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ON THE FORMATION AND AVOIDANCE OF TRANSVERSE CRACKS IN CONTINUOUSLY CAST SLABS FROM CURVED MOULD MACHINES = LE CRIQUAGE TRANSVERSAL DES BRAMES COULEES EN CONTINU SUR UNE MACHINE A LINGOTIERE COURBE: ORIGINE ET REMEDESSCHMIDT L; JOSEFSSON A.1974; SCAND. J. METALLURGY; SWED.; DA. 1974; VOL. 3; NO 5; PP. 193-199; BIBL. 4 REF.Article

HIGH INTENSITY EXCITATION SOURCES FOR X-RAY ENERGY SPECTROSCOPYPORTER DE.1973; X-RAY SPECTROM.; G.B.; DA. 1973; VOL. 2; NO 2; PP. 85-89; BIBL. 4 REF.Serial Issue

MONITEUR A EMISSION SECONDAIRE POUR LA POSITION ET L'INTENSITE D'UN FAISCEAU D'ELECTRONS ACCELERESPRUDNIKOV IA; TOROPOV AS; CHICHIKALOV YU F et al.1973; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1973; NO 1; PP. 24-26; BIBL. 5 REF.Serial Issue

POSSIBILITES D'ETUDE DES ATOMES MUONIQUES A SACLAYBERTIN PY; BERTHOT J; COUPAT B et al.1971; J. PHYS., COLLOQ.; FR.; DA. 1971; VOL. 32; NO 10; PP. 265-266; ABS. ANGL.; BIBL. 1 REF.; (COLLOQ. SOC. FR. PHYS.; EVIAN; 1971)Conference Paper

A HIGH QUALITY ELECTRON AND PION BEAM FOR NALGUIRAGOSSIAN ZGT; RAND RE.1973; NUCL. INSTRUM. METHODS; NETHERL.; DA. 1973; VOL. 107; NO 2; PP. 237-250; BIBL. 19 REF.Serial Issue

METAL-AMINE REACTIONS. THE EFFECT OF CONTINUOUS SODIUM DISPERSIONS DURING REACTION WITH NAPHTALENEHARRIS LE; HERTZLER DV; DERMER OC et al.1972; J. ORG. CHEM.; U.S.A.; DA. 1972; VOL. 37; NO 19; PP. 3039-3040; BIBL. 2 REF.Serial Issue

HIGH-SENSITIVITY APPEARANCE POTENTIAL SPECTROMETER FOR THE DETECTION OF PHOTONS, ELECTRONS, AND IONS.KLUGE A.1975; REV. SCI. INSTRUM.; U.S.A.; DA. 1975; VOL. 46; NO 9; PP. 1179-1181; BIBL. 6 REF.Article

SECONDARY ELECTRON EMISSION FROM A FE (110) SINGLE CRYSTALKOSHIKAWA T; SHIMIZU R; GOTO K et al.1973; J. APPL. PHYS.; U.S.A.; DA. 1973; VOL. 44; NO 4; PP. 1900-1901; BIBL. 9 REF.Serial Issue

UEBER DIE LANGZEITBEHANDLUNG DER ERYTHRODERMISCHEN FORM DER PITYRIASIS RUBRA PILARIS MIT METHOTREXAT = TRAITEMENT A LONG TERME DE LA FORME ERYTHRODERMIQUE DU PITYRIASIS RUBRA PILAIRE PAR LE METHOTREXATEHAUSTEIN UF; SCHULZE P; SOENNICHSEN N et al.1972; DERMATOL. MONATSSCHR.; DTSCH.; DA. 1972; VOL. 158; NO 9; PP. 655-659; BIBL. 1 P.Serial Issue

IDENTIFICATION DES IMPURETES DANS LE PRODUIT SECONDAIRE DE LA SYNTHESE DE L'ISOPRENEALEKSANDROV AN; SKOP SL; KRAVTSOVA EP et al.1972; ZH. PRIKL. KHIM.; S.S.S.R.; DA. 1972; VOL. 45; NO 6; PP. 1406-1407; BIBL. 4 REF.Serial Issue

ABSOLUTE MEASUREMENT OF LOW-ENERGY H0 FLUXES BY A SECONDARY EMISSION DETECTORRAY JA; BARNETT CF; VANZYL B et al.1979; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1979; VOL. 50; NO 10; PP. 6516-6519; BIBL. 17 REF.Article

SUR L'INSTABILITE POSSIBLE DES FLUX PRIMAIRES DES PHOTOELECTRONSBUTVIN GG; POPOV GV; KHAZANOV GV et al.1975; KOSM. ISSLEDOV.; S.S.S.R.; DA. 1975; VOL. 13; NO 4; PP. 607-609; BIBL. 15 REF.Article

