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APPLICATIONS OF ACOUSTIC MICROSCOPY IN THE SEMICONDUCTOR INDUSTRYMILLER AJ.1982; ACOUSTICAL IMAGING; ISSN 0270-5117; USA; DA. 1982; VOL. 12; PP. 67-78; BIBL. 8 REF.Conference Paper

SINGLE LENS TRANSMISSION SCANNING ACOUSTIC MICROSCOPEMOROZOV AI; KULAKOV MA.1980; ELECTRON LETTERS; GBR; DA. 1980; VOL. 16; NO 15; PP. 596-597; BIBL. 8 REF.Article

ACOUSTIC MICROSCOPY WITH MICROWAVE FREQUENCIESATALAR A; JIPSON V; KOCH R et al.1979; ANNU. REV. MATER. SCI.; USA; DA. 1979; VOL. 9; PP. 255-281; BIBL. 30 REF.Article

ON THE ABSORBED CURRENT IMAGE IN A SCANNING ELECTRON MICROSCOPE.ROMEU LD; YACAMAN MJ.1976; REV. MEX. FIS.; MEX.; DA. 1976; VOL. 25; NO 1; PP. 23-30; ABS. ESP.; BIBL. 4 REF.Article

DARK FIELD ACOUSTIC MICROSCOPYSINCLAIR DA; SMITH IR.1980; ELECTRON. LETTERS; GBR; DA. 1980; VOL. 16; NO 16; PP. 627-629; BIBL. 7 REF.Article

SCANNING ACOUSTIC MICROSCOPE OPERATING IN THE REFLECTION MODENONGAILLARD B; ROUVAEN JM; BRIDOUX E et al.1980; ACOUST. IMAG.; USA; DA. 1980; VOL. 8; PP. 629-639; BIBL. 4 REF.Conference Paper

ACOUSTIC MICROSCOPY OF INTERIOR PLANESJIPSON VB.1979; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1979; VOL. 35; NO 5; PP. 385-387; BIBL. 6 REF.Article

CHARACTERISTIC MATERIAL SIGNATURES BY ACOUSTIC MICROSCOPY.WEGLEIN RD; WILSON RG.1978; ELECTRON, LETTERS; G.B.; DA. 1978; VOL. 14; NO 12; PP. 352-354; BIBL. 4 REF.Article

GRAY SCALE FOR SCANNING ACOUSTIC MICROSCOPYWEGLEIN RD.1978; ELECTRON. LETTERS; GBR; DA. 1978; VOL. 14; NO 20; PP. 656-657; BIBL. 4 REF.Article

A DESCRIPTION OF THE BELL LABORATORIES SCANNED ACOUSTIC MICROSCOPESULEWSKI P; BISHOP DJ; DYNES RC et al.1982; BELL SYSTEM TECHNICAL JOURNAL; ISSN 0005-8580; USA; DA. 1982; VOL. 61; NO 9; PART. 1; PP. 2167-2183; BIBL. 5 REF.Article

FRINGE PATTERN AROUND SURFACE CRACK OBSERVED WITH SCANNINGS ACOUSTIC MICROSCOPEYAMANAKA K; ENOMOTO Y.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 18; PP. 638-640; BIBL. 8 REF.Article

MICROSCOPE ACOUSTIQUE A BALAYAGE.ATTAL J; GAILLARD S; ORTEGA J et al.1977; DGRST-7671466; FR.; DA. 1977; PP. 1-13; H.T. 7; ABS. ANGL.; BIBL. 1 P.; (RAPP. FINAL, ACTION CONCERTEE: GEN. BIOL. MED.)Report

DICHROMATIC DIFFERENTIAL PHASE CONTRAST MICROSCOPYSMITH IR; KUMAR WICKRAMASINGHE H.1982; IEEE TRANS. SONICS ULTRASON.; ISSN 0018-9537; USA; DA. 1982; VOL. 29; NO 6; PP. 321-326; BIBL. 13 REF.Article

