Unwinding of a single quantized vortex from a wireSCHWARZ, K. W.Physical review. B, Condensed matter. 1993, Vol 47, Num 18, pp 12030-12039, issn 0163-1829Article

Three-dimensional vortex dynamics in superfluid ⁴He: homogeneous superfluid turbulenceSCHWARZ, K. W.Physical review. B, Condensed matter. 1988, Vol 38, Num 4, pp 2398-2417, issn 0163-1829Article

Three-dimensional vortex dynamics in superfluid ⁴He: line-line and line-boundary interactionsSCHWARZ, K. W.Physical review. B, Condensed matter. 1985, Vol 31, Num 9, pp 5782-5804, issn 0163-1829Article

Phase slip and phase-slip cascades in ⁴He superflow through a small orificeSCHWARZ, K. W.Physical review letters. 1993, Vol 71, Num 2, pp 259-262, issn 0031-9007Article

Evidence for organized small-scale structure in fully developed turbulenceSCHWARZ, K. W.Physical review letters. 1990, Vol 64, Num 4, pp 415-418, issn 0031-9007Article

Elementary Processes in Nanowire GrowthSCHWARZ, K. W; TERSOFF, J.Nano letters (Print). 2011, Vol 11, Num 2, pp 316-320, issn 1530-6984, 5 p.Article

Dislocation interactions in thin FCC metal filmsPANT, Prita; SCHWARZ, K. W; BAKER, Shefford P et al.Acta materialia. 2003, Vol 51, Num 11, pp 3243-3258, issn 1359-6454, 16 p.Article

Dislocation modeling for the silicon worldSCHWARZ, K. W; LIU, X. H; CHIDAMBARRAO, D et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2001, Vol 309-10, pp 229-232, issn 0921-5093Conference Paper

Transient behavior of superfluid turbulence in a large channelSCHWARZ, K. W; ROZEN, J. R.Physical review. B, Condensed matter. 1991, Vol 44, Num 14, pp 7563-7577, issn 0163-1829Article

Anomalous spiral motion of steps near dislocations on silicon surfacesHANNON, J. B; SHENOY, V. B; SCHWARZ, K. W et al.Science (Washington, D.C.). 2006, Vol 313, Num 5791, pp 1266-1269, issn 0036-8075, 4 p.Article

Dislocation escape-related size effects in single-crystal micropillars under uniaxial compressionTANG, H; SCHWARZ, K. W; ESPINOSA, H. D et al.Acta materialia. 2007, Vol 55, Num 5, pp 1607-1616, issn 1359-6454, 10 p.Article

Dislocation modeling for the microelectronics industrySCHWARZ, K. W; CHIDAMBARRAO, D.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2005, Vol 400-01, pp 435-438, issn 0921-5093, 4 p.Conference Paper

Observation of a remanent vortex-line density in superfluid heliumAWSCHALOM, D. D; SCHWARZ, K. W.Physical review letters. 1984, Vol 52, Num 1, pp 49-52, issn 0031-9007Article