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Contact resistance to undoped and phosphorus-doped hydrogenated amorphous silicon filmsKANICKI, J.Applied physics letters. 1988, Vol 53, Num 20, pp 1943-1945, issn 0003-6951Article

Influence of the voltage contacts on the four-terminal quantized Hall resistance in the nonlinear regimeJECKELMANN, B; JEANNERET, B.IEEE transactions on instrumentation and measurement. 1997, Vol 46, Num 2, pp 276-280, issn 0018-9456Conference Paper

Contact resistance in the scanning tunneling microscope at very small distancesFERRER, J; MARTIN-RODERO, A; FLORES, F et al.Physical review. B, Condensed matter. 1988, Vol 38, Num 14, pp 10113-10115, issn 0163-1829Article

Realistic spring probe testing methods and resultsGESSEL, D; SLCOUM, A; SPRUNT, A et al.Proceedings - International Test Conference. 2002, pp 417-423, issn 1089-3539, isbn 0-7803-7542-4, 7 p.Conference Paper

Measurement of the contact resistance between the active mass and the current collector in lead/acid battery electrodesMICKA, K; CALABEK, M.Journal of power sources. 1990, Vol 30, Num 1-4, pp 315-320, issn 0378-7753Conference Paper

In Situ Measurement of the Thermal Contact Resistance of an Al Lap Joint During Braze ProcessingCORBIN, Stephen Francis; TURRIFF, Dennis M; KOZDRAS, Mark et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2014, Vol 45, Num 2, pp 835-842, issn 1073-5623, 8 p.Article

The specific contact resistance of ohmic contacts to HgTe/Hg_1-xCd_xTe heterostructuresLEECH, P. W.Journal of applied physics. 1990, Vol 68, Num 2, pp 907-909, issn 0021-8979Article

Simple model for front and end contact resistancesWINTERTON, S. S; TARR, N. G.Electronics Letters. 1989, Vol 25, Num 2, pp 117-118, issn 0013-5194, 2 p.Article

Measurement of contact resistance with microampere currentsYOSHIDA, H; TAKAHASHI, K.IEEE transactions on instrumentation and measurement. 1990, Vol 39, Num 5, pp 711-714, issn 0018-9456Article

Elastic oscillatory resistances of small contactsGARCIA, N; ESCAPA, L.Applied physics letters. 1989, Vol 54, Num 15, pp 1418-1420, issn 0003-6951Article

Thermal contact resistance between an element and a housing in an aluminum electrolytic capacitorSUZUKI, Osamu; SASAKI, Kaname; KUWAHARA, Heikichi et al.Heat transfer, Asian research. 2003, Vol 32, Num 3, pp 268-277, issn 1099-2871, 10 p.Article

A new method for measuring the conductivity of arbitrarily shaped two-dimensional samplesVAN GELDER, A. P.Physica. B, Condensed matter. 1995, Vol 204, Num 1-4, pp 149-152, issn 0921-4526Article

rapid electron beam and optical furnace alloying of AuGe/Ni contacts to GaAsNASSIBIAN, A. G; WOOD, C. E. C; FROST, M. S et al.Physica status solidi. A. Applied research. 1991, Vol 125, Num 1, pp 255-262, issn 0031-8965Article

Diagnosis of rolling-element bearings failure by localized electrical current between track surfaces of races and rolling-elementsPRASHAD, Har.Journal of tribology. 2002, Vol 124, Num 3, pp 468-473, issn 0742-4787Article

On the source of scatter in contact resistance dataWINTERTON, S. S; SMY, T. J; TARR, N. G et al.Journal of electronic materials. 1992, Vol 21, Num 9, pp 917-921, issn 0361-5235Article

Study of contact cleaning methods for relays of high contact reliabilityYOSHIDA, K.Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E. 1990, Vol 73, Num 6, pp 968-972, issn 0387-236XArticle

Molybdenum germanide ohmic contact to n-GaAsDAOUD-KETATA, K; DUBON-CHEVALLIER, C; BESOMBES, C et al.Electronics Letters. 1987, Vol 23, Num 1, pp 17-18, issn 0013-5194Article

Contact resistance of anisotropic conductive adhesivesDIVIGALPITIYA, Ranjith; HOGERTON, Peter.SPIE proceedings series. 2003, pp 471-476, isbn 0-8194-5189-4, 6 p.Conference Paper

Fundamentals of rolling resistanceHALL, David E; MORELAND, J. Cal.Rubber chemistry and technology. 2000, Vol 74, Num 3, pp 525-539, issn 0035-9475Article

Zuverlässigkeit elektromechanischer Relais = Reliability of electromechanical relaysULBRICHT, H.F & M. Feinwerktechnik, Mikrotechnik, Messtechnik. 1996, Vol 104, Num 4, pp 230-236, issn 0944-1018, 6 p.Article

Effects of Au on NiGe(Au)W ohmic contacts to n-GaAsLUSTIG, N.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1992, Vol 10, Num 3, pp 1224-1225, issn 0734-211XArticle

Alloyed contacts to susceptor rapid thermal annealed Si-implanted InPKATZ, A; PEARTON, S. J.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1991, Vol 9, Num 1, pp 178-180, issn 0734-211XArticle

Contact resistance variations of tungsten contacts operated in air and silver-tungsten carbide contacts operated in vacuumSLADE, P. G; BINDAS, J. A.IEEE transactions on components, hybrids, and manufacturing technology. 1991, Vol 14, Num 1, pp 2-7, issn 0148-6411Conference Paper

A study of contact failure mechanism at low electrical loadYOSHIDA, K; MOTOYAMA, A.Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E. 1990, Vol 73, Num 6, pp 973-977, issn 0387-236XArticle