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Results 1 to 25 of 66

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Engineering of hydrophilic and plasmonic properties of Ag thin film by atom beam irradiationSINGH, Udai B; AGARWAL, D. C; KHAN, S. A et al.Applied surface science. 2011, Vol 258, Num 4, pp 1464-1469, issn 0169-4332, 6 p.Article

Genetic algorithm-based characterization of the optical properties of flame-hydrolysis deposited silica waveguidesGARCIA-BLANCO, Sonia; ALFARO-CID, Eva; DE LA RUE, Richard M et al.Journal of lightwave technology. 2004, Vol 22, Num 12, pp 2801-2807, issn 0733-8724, 7 p.Article

Hydrogen desorption from a diamond-like carbon film by hyperthermal atomic oxygen exposureYOKOTA, Kumiko; TAGAWA, Masahito; KITAMURA, Akira et al.Applied surface science. 2009, Vol 255, Num 13-14, pp 6710-6714, issn 0169-4332, 5 p.Article

Thermoelectric properties of MeV Si ion bombarded Bi2Te3/Sb2Te3 superlattice deposited by magnetron sputteringZHENG, B; XIAO, Z; CHHAY, B et al.Surface & coatings technology. 2009, Vol 203, Num 17-18, pp 2682-2686, issn 0257-8972, 5 p.Conference Paper

Growth of Bi-Sb alloy thin films and their characterization by TEM, PIXE and RBSRAMESH CHANDRA MALLIK; DAMODARA DAS, V.Solid state communications. 2005, Vol 134, Num 3, pp 211-216, issn 0038-1098, 6 p.Article

Crystalline silicon films sputtered on molybdenum. A study of the silicon-molybdenum interfaceREINIG, P; FENSKE, F; FUHS, W et al.Applied surface science. 2003, Vol 210, Num 3-4, pp 301-306, issn 0169-4332, 6 p.Article

Compositional transition layer in SiO2/Si interface observed by high-resolution RBSKIMURA, Kenji; NAKAJIMA, Kaoru.Applied surface science. 2003, Vol 216, Num 1-4, pp 283-286, issn 0169-4332, 4 p.Conference Paper

Effect of oblique-angle deposition on early stage of Fe-Si growthHARADA, Hidehiko; JOMORI, Shinji; SUZUKI, Motofumi et al.Thin solid films. 2007, Vol 515, Num 22, pp 8277-8280, issn 0040-6090, 4 p.Conference Paper

Reaction of implanted N isotope with SiO2 near Si3N4-film and SiO2-substrate interfaceSHINDE, Ninad; MATSUNAMI, Noriaki; FUKUOKA, Osamu et al.Journal of Nuclear Science and Technology. 2006, Vol 43, Num 4, pp 382-385, issn 0022-3131, 4 p.Conference Paper

Rbs investigation of ion implanted Si-SiO2 structures irradiated with 20 MeV electronsKASCHIEVA, Sonia B; ANGELOV, Christo V; DMITRIEV, Sergey N et al.Plasma processes and polymers (Print). 2006, Vol 3, Num 2, pp 233-236, issn 1612-8850, 4 p.Conference Paper

Sorption mechanism of europium by apatite using Rutherford backscattering spectroscopy and resonant nuclear reaction analysisOHNUKI, T; KOZAI, N; ISOBE, H et al.Journal of Nuclear Science and Technology. 1997, Vol 34, Num 1, pp 58-62, issn 0022-3131Article

Bi- or multi-modal distribution of ion-implanted bismuth in fused silicaPARK, S. Y; WEEKS, R. A; ZUHR, R. A et al.Journal of non-crystalline solids. 1995, Vol 191, Num 3, pp 281-292, issn 0022-3093Article

Analytical techniques with a nuclear microprobeADAMCZEWSKI, J; RÖCKEN, H; MEIJER, J et al.Fresenius' journal of analytical chemistry. 1995, Vol 353, Num 5-8, pp 585-588, issn 0937-0633Conference Paper

Investigation of copper patinas using ion beam analysis and scanning electron microscopyNOLI, F; MISAELIDES, P; PAVLIDOU, E et al.Surface and interface analysis. 2005, Vol 37, Num 3, pp 288-293, issn 0142-2421, 6 p.Article

Formation of As enriched layer by steam oxidation of As+-implanted SiBAGHIZADEH, A; AGHA-ALIGOL, D; FATHY, D et al.Applied surface science. 2009, Vol 255, Num 11, pp 5857-5860, issn 0169-4332, 4 p.Article

Oxidation states of molybdenum in oxide films formed in sulphuric acid and sodium hydroxideOKONKWO, I. A; DOFF, J; BARON-WIECHEC, A et al.Thin solid films. 2012, Vol 520, Num 19, pp 6318-6327, issn 0040-6090, 10 p.Article

Diffusion during annealing of Al/Cu/Fe thin filmsCEKADA, M; PANJAN, P; DOLINSEK, J et al.Thin solid films. 2007, Vol 515, Num 18, pp 7135-7139, issn 0040-6090, 5 p.Article

Characterization of ion beam deposited 107Ag thin films on Si(111) surface by means of rutherford backscattering spectroscopy and reflection high energy electron diffractionASAI, Takahiro; TAKEUCHI, Masanori; URANO, Akihiro et al.Journal of Nuclear Science and Technology. 2006, Vol 43, Num 4, pp 386-390, issn 0022-3131, 5 p.Conference Paper

Subsurface structures in initial stage of FeSi2 growth studied by high-resolution rutherford backscattering spectroscopySUZUKI, Motofumi; KINOSHITA, Kohei; JOMORI, Shinji et al.Thin solid films. 2007, Vol 515, Num 22, pp 8281-8284, issn 0040-6090, 4 p.Conference Paper

Measurement of epitaxial misorientations and related effects in thin films of YBa2Cu3O7-δ grown on nominally (001)MgO substrates by pulsed laser depositionMORRIS, D. J; AINDOW, M.Thin solid films. 2003, Vol 423, Num 1, pp 33-40, issn 0040-6090, 8 p.Article

Structural analysis of chalcogenide waveguides using Rutherford backscattering spectroscopyRIVERO, C; SHAREK, P; LI, W et al.Thin solid films. 2003, Vol 425, Num 1-2, pp 59-67, issn 0040-6090, 9 p.Article

A study of the deposition process of multilayer coatings on the inner tube surface with the pulsed laser deposition techniqueLOZOVAN, A. A; ALEXANDROVA, S. S; MISHNEV, M. A et al.Journal of alloys and compounds. 2014, Vol 586, issn 0925-8388, S387-S390, SUP1Conference Paper

Chromium oxide-based multilayer coatings deposited by reactive magnetron sputtering in an industrial setupEKLUND, P; MIKKELSEN, N.-J; SILLASSEN, M et al.Surface & coatings technology. 2008, Vol 203, Num 1-2, pp 156-159, issn 0257-8972, 4 p.Article

The formation of low-dimensional structures by compressive plasma flowsUGLOV, V. V; ANISHCHIK, V. M; KVASOV, N. T et al.Surface & coatings technology. 2005, Vol 200, Num 1-4, pp 297-300, issn 0257-8972, 4 p.Conference Paper

Correlation between resistivity and oxygen vacancy of hydrogen-doped indium tin oxide thin filmsOKADA, Koichi; KOHIKI, Shigemi; SUNING LUO et al.Thin solid films. 2011, Vol 519, Num 11, pp 3557-3561, issn 0040-6090, 5 p.Article

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