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Théories de la modernité économique| autour de K. PolanyiPOLANYI, C; SALSANO, A; BERTHOUD, G et al.Bulletin du MAUSS. 1986, Num 18, pp 3-137Article

Grain boundaries as possible origin of flicker noise in GaP polycrystalline materialD'AMICO, A; PETROCCO, G; STOCHINO, G et al.Physica status solidi. A. Applied research. 1983, Vol 76, Num 2, pp K125-K129, issn 0031-8965Article

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Data integrity evaluations of reed solomon codes for storage systemsCARDARILLI, G. C; OTTAVI, M; PONTARELLI, S et al.IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. 2004, pp 158-164, isbn 0-7695-2241-6, 1Vol, 7 p.Conference Paper

Monitoring methodology for tid damaging of SDRAM devices based on retention time analysisBERTAZZONI, S; DI GIOVENALE, D; SALMERI, M et al.IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. 2004, pp 106-110, isbn 0-7695-2241-6, 1Vol, 5 p.Conference Paper