au.\*:("SAKA, Takashi")
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Effects of torsions on the integrated intensity of diffracted X-rays from silicon crystalsSAKA, Takashi.Journal of applied crystallography. 2005, Vol 38, pp 958-963, issn 0021-8898, 6 p., 6Article
A sensitive method to detect strain in silicon crystals using X-ray dynamical diffractionSAKA, Takashi.Journal of applied crystallography. 2003, Vol 36, pp 249-254, issn 0021-8898, 6 p., 2Article
Highly spin-polarized electron photocathode based on GaAs-GaAsP superlattice grown on mosaic-structured buffer layerXIUGUANG JIN; MAEDA, Yuya; OKUMI, Shoji et al.Journal of crystal growth. 2008, Vol 310, Num 23, pp 5039-5043, issn 0022-0248, 5 p.Conference Paper
Analysis of thickness modulation in GaAs/GaAsP strained superlattice by TEM observationXIUGUANG JIN; NAKAHARA, Hirotaka; SAITOH, Koh et al.Journal of crystal growth. 2012, Vol 353, Num 1, pp 84-87, issn 0022-0248, 4 p.Article