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ELECTRICAL MEASUREMENT OF FEATURE SIZES IN MOS SI2-GATE VLSI TECHNOLOGYTAKACS D; MUELLER W; SCHWABE V et al.1980; IEEE TRANS. ELECTRON. DEVICES; ISSN 0018-9383; USA; DA. 1980; VOL. 27; NO 8; PP. 1368-1373; BIBL. 8 REF.Article

Arzneiverordnungs report'93 = Rapport sur la prescription pharmaceutique 1994SCHWABE, V; PAFFRATH, B.1994, 631 p.Book

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