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Unimolecular decay of metastable cluster anions : (O2)n-*→(O2)n-1-+O2SCHEIER, P; MAÊRK, T. D.Contributions to plasma physics (1985). 1990, Vol 30, Num 6, pp 749-753, issn 0863-1042, 5 p.Article

Experimental evidence for the time dependence of the metastable decay rate of Ne cluster ions: a further key to the magic number problemMÄRK, T. D; SCHEIER, P.The Journal of chemical physics. 1987, Vol 87, Num 2, pp 1456-1458, issn 0021-9606Article

Metastable transitions and isotope distribution identification program for use in mass spectrometry involving spectra with multiple coincidencesSCHEIER, P; MÄRK, T. D.International journal of mass spectrometry and ion processes. 1992, Vol 113, Num 2, pp R7-R15, issn 0168-1176Article

STM-BASED NANOPATTERNING OF SILICON NANOPARTICLE FILMSSCHEIER, P; SATTLER, K.Nanotechnology research journal. 2010, Vol 3, Num 1-2, pp 145-155, 11 p.Article

Quantized sequential decay series of metastable N2 cluster ions (N2)nU2+*→(N2)n-1+*→...→N2+SCHEIER, P; MARK, T. D.Chemical physics letters. 1988, Vol 148, Num 5, pp 393-400, issn 0009-2614Article

Observation of sequential decay series in metastable Ar clusters: Arn+*→Arn-1+*→Arn-2+SCHEIER, P; MÄRK, T. D.Physical review letters. 1987, Vol 59, Num 16, pp 1813-1816, issn 0031-9007Article

Metastable decay of singly charged argon cluster ions Arn+SCHEIER, P; MAÊRK, T. D.International journal of mass spectrometry and ion processes. 1990, Vol 102, pp 19-44, issn 0168-1176, 26 p.Article

Doubly charged argon clusters and their critical sizeSCHEIER, P; MÄRK, T. D.The Journal of chemical physics. 1987, Vol 86, Num 5, pp 3056-3057, issn 0021-9606Article

Isotope enrichment in Ne clustersSCHEIER, P; MÄRK, T. D.The Journal of chemical physics. 1987, Vol 87, Num 9, pp 5238-5241, issn 0021-9606Article

STM-BASED NANOPATTERNING OF SILICON NANOPARTICLE FILMSSCHEIER, P; SATTLER, K.Nanotechnology research journal. 2009, Vol 1, Num 3-4, pp 345-355, 11 p.Article

Mass-resolved argon cluster spectra up to 12000 u (Ar300+)SCHEIER, P; MÄRK, T. D.International journal of mass spectrometry and ion processes. 1987, Vol 76, Num 2, pp R.11-R.15, issn 0168-1176Article

Production and stability of neon cluster ions up to Ne+90MARK, T. D; SCHEIER, P.Chemical physics letters. 1987, Vol 137, Num 3, pp 245-249, issn 0009-2614Article

Triply charged argony clusters: production and stability (appearance energy and appearance size)SCHEIER, P; MARK, T. D.Chemical physics letters. 1987, Vol 136, Num 5, pp 423-426, issn 0009-2614Article

Ion attachment to van der Waals clusters : reactions of NO+ with ArmLEZIUS, M; SCHEIER, P; MÄRK, T. D et al.Chemical physics letters. 1992, Vol 196, Num 1-2, pp 118-122, issn 0009-2614Article

Dynamics and kinetics of the metastable decay series: Ar3+*→Ar2+*→Ar+SCHEIER, P; STAMALOVIC, A; MARK, M. D et al.The Journal of chemical physics. 1988, Vol 89, Num 1, pp 295-301, issn 0021-9606Article

Electron attachment to SO2 clustersSTAMATOVIC, A; SCHEIER, P; MARK, T. D et al.Zeitschrift für Physik. D, atoms, molecules and clusters. 1987, Vol 6, Num 4, pp 351-362, issn 0178-7683Article

Formation of SO2-, SO2•O- and SO2•SO- by electron attachment to van der Waals SO2 clustersMÄRK, T. D; SCHEIER, P; STAMATOVIC, A et al.Chemical physics letters. 1987, Vol 136, Num 2, pp 177-180, issn 0009-2614Article

Free electron attachment to C60 and C70LEZIUS, M; SCHEIER, P; MÄRK, T. D et al.Chemical physics letters. 1993, Vol 203, Num 2-3, pp 232-236, issn 0009-2614Article

Production and stability of singly and doubly charged O2 clustersSCHEIER, P; STAMATOVIC, A; MÄRK, T. D et al.Chemical physics letters. 1988, Vol 144, Num 2, pp 119-124, issn 0009-2614Article

Electron attachment and electron impact ionization of SF6 and SF6/Ar clustersSTAMATOVIC, A; SCHEIER, P; MÄRK, T. D et al.The Journal of chemical physics. 1988, Vol 88, Num 11, pp 6884-6888, issn 0021-9606Article

Production and properties of singly, doubly, and triply charged N2 clustersSCHEIER, P; STAMATOVIC, A; MARK, T. D et al.The Journal of chemical physics. 1988, Vol 88, Num 7, pp 4289-4293, issn 0021-9606Article

Electron attachment to SO2 clustersSTAMATOVIC, A; SCHEIER, P; MARK, T. D et al.Zeitschrift für Physik. D, atoms, molecules and clusters. 1987, Vol 6, Num 4, pp 351-362, issn 0178-7683Article

Calculation of electron impact ionization cross-sections. The fluorine anomalyDEUTSCH, H; SCHEIER, P; MARK, T. D et al.International journal of mass spectrometry and ion processes. 1986, Vol 74, Num 1, pp 81-95, issn 0168-1176Article

ON THE POSSIBLE PRESENCE OF WEAKLY BOUND FULLERENE―H2 COMPLEXES IN THE INTERSTELLAR MEDIUMLEIDLMAIR, C; BARTL, P; SCHÖBEL, H et al.The Astrophysical journal. 2011, Vol 738, Num 1, issn 0004-637X, 738L4.1-738L4.5, 2Article

Cavity-hollow cathode-sputtering source for titanium filmsSCHRITTWIESER, R; IONITA, C; DOBROMIR, M et al.Journal of plasma physics. 2010, Vol 76, pp 655-664, issn 0022-3778, 10 p., 3-4Article

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