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Results 1 to 25 of 1006

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Numerical simulations of X-ray rocking curves in multiple-crystal arrangementsBOROWSKI, J; GRONKOWSKI, J; SALAMONIK, R et al.Journal of alloys and compounds. 2005, Vol 401, Num 1-2, pp 212-216, issn 0925-8388, 5 p.Conference Paper

Laser-based assessment of optical interference filters with sharp spectral edges and high optical densityZITER, Mark; CARVER, Gary; LOCKNAR, Sarah et al.Surface & coatings technology. 2014, Vol 241, pp 54-58, issn 0257-8972, 5 p.Conference Paper

Triple Laue-rocking curves and wide slit diffraction of neutronsRAUCH, H; KISCHKO, U; PETRASCHECK, D et al.Zeitschrift für Physik. B, Condensed matter. 1983, Vol 51, Num 1, pp 11-15, issn 0722-3277Article

Ultrasound adjustable Laue-Laue double-crystal x-ray monochromatorPOLIKARPOV, I; PANOV, V. V.Journal of physics. D, Applied physics (Print). 1999, Vol 32, Num 16, pp 2083-2086, issn 0022-3727Article

A new approach for mapping x-ray rocking curvesDACHAO GAO; DAVIS, T. J; WILKINS, S. W et al.Review of scientific instruments. 1993, Vol 64, Num 7, pp 1831-1834, issn 0034-6748Article

A comment on the calculation of rocking curves near the critical voltage in electron diffractionDAVID, M; GEVERS, R; STUMPP, H et al.Acta crystallographica. Section A, Crystal physics, diffraction, theoretical and general crystallography. 1985, Vol 41, Num 2, pp 204-206, issn 0567-7394Article

Reflection high-energy positron diffraction study of a Si(001) surfaceHAYASHI, K; FUKAYA, Y; KAWASUSO, A et al.Applied surface science. 2005, Vol 244, Num 1-4, pp 145-148, issn 0169-4332, 4 p.Conference Paper

Investigation of multislice RHEED calculationsGOTSIS, H. J; MAKSYM, P. A.Surface science. 1997, Vol 385, Num 1, pp 15-23, issn 0039-6028Article

Synchrotron X-ray diffraction studies of silicon implanted with high-energy Ar ions after thermal annealingWIERZCHOWSKI, W; WIETESKA, K; AULEYTNER, J et al.Journal of alloys and compounds. 2004, Vol 382, pp 146-152, issn 0925-8388, 7 p.Conference Paper

Measurements of Piezoelectric Coefficient of Pulsed-DC Sputtered AIN Thin Films by Piezoresponse Force MicroscopyCHERNG, J. S; CHEN, T. Y.Ferroelectrics (Print). 2010, Vol 408, pp 41-47, issn 0015-0193, 7 p.Conference Paper

Wave fields in Si(111) layers under RHEED conditionsHORIO, Y; ICHIMIYA, A.Surface science. 1996, Vol 348, Num 3, pp 344-358, issn 0039-6028Article

Description of multiple-crystal diffraction including asymmetric reflectionsBERGER, H.Physica status solidi. A. Applied research. 1994, Vol 143, Num 2, pp 223-232, issn 0031-8965Article

'Exact' formulation for π-polarization waves of dynamical X-ray diffractionWONDONG CHO; XIANRONG HUANG; DUDLEY, Michael et al.Acta crystallographica. Section A, Foundations of crystallography. 2004, Vol 60, pp 195-197, issn 0108-7673, 3 p., 2Article

Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. II. Experimental studiesZHONG, Z; KAO, C. C; SIDDONS, D. P et al.Journal of applied crystallography. 2001, Vol 34, pp 646-653, issn 0021-8898, 5Article

Effect of surface plasmons on energy filtered RHEED rocking curves from a Si(111)-7×7 surfaceHARA, S; WATANABE, K; HORIO, Y et al.Physica status solidi. A. Applied research. 1999, Vol 176, Num 2, pp 925-936, issn 0031-8965Article

The X-ray rocking curve near absorption edgesKANAMARU, T; KURIBAYASHI, M; ISHIDA, K et al.Journal of the Physical Society of Japan. 1995, Vol 64, Num 9, pp 3529-3536, issn 0031-9015Article

Relative absorption correction for rotation film dataSCHUTT, C. E; EVANS, P. R.Acta crystallographica. Section A, Foundations of crystallography. 1985, Vol 41, Num 6, pp 568-570, issn 0108-7673Article

Rocking curve peak shift in thin semiconductor layersWIE, C. R.Journal of applied physics. 1989, Vol 66, Num 2, pp 985-988, issn 0021-8979, 4 p.Article

The dynamics of rocking curves in strained (001) Si crystals undergoing ultrasonic excitationSANDER, B; ZOLOTYABKO, E; KOMEM, Y et al.Journal of physics. D, Applied physics (Print). 1995, Vol 28, Num 4A, pp A287-A290, issn 0022-3727Conference Paper

An assessment of diamond turning for the production of silicon X-ray optical elementsMERIAM ABDUL GANI, S; TANNER, B. K; MCKENNEY, T. G et al.Journal of applied crystallography. 1984, Vol 17, Num 2, pp 111-117, issn 0021-8898Article

Study on the orientation degree of Pb1-xLaxTiO3 thin films by the rocking curve technique and its morphological aspectsRANGEL, J. H. G; BERNARDI, M. I. B; PASKOCIMAS, C. A et al.Surface & coatings technology. 2007, Vol 201, Num 14, pp 6345-6351, issn 0257-8972, 7 p.Article

High-precision determination of structure factors Fh of siliconTEWORTE, R; BONSE, U.Physical review. B, Condensed matter. 1984, Vol 29, Num 4, pp 2102-2108, issn 0163-1829Article

Observation of RHEED rocking curves during Si/Si (111) film growthSHIGETA, Y; FUKAYA, Y; MITSUI, H et al.Surface science. 1998, Vol 402-04, pp 313-317, issn 0039-6028Conference Paper

X-ray two-crystal diffraction with simultaneous registration of rocking curves of AgKα and NiKα radiationDRESSLER, L; BARTH, U.Physica status solidi. A. Applied research. 1994, Vol 141, Num 2, pp 285-293, issn 0031-8965Article

Abeles-Takagi approach for dynamic x-ray rocking curve analysis of superlattice structuresSHRIVASTAVA, M. C; SWAMINATHAN, S.Semiconductor science and technology. 1989, Vol 4, Num 6, pp 495-497, issn 0268-1242, 3 p.Article

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