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DEPENDENCE OF BLISTER-"DECKELDICKE" AND OF DEPTH PROFILES OF IMPLANTED HE IONS IN NB ON ANGLE OF INCIDENCERISCH MR; ROTH J; SCHERZER BMU et al.1979; J. MATER. NUCL.; NLD; DA. 1979; VOL. 82; NO 2; PP. 220-226; BIBL. 39 REF.Article

DEPTH PROFILING BY ION-BEAM SPECTROMETRYBORGESEN P; BEHRISCH R; SCHERZER BMU et al.1982; APPL. PHYS., A SOLIDS SURF.; ISSN 0721-7250; DEU; DA. 1982; VOL. 27; NO 4; PP. 183-195; BIBL. 27 REF.Article

DETERMINATION-OF THE DEPTH DISTRIBUTION OF IMPLANTED HELIUM ATOMS IN NIOBIUM BY RUTHERFORD BACKSCATTERING.ROTH J; BEHRISCH R; SCHERZER BMU et al.1974; APPL. PHYS. LETTERS; U.S.A.; DA. 1974; VOL. 25; NO 1; PP. 643-644; BIBL. 8 REF.Article

THE SPUTTERING MECHANISM FOR LOW-ENERGY LIGHT IONSBEHRISCH R; MADERLECHNER G; SCHERZER BMU et al.1979; APPL. PHYS.; DEU; DA. 1979; VOL. 18; NO 4; PP. 391-398; BIBL. 56 REF.Article

IMPLANTATION PROFILES OF LOW-ENERGY HELIUM IN NIOBIUM AND THE BLISTERING MECHANISMBEHRISCH R; BOTTIGER J; ECKSTEIN W et al.1975; APPL. PHYS. LETTERS; U.S.A.; DA. 1975; VOL. 27; NO 4; PP. 199-201; BIBL. 23 REF.Article

PLASMA SURFACE INTERACTIONS IN CONTROLLED FUSION DEVICESVERNICKEL H ED; BEHRISCH R ED; SCHERZER BMU ED et al.1980; J. NUCL. MATER.; ISSN 0022-3115; NLD; DA. 1980; VOL. 93-94; PART. A; 477 P.; BIBL. DISSEM.Conference Paper

PLASMA SURFACE INTERACTIONS IN CONTROLLED FUSION DEVICESVERNICKEL H ED; BEHRISCH R ED; SCHERZER BMU ED et al.1980; J. NUCL. MATER.; ISSN 0022-3115; NLD; DA. 1980; VOL. 93-94; PART. B; 428 P.; BIBL. DISSEM.Conference Paper

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