3D optical microscopy using digital holographySTERN, A; JAVIDI, Bahram.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6983, pp 69830O.1-69830O.9, issn 0277-786X, isbn 978-0-8194-7181-9 0-8194-7181-XConference Paper

Lateral resolution in elastographyRIGHETTI, Raffaella; SRINIVASAN, Seshadri; OPHIR, Jonathan et al.Ultrasound in medicine & biology. 2003, Vol 29, Num 5, pp 695-704, issn 0301-5629, 10 p.Article

Torsional resonance mode magnetic force microscopy: enabling higher lateral resolution magnetic imaging without topography-related effectsKAIDATZIS, A; GARCIA-MARTIN, J. M.Nanotechnology (Bristol. Print). 2013, Vol 24, Num 16, issn 0957-4484, 165704.1-165704.7Article

Theory & applications of multi-beam OCTHOLMES, Jon.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7139, issn 0277-786X, isbn 978-0-8194-7380-6, 1Vol, 713908.1-713908.7Conference Paper

Mechanical properties of biological specimens explored by atomic force microscopyKASAS, S; LONGO, G; DIETLER, G et al.Journal of physics. D, Applied physics (Print). 2013, Vol 46, Num 13, issn 0022-3727, 133001.1-133001.12Article

2mm catheter design for endoscopic optical coherence tomographyLEE, Kye-Sung; KOEHLER, Chuck; JOHNSON, Eric G et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6427-9, Part 1, 63420F.1-63420F.9Conference Paper

Ultra high performance microscope objectives - : The state of the art in design, manufacturing and testingSURE, Thomas; DANNER, Lambert; EUTENEUER, Peter et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6427-9, Part 1, 63420E.1-63420E.13Conference Paper

Lateral resolution beyond diffraction limit using 40 kHz air-coupled ultrasonic systemsIMANO, K; NISHIHIRA, M; SASAKI, K et al.Electronics Letters. 2005, Vol 41, Num 10, pp 620-622, issn 0013-5194, 3 p.Article

Resolution of aplanatic solid immersion lens based microscopyRUI CHEN; AGARWAL, Krishna; SHEPPARD, Colin J. R et al.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2012, Vol 29, Num 6, pp 1059-1070, issn 1084-7529, 12 p.Article

A curvature sensor using white-light scanning interferometryKIM, Byoungchang; KIM, Seheon; KWON, Yongkwan et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 629219.1-629219.8, issn 0277-786X, isbn 0-8194-6371-X, 1VolConference Paper

Traceable multiple sensor system for absolute form measurementSCHULZ, Michael; GERHARDT, Joachim; GECKELER, Ralf D et al.SPIE proceedings series. 2005, pp 58780A.1-58780A.8, isbn 0-8194-5883-X, 1VolConference Paper

Estimation of lateral resolution in scanning hot electron microscopyKOBAYASHI, D; FURUYA, K; KIKEGAWA, N et al.Japanese journal of applied physics. 1997, Vol 36, Num 7A, pp 4472-4473, issn 0021-4922, 1Article

Optical probe using eccentric optics for optical coherence tomographyTAKAHASHI, Yoshiyuki; IWAYA, Mitsuharu; WATANABE, Yuuki et al.Optics communications. 2007, Vol 271, Num 1, pp 285-290, issn 0030-4018, 6 p.Article

Numerical simulations of volume holographic imaging system resolution characteristicsSUN YAJUN; JIANG ZHUQING; LIU SHAOJIE et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7284, issn 0277-786X, isbn 978-0-8194-7544-2 0-8194-7544-0, 1Vol, 72840T.1-72840T.5Conference Paper

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Spectroscopie Auger :Principes et performances en sonde fixe = Auger spectroscopy : Principles and performances with a fixed probeCAZAUX, Jacques.Techniques de l'ingénieur. Analyse et caractérisation. 2007, Vol TA3, Num P2620v2, issn 1762-8717, P2620v2.1-P2620v2.19Article

Suppressing vibration errors in phase-shifting interferometryDECK, Leslie L.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 670402.1-670402.7, issn 0277-786X, isbn 978-0-8194-6852-9, 1VolConference Paper

One-shot line-profiling white light interferometer with spatial phase shift for measuring rough surfacesHERING, M; HERRMANN, S; BANYAY, M et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 61880E.1-61880E.11, issn 0277-786X, isbn 0-8194-6244-6, 1VolConference Paper

Development of a laser range finder using the phase difference methodYOON, Heesun; PARK, Kyihwan.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60490R.1-60490R.8, issn 0277-786X, isbn 0-8194-6065-0, 1VolConference Paper

The nuclear microprobe as a complementary technique to X-ray microscopyMORETTO, Ph.Journal de physique. IV. 2003, Vol 104, issn 1155-4339, p. 161Conference Paper

The effect of speed of sound in ultrasound test objects on lateral resolutionDUDLEY, Nicholas J; GIBSON, Nicholas M; FLECKNEY, Mark J et al.Ultrasound in medicine & biology. 2002, Vol 28, Num 11-12, pp 1561-1564, issn 0301-5629, 4 p.Article

Wide view-angle imaging obtained by compouding multidirection images through a narrow windowSHIKANO, K; YOSHIZAWA, M; TAGAWA, N et al.Japanese journal of applied physics. 1995, Vol 34, Num 5B, pp 2849-2853, issn 0021-4922, 1Conference Paper

Holographic axilens : high resolution and long focal depthDAVIDSON, N; FRIESEM, A. A; HASMAN, E et al.Optics letters. 1991, Vol 16, Num 7, pp 523-525, issn 0146-9592Article

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Increment of lateral resolution in digital holography by speckle noise removalMONROY, Freddy Alberto; GARCIA-SUCERQUIA, Jorge.Optik (Stuttgart). 2010, Vol 121, Num 22, pp 2049-2052, issn 0030-4026, 4 p.Article