INTRODUCTION DE CIRCUITS A TRES HAUTE INTEGRATION ET PROGRAMMES DANS LES EQUIPEMENTS A HAUTE SURETE DE FONCTIONNEMENTSAUCIER G.1983; REVUE GENERALE DES CHEMINS DE FER; ISSN 0035-3183; FRA; DA. 1983-06; VOL. 102; PP. 327-332; BIBL. 9 REF.Conference Paper

CONCEPTION DESCENDANTE ET CHOIX DE L'ARCHITECTURE DES CIRCUITS A TRES HAUTE INTEGRATIONSAUCIER G.1982; R.A.I.R.O. AUTOMATIQUE; ISSN 0399-0524; FRA; DA. 1982; VOL. 16; NO 3; PP. 233-257; ABS. ENG; BIBL. 25 REF.Article

LES PERSPECTIVES DANS LE DOMAINE DU TEST ET DE LA TESTABILITE DES CIRCUITS A TRES HAUTE INTEGRATIONSAUCIER G.1982; ONDE ELECTRIQUE; ISSN 0030-2430; FRA; DA. 1982; VOL. 62; NO 3; PP. 76-87; ABS. ENG; BIBL. 36 REF.Article

Replicable item-cluster subcomponents in the NEO Five-Factor InventorySAUCIER, G.Journal of personality assessment. 1998, Vol 70, Num 2, pp 263-276, issn 0022-3891Article

Mini-markers : a brief version of Goldberg's unipolar big-five markersSAUCIER, G.Journal of personality assessment. 1994, Vol 63, Num 3, pp 506-516, issn 0022-3891Article

Separating description and evaluation in the structure of personality attributesSAUCIER, G.Journal of personality and social psychology. 1994, Vol 66, Num 1, pp 141-154, issn 0022-3514Article

Implantation automatisée de circuits intégrés = Automatic layant of integrated circuitsSAUCIER, G.Onde électrique. 1985, Vol 65, Num 6, pp 69-84, issn 0030-2430Article

PROTECTION AGAINST EXTERNAL ERRORS IN A DEDICATED SYSTEMBELLON C; SAUCIER G.1982; IEEE TRANS. COMPUT.; ISSN 0018-9340; USA; DA. 1982; VOL. 31; NO 4; PP. 311-317; BIBL. 15 REF.Article

Isms and the structure of social attitudesSAUCIER, G.Journal of personality and social psychology. 2000, Vol 78, Num 2, pp 366-385, issn 0022-3514Article

Benchmarks : integrating affective and interpersonal circles with the big-five personality factorsSAUCIER, G.Journal of personality and social psychology. 1992, Vol 62, Num 6, pp 1025-1035, issn 0022-3514Article

LE TEST DES MICROPROCESSEURS ET DES SYSTEMES A MICROPROCESSEURS: ETAT DE L'ART ET PERSPECTIVESROBACH C; SAUCIER G.1981; ONDE ELECTR.; ISSN 0030-2430; FRA; DA. 1981; VOL. 61; NO 3; PP. 25-30; ABS. ENG; BIBL. 35 REF.Article

TEST, CONTAMINATION ET REPRISE DANS LES SYSTEMES DISTRIBUEES A HAUTE DISPONIBILITEBELLON C; SAUCIER G.1978; MATH. APPL. INFORMAT., RAPP. RECH.; FRA; DA. 1978; NO 129; PP. 1-25; BIBL. 12 REF.Serial Issue

Effects of variable selection on the factor structure of person descriptorsSAUCIER, G.Journal of personality and social psychology. 1997, Vol 73, Num 6, pp 1296-1312, issn 0022-3514Article

AUTOMATISMES COMPLEXES A MICROPROCESSEURS. CONCEPTION ET SURETE DE FONCTIONNEMENT. I: CONCEPTION SURE D'AUTOMATISMES COMPLEXES A MICROPROCESSEURSPILAUD D; SAUCIER G.1979; REV. GEN. ELECTR.; FRA; DA. 1979; VOL. 88; NO 12; PP. 921-929; BIBL. 7 REF.Article

