au.\*:("SAMANTA, Piyas")
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Comparison of electrical stress-induced charge carrier generation/trapping and related degradation of SiO2 and HfO2/SiPO2 gate dielectric stacksSAMANTA, Piyas; CHUNXIANG ZHU; MANSUN CHAN et al.Microelectronics and reliability. 2010, Vol 50, Num 12, pp 1907-1914, issn 0026-2714, 8 p.Article
Experimental evidence of two conduction mechanisms for direct tunnelling stress-induced leakage current through ultrathin silicon dioxide gate dielectricsSAMANTA, Piyas; TSZ YIN MAN; CHAN, Alain Chun Keung et al.Semiconductor science and technology. 2006, Vol 21, Num 10, pp 1393-1401, issn 0268-1242, 9 p.Article