kw.\*:("SCANNING MODE")
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METHODE NOUVELLE DE BALAYAGE POUR LA VISUALISATION DES TOPOGRAPHIES DE RAYONS XSHABOYAN SA; BEZIRGANYAN PA; EHJRAMDZHYAN TO et al.1976; IZVEST. AKAD. NAUK ARM. S.S.R., FIZ.; S.S.S.R.; DA. 1976; VOL. 11; NO 4; PP. 311-315; ABS. ARM. ANGL.; BIBL. 3 REF.Article
ION CHANNELING EFFECTS IN SCANNING ION MICROSCOPY WITH A 60 KEV GA+ PROBELEVI SETTI R; FOX TR; KIN LAM et al.1983; NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH; ISSN 0167-5087; NLD; DA. 1983; VOL. 205; NO 1-2; PP. 299-309; BIBL. 28 REF.Article
SUBSURFACE STRUCTURES OF SOLIDS BY SCANNING PHOTOACOUSTIC MICROSCOPYWONG YH; THOMAS RL; POUCH JJ et al.1979; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1979; VOL. 35; NO 5; PP. 368-369; BIBL. 5 REF.Article
POWDER SPECTRA OF 181TA NMR IN 2H-TAS2NISHIHARA H; SCHOLZ GA; FRINDT RF et al.1982; SOLID STATE COMMUNICATIONS; ISSN 0038-1098; USA; DA. 1982; VOL. 44; NO 4; PP. 507-510; BIBL. 9 REF.Article
SCANNED ELECTRON BEAM ANNEALING OF ARSENIC-IMPLANTED SILICONSMITH HJ; LIGEON E; BONTEMPS A et al.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 37; NO 11; PP. 1036-1037; BIBL. 5 REF.Article
THE IR TELEVISION SCANNING TECHNIQUE AS TEMPERATURE FIELD CONTROL FOR GROWING SILICON CRYSTALSGEIL W; MALITZKI H; TAENZER D et al.1982; CRYST. RES. TECHNOL. (1979); ISSN 0232-1300; DDR; DA. 1982; VOL. 17; NO 6; PP. 723-728; ABS. RUS; BIBL. 17 REF.Article
DETERMINATION OF OXYGEN CONCENTRATION PROFILES IN SILICON CRYSTALS OBSERVED BY SCANNING IR ABSORPTION USING SEMICONDUCTOR LASEROHSAWA A; HONDA K; OHKAWA S et al.1980; APPL. PHYS. LETT.; USA; DA. 1980; VOL. 36; NO 2; PP. 147-148; BIBL. 10 REF.Article
EXPERIMENTAL PROBLEMS.FEIL D.1977; ISRAEL J. CHEM.; ISRAEL; DA. 1977; VOL. 16; NO 2-3; PP. 149-153; BIBL. 16 REF.Article
Formes de description des processus de balayage des communications à n dimensionsGOFAJZEN, O. V; MINDEL, A. V.Radiotehnika (Moskva). 1987, Num 9, pp 29-31, issn 0033-8486Article
The fabrication of Nb-notorys microbridge by using SEBLSUN YU-PING; LIANG JUN-HOU; GE HUANG et al.Chinese physics. 1984, Vol 4, Num 1, pp 182-185, issn 0273-429XArticle
Systematic delineation of scan modes in multidimensional mass spectrometrySCHWARTZ, J. C; WADE, A. P; ENKE, C. G et al.Analytical chemistry (Washington, DC). 1990, Vol 62, Num 17, pp 1809-1818, issn 0003-2700Article
Compound scan mode developed from subarea and contour scan mode for selective laser sinteringSHI, Y; ZHANG, W; CHENG, Y et al.International journal of machine tools & manufacture. 2007, Vol 47, Num 6, pp 873-883, issn 0890-6955, 11 p.Article
Near-field optics : light for the world of nano-scale sciencePOHL, D. W.Thin solid films. 1995, Vol 264, Num 2, pp 250-254, issn 0040-6090Conference Paper
Step size, scanning speed and shape of X-ray diffraction peakHEJING WANG.Journal of applied crystallography. 1994, Vol 27, pp 716-721, issn 0021-8898, 5Article
Moiré topography by slit beam scanningSEUNG-WOO KIM; HYUN-GOO PARK.Applied optics. 1992, Vol 31, Num 28, pp 6157-6161, issn 0003-6935Article
A scanning electron-beam annealer with electrostatic deflection systemsHART, M. J; EVANS, A. G. R.Journal of physics. E. Scientific instruments. 1985, Vol 18, Num 4, pp 303-306, issn 0022-3735Article
The relation of wavelength dispersion and scan mode in X-ray diffractometry with a monochromatorMATHIESON, A. M.Journal of applied crystallography. 1985, Vol 18, Num 6, pp 506-508, issn 0021-8898Article
Mathematical and physical considerations on the spatial resolution in scanning Auger electron microscopyCAZAUX, J.Surface science. 1983, Vol 125, Num 2, pp 335-354, issn 0039-6028Article
Adjustable depth resolution OCT imagingPODOLEANU, A. G; SEEGER, M; WEBB, D. J et al.SPIE proceedings series. 1998, pp 1158-1162, isbn 0-8194-2950-3Conference Paper
Differential mobility analyser transfer functions in scanning modeMAMAKOS, Athanasios; NTZIACHRISTOS, Leonidas; SAMARAS, Zissis et al.Journal of aerosol science. 2008, Vol 39, Num 3, pp 227-243, issn 0021-8502, 17 p.Article
New superconducting scanning photon spectroscopyIGUCHI, I; KASAI, Y; SUZUKI, Y et al.Physical review. B, Condensed matter. 1986, Vol 33, Num 7, pp 4574-4583, issn 0163-1829Article
An Enhanced Front-End Algorithm for Reducing Channel Change Time in DVB-T SystemJOE, Inwhee; CHOI, Jongsung.IEICE transactions on communications. 2009, Vol 92, Num 1, pp 350-353, issn 0916-8516, 4 p.Article
Super-resolution techniques for wind turbine clutter spectrum enhancement in meteorological radarsGALLARDO-HERNANDO, B; MUNOZ-FERRERAS, J. M; PEREZ-MARTINEZ, F et al.IET radar, sonar & navigation (Print). 2011, Vol 5, Num 9, pp 924-933, issn 1751-8784, 10 p.Article
DNA height in scanning force microscopyMORENO-HERRERO, F; COLCHERO, J; BARO, A. M et al.Ultramicroscopy. 2003, Vol 96, Num 2, pp 167-174, issn 0304-3991, 8 p.Article
Imaging indents : characterising materials on the nano scaleRANDALL, N.Materials world. 2000, Vol 8, Num 9, pp 20-22, issn 0967-8638Article