FLUXES OF UNACCOMPANIED HADRONS IN THE ATMOSPHERE AT HIGH ENERGIES.GAISSER TK; YODH GB.sdIN: 13TH INT. COSMIC RAY CONF.; DENVER, COLO.; 1973; DENVER, COLO.; UNIV. DENVER; DA. S.D.; VOL. 3; PP. 2140-2144; BIBL. 19 REF.Conference Paper

MULTIPLICITE INTEGRALE DE LA COMPOSANTE MECANIQUE DES RAYONS COSMIQUESBOOS EH G; EFIMOV AK; KOLOMEETS EV et al.1972; IZVEST. AKAD. NAUK KAZAKH. S.S.R., SER. FIZ.-MAT.; S.S.S.R.; DA. 1972; NO 4; PP. 45-50; ABS. KAZAKH; BIBL. 12 REF.Serial Issue

DISPOSITIF ANALOGIQUE POUR LA DETERMINATION DES COEFFICIENTS D'EMISSION SECONDAIRELEBEDEV S YA; OZNOBISHIN VV; BONDARENKO VV et al.1980; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1980; NO 1; PP. 180-183; BIBL. 1 REF.Article

ETUDE EXPERIMENTALE DE L'EMISSION ELECTRONIQUE SECONDAIRE DE L'ALUMINIUM ET DE L'ARGENTROPTIN D.1975; AO-CNRS-12141; FR.; DA. 1975; PP. 1-97; BIBL. 5 P.; (THESE DOCT.-ING.; NANTES)Thesis

ANGULAR-RESOLVED SECONDARY-ELECTRON-EMISSION SPECTRA FROM TUNGSTEN SURFACES.WILLIS RF.1975; PHYS. REV. LETTERS; U.S.A.; DA. 1975; VOL. 34; NO 11; PP. 670-674; BIBL. DISSEM.Article

SPECTROGRAPHIE DE MASSE AVEC SOURCE A EMISSION IONIQUE SECONDAIREHERNANDEZ R; LANUSSE P; SLODZIAN G et al.1972; RECH. AEROSPAT.; FR.; DA. 1972; NO 6; PP. 313-324; ABS. ANGL.; BIBL. 14 REF.Serial Issue

ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY THE STATIC METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS)BENNINGHOVEN A; LOEBACH E.1972; J. RADIOANAL. CHEM.; NETHERL.; DA. 1972; VOL. 12; NO 1; PP. 95-99; BIBL. 6 REF.; (CHEM. ANAL. CHARGED PART. BOMBARDMENT INT. MEET.; NAMUR BELG.; 1971)Conference Paper

THEORIE DE L'EMISSION IONO-ELECTRONIQUE A PARTIR DE CRISTAUX ALCALO-HALOGENESKISHINEVSKIJ LM; PARILIS EH S.1982; ZURNAL TEHNICESKOJ FIZIKI; ISSN 0044-4642; SUN; DA. 1982; VOL. 52; NO 7; PP. 1290-1298; BIBL. 22 REF.Article

1-17 KEV POSITIVE-ION-INDUCED ELECTRON EJECTION FROM TUNGSTEN, MOLYBDENUM AND VANADIUM.COOK N; BURTT RB.1975; J. PHYS. D; G.B.; DA. 1975; VOL. 8; NO 7; PP. 800-811; BIBL. 12 REF.Article

ION-ELECTRON EMISSION OF SILICON AT HIGH TEMPERATURES.MASHKOVA ES; MOLCHANOV VA; SOMMERFELDT H et al.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 44; NO 1; PP. 301-303; BIBL. 8 REF.Article

A CONCEPTUAL STUDY OF A 300 MEV PION CHANNEL FOR TRIUMFREEVE PA.1973; NUCL. INSTRUM. METHODS; NETHERL.; DA. 1973; VOL. 107; NO 2; PP. 269-277; BIBL. 6 REF.Serial Issue

METHODE DE DETERMINATION DE L'ENERGIE MOYENNE DES ELECTRONS SECONDAIRES DANS LES ZONES D'EQUILIBRE ELECTRONIQUE A PARTIR DE SPECTRES THEORIQUES DE RAYONS X DE 10 A 20 MV ET DE LA MESURE DE L'IONISATION AU SEIN DE DIFFERENTS MILIEUXGUILLE B; MARTIN PN; BERNARDIN M et al.1972; RADIOPROTECTION; FR.; DA. 1972; VOL. 7; NO 1; PP. 45-51; BIBL. 12 REF.Serial Issue

SUR UNE NOUVELLE COMPOSANTE DES CEINTURES DE RAYONNEMENTGRIGOROV NL; KURNOSOVA LV; RAZORENOV LA et al.1982; IZV. AKAD. NAUK SSSR, SER. FIZ.; ISSN 0367-6765; SUN; DA. 1982; VOL. 46; NO 9; PP. 1672-1674; BIBL. 8 REF.Conference Paper

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