self-organized liquid photonic crystalsADAMCZYK, A.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 594701.1-594701.5, issn 0277-786X, isbn 0-8194-5954-2, 1VolConference Paper

Planar waveguide-resonator: a new device for x-ray opticsEGOROV, V. K; EGOROV, E. V.X-ray spectrometry. 2004, Vol 33, Num 5, pp 360-371, issn 0049-8246, 12 p.Article

Total reflection X-ray fluorescence analysis of light elements under various excitation conditionsSTRELI, C; WOBRAUSCHEK, P; LADISICH, W et al.X-ray spectrometry. 1995, Vol 24, Num 3, pp 137-142, issn 0049-8246Article

Direct measurement of the optical Goos-Hänchen effect in lasersBRETENAKER, F; LE FLOCH, A; DUTRIAUX, L et al.Physical review letters. 1992, Vol 68, Num 7, pp 931-933, issn 0031-9007Article

Long capillary cell with the use of successive total reflection at outer cell surface for liquid absorption spectrometryTSUNODA, K.-I; NOMURA, A; YAMADA, J et al.Analytical sciences. 1988, Vol 4, Num 3, pp 321-323, issn 0910-6340Article

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