LA TOLERANCE AUX PANNES DANS LES SYSTEMES A MICROPROCESSEURSSAUCIER G; BELLON C.1979; MICROPROCESSEURS, UN OUTIL POUR LE FUTUR. JOURNEES D'ELECTRONIQUE 1979/1979/LAUSANNE; CHE; LAUSANNE: EPFL; DA. 1979; PP. 145-166; BIBL. 1 P.Conference Paper

Openness versus intellect : much ado about nothing?SAUCIER, G.European journal of personality. 1992, Vol 6, Num 5, pp 381-386, issn 0890-2070Article

CONCEPTION DE SEQUENCEURSAMBLARD P; SAUCIER G.1981; ONDE ELECTR.; ISSN 0030-2430; FRA; DA. 1981; VOL. 61; NO 5; PP. 25-34; ABS. ENG; BIBL. 14 REF.Article

TEST ET FIABILITE DES MICROPROCESSEURSROBACH C; SAUCIER G.1980; COLLOQUE INTERNATIONAL SUR LA FIABILITE ET LA MAINTENABILITE. 2/1980-09-08/PERROS-GUIREC, TREGASTEL; FRA; LANNION: CENTRE DE FIABILITE DU CENTRE NATIONAL D'ETUDES DES TELECOMMUNICATIONS; DA. 1980; PP. 13-18; ABS. ENG; BIBL. 10 REF.Conference Paper

DYNAMIC TESTING OF CONTROL UNITS = ESSAIS DYNAMIQUES D'UNITES DE COMMANDEROBACH C; SAUCIER G.1978; I.E.E.E. TRANS. COMPUTERS; USA; DA. 1978; VOL. 27; NO 7; PP. 617-623; BIBL. 13 REF.Article

ON LINE TEST MODELING IN NAR-REDUNDANT DISTRIBUTED SYSTEMS.BELLON C; SAUCIER G.1977; IN: FTCS-7. ANNU. INT. CONF. FAULT-TOLERANT COMPUT. 7; LOS ANGELES; 1977; NEW YORK; INST. ELECTR. ELECTRON. ENG.; DA. 1977; PP. 94-102; BIBL. 8 REF.Conference Paper

PROCESSOR TESTABILITY AND DESIGN CONSEQUENCES.ROBACH C; SAUCIER G; LEBRUN J et al.1976; I.E.E.E. TRANS. COMPUTERS; U.S.A.; DA. 1976; VOL. 25; NO 6; PP. 645-652; BIBL. 12 REF.Article

LE TEST FONCTIONNEL PARAMETRABLE DE MICROPROCESSEURROBACH C; SAUCIER G; VELAZCO R et al.1980; R.A.I.R.O., AUTOMAT.; FRA; DA. 1980; VOL. 14; NO 3; PP. 293-308; BIBL. 8 REF.Article

MICROPROCESSOR SYSTEM TESTING, A REVIEW AND FUTURE PROSPECTSROBACH C; SAUCIER G; ALEONARD C et al.1979; EUROMICRO J.; NLD; DA. 1979; VOL. 5; NO 1; PP. 31-37; BIBL. 22 REF.Article

CONCEPTION D'UN SEQUENCEUR DE MICROPROCESSEURBELLON C; SAUCIER G; ZAHND J RAPP et al.1981; R.A.I.R.O. AUTOM.; ISSN 0399-0524; FRA; DA. 1981; VOL. 15; NO 2; PP. 131-158; ABS. ENG; BIBL. 3 REF.Article

Using cone structures for circuit partitioning into FPGA packagesBRASEN, D. R; SAUCIER, G.IEEE transactions on computer-aided design of integrated circuits and systems. 1998, Vol 17, Num 7, pp 592-600, issn 0278-0070Article