RASTERELEKTRONENMIKROSKOPIE I EIN VERFAHREN ZUR UNTERSUCHUNG FESTER OBERFLAECHEN = MICROSCOPIE ELECTRONIQUE A BALAYAGE: UNE METHODE D'ETUDE DES SURFACES SOLIDESSCHAEFER W; NIEDERAUER K.1982; MESS. + PRUEF.; ISSN 0026-0339; DEU; DA. 1982; NO 11; PP. 744-748Article

APPLICATION OF SCANNING ACOUSTIC MICROSCOPE TO THE STUDY OF FRACTURE AND WEARYAMANAKA K; ENOMOTO Y; TSUYA Y et al.1982; ACOUSTICAL IMAGING; ISSN 0270-5117; USA; DA. 1982; VOL. 12; PP. 79-87; BIBL. 9 REF.Conference Paper

SCANNING TRANSMISSION ELECTRON MICROSCOPY: MICROANALYSIS FOR THE MICROELECTRONIC AGEBROWN LM.1981; J. PHYS. F; ISSN 0305-4608; GBR; DA. 1981; VOL. 11; NO 1; PP. 1-26; BIBL. 2 P.Article

MICROSCOPE ELECTRONIQUE A BALAYAGE COMME SYSTEME TVGOLUBEV VP.1981; RADIOTEKH. I ELEKTRON.; SUN; DA. 1981; VOL. 26; NO 4; PP. 826-833; BIBL. 6 REF.Article

PERFECTIONNEMENT DU SYSTEME OPTIQUE ELECTRONIQUE DU MICROSCOPE ELECTRONIQUE A BALAYAGE REHM-200UDAL'TSOV VI; KUSHKOV VD; KOZLOV IS et al.1981; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1981; NO 3; PP. 206-208Article

MISE EN OEUVRE DU MICROSCOPE ELECTRONIQUE A BALAYAGE SPECIAL. EXEMPLES D'APPLICATIONWALDBACH H; HOEPPNER D.1980; REV. IENA; ISSN 0373-9317; DDR; DA. 1980; VOL. 20; NO 2; PP. 86-87Article

CONTRAST AND IMAGING PERFORMANCE IN THE SCANNING ACOUSTIC MICROSCOPEWICKRAMASINGHE HK.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 2; PP. 664-672; BIBL. 12 REF.Article

VISION STEREO EN MICROSCOPIE ELECTRONIQUE A BALAYAGEVASICHEV BN; ABRAMOV GL.1979; OPT.-MEKH. PROMYSHL.; SUN; DA. 1979; NO 8; PP. 5-8; BIBL. 2 REF.Article

SIGNAL PROCESSING IN THE REFLECTIVE ACOUSTIC MICROSCOPE.ATTAL J; CAMBON G.1978; ELECTRON. LETTERS; GBR; DA. 1978; VOL. 14; NO 15; PP. 472-473; BIBL. 5 REF.Article

DEVELOPMENT OF COMPACT SCANNING ELECTRON MICROSCOPE.1977; RES. DEVELOP. JAP. AWARD. OKOCHI MEMOR. PRIZE; JAP.; DA. 1977; PP. 60-64Article

SCANNING ELECTRON MICROSCOPY. ANNUAL SCANNING ELECTRON MICROSCOPE SYMPOSIUM. 10. PROCEEDINGS. I. II; CHICAGO, ILL.; 1977.1977; CHICAGO; IIT RES. INST.; DA. 1977; PP. (1592P.); BIBL. DISSEM.; ISBN 0915802007; 2 VOLConference Proceedings

PLANAR ACOUSTIC MICROSCOPE LENSFARNELL GW; JEN CK.1982; ACOUSTICAL IMAGING; ISSN 0270-5117; USA; DA. 1982; VOL. 12; PP. 27-36; BIBL. 7 REF.Conference Paper

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